Abstract: Various aspects of the disclosed technology relate to cell internal defect diagnosis techniques. Defect candidates are first determined based on path-tracing through a circuit design. Then, cell internal defect suspects are determined from the defect candidates based on simulating failing test patterns by using cell internal fault models. The defect candidate determination may be further based on simulating the failing test patterns by using conventional fault models. The cell internal defect suspect determination may be further based on simulating passing test patterns by using the cell internal fault models.

Abstract: A method of manufacturing grooved polishing layers for use in chemical mechanical polishing pads is provided, wherein the formation of defects in the polishing layers are minimized.

Abstract: Aspects of the disclosed technology relate to techniques for determining canonical forms of layout patterns. Coordinates of vertices of geometric elements in a window of a layout design are first transformed into new coordinates of the vertices, wherein the coordinates of vertices do not comprise clipped coordinates and the transforming comprises: performing a translation on the coordinates of vertices based on differences between maximum and minimum X/Y coordinate values of the vertices. Based on sums of X/Y coordinate values of the new coordinates of the vertices, a canonical form of the geometric elements is determined. The canonical form coordinates of the vertices may then be determined and sorted. The sorted canonical form coordinates may be employed for pattern matching.

Abstract: Disclosed are representative embodiments of methods, apparatus, and systems for partitioning-based Test Access Mechanisms (TAM). Test response data are captured by scan cells of a plurality scan chains in a circuit under test and are compared with test response data expected for a good CUT to generate check values. Based on the check values, partition pass/fail signals are generated by partitioning scheme generators. Each of the partitioning scheme generators is configured to generate one of the partition pass/fail signals for one of partitioning schemes. A partitioning scheme divides the scan cells into a set of non-overlapping partitions. Based on the partition pass/fail signals, a failure diagnosis process may be performed.

Abstract: A method of manufacturing polishing layers having a window for use in chemical mechanical polishing pads is provided, wherein a plurality of polishing layers having an integral window are derived from a cake, wherein the formation of density defects in the cake and the surface roughness of the polishing layers formed are minimized.

Abstract: Aspects of the invention relate to yield analysis techniques for generating root cause distribution information. Suspect information for a plurality of failing dies is first generated using a layout-aware diagnosis method. Based on the suspect information, potential root causes for the plurality of failing dies, and suspect feature weights and total feature weights for each of the potential root causes may then be determined. Next, the probability information of observing a particular suspect that is related to a particular root cause may be extracted. Finally, an expectation-maximization analysis may be conducted for generating the root cause distribution information based on the probability information and the suspect information. Heuristic information may be used to prevent the analysis from over-fitting.

Abstract: Aspects of the invention relate to techniques for chain fault diagnosis based on dynamic circuit design partitioning. Fan-out cones for scan cells of one or more faulty scan chains of a circuit design are determined and combined to derive a forward-tracing cone. Fan-in cones for scan cells of the one or more faulty scan chains and for failing observation points of the circuit design are determined and combined to derive a backward-tracing cone. By determining intersection of the forward-tracing cone and the backward-tracing cone, a chain diagnosis sub-circuit for the test failure file is generated. Using the process, a plurality of chain diagnosis sub-circuits may be generated for a plurality of test failure files. Scan chain fault diagnosis may then be performed on the plurality of chain diagnosis sub-circuits with a plurality of computers.

Abstract: A method of manufacturing polishing layers for use in chemical mechanical polishing pads is provided, wherein a plurality of polishing layers are derived from a cake, wherein the formation of density defects in the cake and the surface roughness of the polishing layers formed are minimized.

Abstract: Aspects of the invention relate to techniques for fault diagnosis based on circuit design partitioning. According to various implementations of the invention, a circuit design of a failing die is first partitioned into a plurality of sub-circuits. The sub-circuits may be formed based on fan-in cones of observation points. Shared gate ratios may be used as a metric for adding fan-in cones of observation points into a sub-circuit. Based on test patterns and the sub-circuits, sub-circuit test patterns are determined. Fault diagnosis is then performed on the sub-circuits. The sub-circuit fault diagnosis comprises extracting sub-circuit failure information from the failure information for the failing die. The sub-circuit fault diagnosis may employ fault-free values for boundary gates in the sub-circuits.

Abstract: A new method of simulating the experience of surfing the tube of a wave is presented, consisting of a tarpaulin with weights and a handle on one corner. The tarpaulin is pulled up in the air and forward creating a tube shaped form within which a skateboarder can be propelled as if he was surfing a wave.

Abstract: Disclosed are representative embodiments of methods, apparatus, and systems for partitioning-based Test Access Mechanisms (TAM). Test response data are captured by scan cells of a plurality scan chains in a circuit under test and are compared with test response data expected for a good CUT to generate check values. Based on the check values, partition pass/fail signals are generated by partitioning scheme generators. Each of the partitioning scheme generators is configured to generate one of the partition pass/fail signals for one of partitioning schemes. A partitioning scheme divides the scan cells into a set of non-overlapping partitions. Based on the partition pass/fail signals, a failure diagnosis process may be performed.

Abstract: A method of manufacturing grooved polishing layers for use in chemical mechanical polishing pads is provided, wherein the formation of defects in the polishing layers are minimized.

Abstract: Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.

Abstract: Disclosed are representative embodiments of methods, apparatus, and systems for partitioning-based Test Access Mechanisms (TAM). Test response data are captured by scan cells of a plurality scan chains in a circuit under test and are compared with test response data expected for a good CUT to generate check values. Based on the check values, partition pass/fail signals are generated by partitioning scheme generators. Each of the partitioning scheme generators is configured to generate one of the partition pass/fail signals for one of partitioning schemes. A partitioning scheme divides the scan cells into a set of non-overlapping partitions. Based on the partition pass/fail signals, a failure diagnosis process may be performed.

Abstract: A method of manufacturing polishing layers having a window for use in chemical mechanical polishing pads is provided, wherein a plurality of polishing layers having an integral window are derived from a cake, wherein the formation of density defects in the cake and the surface roughness of the polishing layers formed are minimized.

Abstract: A method of manufacturing polishing layers for use in chemical mechanical polishing pads is provided, wherein a plurality of polishing layers are derived from a cake, wherein the formation of density defects in the cake and the surface roughness of the polishing layers formed are minimized.

Abstract: The invention is directed to a foldable electric bicycle with power assist having a front portion attached to a rear portion via a central pivot post. The front portion maintains a steering column, handle bar system and a front wheel assembly having a front wheel and an electric power train. The rear portion includes a rear connecting arm to maintain the rear wheel. The central pivot post includes a first end that connects with the front portion and a second end which connects with the rear portion. A peddle assembly connects below the central pivot post and communicates with the rear wheel through a drive chain. A rechargeable battery capable of providing electricity to the electric power train is shaped to fit within a cavity and is located within the central pivot post. The rechargeable battery is positioned proximate the user so as to vertically align with the user's girth.

Abstract: A method of manufacturing polishing layers for use in chemical mechanical polishing pads is provided, wherein the formation of density defects in the polishing layers is minimized.