Abstract: A calibration apparatus for a mass analyzer includes an ion source device and a dual-purpose electron beam generating unit. The ion source device ionizes an analyte of a sample, producing analyte ions. The dual-purpose electron beam generating unit is positioned between the ion source device and the mass analyzer. In a first mode, the dual-purpose electron beam generating unit is used to create fragments of analyte ions of unknown mass-to-charge ratio. In a second mode, the dual-purpose electron beam generating unit is used to create ions of calibration compounds of known mass-to-charge ratio. All ions are subsequently transferred to the mass analyzer.

Abstract: A calibration apparatus for a mass analyzer includes an ion source device and a dual-purpose electron beam generating unit. The ion source device ionizes an analyte of a sample, producing analyte ions. The dual-purpose electron beam generating unit is positioned between the ion source device and the mass analyzer. In a first mode, the dual-purpose electron beam generating unit is used to create fragments of analyte ions of unknown mass-to-charge ratio. In a second mode, the dual-purpose electron beam generating unit is used to create ions of calibration compounds of known mass-to-charge ratio. All ions are subsequently transferred to the mass analyzer.

Abstract: Mass spectrometers and related methods of making and using the same are disclosed herein that generally involve positioning a blocking or masking element in the path of an ion beam passing through the mass spectrometer so as to selectively block at least a portion of the ions in the ion beam from entering an accelerator. Mass spectrometers and related methods are also disclosed in which an ion beam passing through the mass spectrometer is deflected or otherwise aimed so as to approach a TOF axis of an accelerator at a non-zero angle.

Abstract: In some embodiments, a time of flight mass spectrometer can comprise an input orifice for receiving ions, a first ion accelerator stage for accelerating the ions along a first path, at least one ion reflector for receiving said accelerated ions and redirecting said ions along a second path different than the first path, a detector for detecting at least a portion of the ions redirected by said at least one ion reflector, and at least first and second field free drift regions disposed between said first acceleration stage and said detector, wherein said second field free region is disposed in proximity of the detector. In some embodiments, the lengths of the field free drift regions can be selected so as to provide 1st and 2nd order corrections of the time of flight of the ions with respect to variation in their initial positions.

Abstract: In some embodiments, a time of flight mass spectrometer can comprise an input orifice for receiving ions, a first ion accelerator stage for accelerating the ions along a first path, at least one ion reflector for receiving said accelerated ions and redirecting said ions along a second path different than the first path, a detector for detecting at least a portion of the ions redirected by said at least one ion reflector, and at least first and second field free drift regions disposed between said first acceleration stage and said detector, wherein said second field free region is disposed in proximity of the detector. In some embodiments, the lengths of the field free drift regions can be selected so as to provide 1st and 2nd order corrections of the time of flight of the ions with respect to variation in their initial positions.

Abstract: Mass spectrometers and related methods of making and using the same are disclosed herein that generally involve positioning a blocking or masking element in the path of an ion beam passing through the mass spectrometer so as to selectively block at least a portion of the ions in the ion beam from entering an accelerator. Mass spectrometers and related methods are also disclosed in which an ion beam passing through the mass spectrometer is deflected or otherwise aimed so as to approach a TOF axis of an accelerator at a non-zero angle.

Abstract: A matrix-assisted laser desorption ionization/laser desorption ionization (MALDI/LDI) time-of-flight mass spectrometer (TOF-MS) which includes an ion source employing a ground voltage configuration. The improved MALDI/LDI TOF-MS includes a laser for ablating a sample positioned within a gridless source. The ionized sample is then repelled through a floating flight tube toward a detector and within a vacuum chamber. The floating flight tube allows a lower than conventional voltage to be applied to the ions. A digital camera is provided for viewing a sample when positioned in the vacuum ready for analysis. The sample image is displayed on the control computer monitor and is available for computer analysis and instrumentation control, including external instrumentation such as that involved in sample preparation and handling.

Abstract: An improved reflectron time-of-flight mass spectrometer having improved design features in both the ion source and the ion reflection region. The ion source employs a near-ground voltage configuration and second-order spatial focusing of generated ions. The ion mirror is a new two-stage, second-order-corrected, energy-focusing, gridless design. The near-ground voltage configuration of the source, the second-order spatial focusing design of the source, and the new ion mirror serve to yield superior mass resolution, superior sensitivity, and superior safety, utility, and operational characteristics.

Abstract: This invention provides a method of generating fullerenes by vaporizing carbon with the heat from an electrical arc and then condensing a soot from which fullerenes may be recovered.