Abstract: A trace device for monitoring and storing trace data of a device under test (DUT) is provided. The trace device is coupled in situ with the DUT when the DUT is in its operating environment (e.g., when the DUT is located within a rack, housing, or enclosure including the DUT). The trace device comprises a trace data buffer for storing trace data received from the DUT during operation.

Abstract: A sector pulse generator circuit for a hard disk drive assembly includes an angular position counter, a sector counter, a sector limit register, and a pulse generator. The circuit generates a sector pulse when the count in the angular position counter equals the count in the sector counter. When the count in the angular position counter exceeds the count in the sector counter, the sector counter is incremented by the number of clock pulses in a sector of the current track. The sector limit register stores the number of complete sectors in the current track.