Patents by Inventor Robert J. Woolhiser

Robert J. Woolhiser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for measuring inter-chip signals
    Patent number: 8384411
    Abstract: A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument.
    Type: Grant
    Filed: December 18, 2009
    Date of Patent: February 26, 2013
    Assignee: Tektronix, Inc.
    Inventors: Bart A. Mooyman-Beck, Robert J. Woolhiser, Kevin E. Cosgrove, Daniel G. Knierim
  • Method and Device for Measuring Inter-chip Signals
    Publication number: 20110148456
    Abstract: A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument.
    Type: Application
    Filed: December 18, 2009
    Publication date: June 23, 2011
    Applicant: Tektronix, Inc.
    Inventors: Bart A. MOOYMAN-BECK, Robert J. WOOLHISER, Kevin E. COSGROVE, Daniel G. Knierim