Patents by Inventor Robert Matthew Buckley

Robert Matthew Buckley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring phase noise using a low noise synthesizer
    Patent number: 6480006
    Abstract: A phase noise measurement method including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver/down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.
    Type: Grant
    Filed: May 2, 2000
    Date of Patent: November 12, 2002
    Assignee: Advanced Testing Technologies Inc.
    Inventor: Robert Matthew Buckley
  • Automatic testing device for signal evaluation
    Patent number: 6057690
    Abstract: A phase noise measurement system including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.
    Type: Grant
    Filed: January 14, 1998
    Date of Patent: May 2, 2000
    Assignee: Advanced Testing Technologies, Inc.
    Inventor: Robert Matthew Buckley
  • Low noise signal synthesizer and phase noise measurement system
    Patent number: 5952834
    Abstract: A phase noise measurement system including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.
    Type: Grant
    Filed: January 14, 1998
    Date of Patent: September 14, 1999
    Assignee: Advanced Testing Technologies, Inc.
    Inventor: Robert Matthew Buckley