Abstract: A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

Abstract: A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

Abstract: A input/output circuit (IOB) within an integrated circuit (IC) device, the output signal driving circuitry of the input/output device contains a dedicated multiplexer on the output path wherein a first and second output signal can be time multiplexed on a single output pad. The multiplexer can also be configured to perform as a high speed gate to realize AND, OR, XOR, and XNOR functions. Within an input/output circuit of a programmable integrated circuit, the system provides a dedicated multiplexer that can select between one of two output signals for sending over the single output pad of the IC device. In lieu of using a programmable memory cell as the select control for the dedicated multiplexer, the system allows a number of lines, including an output clock signal, to be the select control. By using the output clock as the select control, the data signals can be effectively time multiplexed over a single output pad and referenced by the output clock.

Abstract: A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

Abstract: A clock distribution network and mechanisms therein for an integrated circuit (IC) including an edge clock and distribution system for same. The invention includes a deskewed clock distribution network for circuits situated in columns wherein buffering is done in columns less than half of the IC length. The mechanism allows each of at least eight vertical column distribution lines to couple with any horizontal clock supply line of at least eight lines. The horizontal clock supply lines include local interconnect inputs. To increase clock source signals, special lines, Kx lines, are provided that are buffered and traverse directionally in 1/4 IC lengths from the top down, bottom up, and midsection both up and down. Kx lines can be sourced from carry signals, IOBs, interconnects, or from an edge clock and supply to clock lines, longlines, or interconnect lines. Kx lines allow vertical signal displacement, e.g., for clock signals, etc., within the chip.

Abstract: A input/output circuit (IOB) within an integrated circuit (IC) device, the output signal driving circuitry of the input/output device contains a dedicated multiplexer on the output path wherein a first and second output signal can be time multiplexed on a single output pad. The multiplexer can also be configured to perform as a high speed gate to realize AND, OR, XOR, and XNOR functions. Within an input/output circuit of a programmable integrated circuit, the system provides a dedicated multiplexer that can select between one of two output signals for sending over the single output pad of the IC device. In lieu of using a programmable memory cell as the select control for the dedicated multiplexer, the system allows a number of lines, including an output clock signal, to be the select control. By using the output clock as the select control, the data signals can be effectively time multiplexed over a single output pad and referenced by the output clock.