Patents by Inventor Robert Pasternak

Robert Pasternak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures
    Patent number: 7158284
    Abstract: A method for non-invasively probing at least one interface property in a layered structure having at least one interface. In one embodiment, the method includes the steps of exposing the layered structure to an incident photon beam at an incident angle to produce a reflection beam, measuring intensities of the second harmonic generation signals from the reflection beam, and identifying an initial second harmonic generation intensity and a time evolution of second harmonic generation intensity from the measured second harmonic generation intensities so as to determine the at least one interface property of the layered structure.
    Type: Grant
    Filed: December 21, 2004
    Date of Patent: January 2, 2007
    Assignee: Vanderbilt University
    Inventors: Michael Lee Alles, Norman H. Tolk, Bongim Jun, Robert Pasternak, Ron Schrimpf, Sorin Cristoloveanu
  • Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures
    Publication number: 20060044641
    Abstract: A method for non-invasively probing at least one interface property in a layered structure having at least one interface. In one embodiment, the method includes the steps of exposing the layered structure to an incident photon beam at an incident angle to produce a reflection beam, measuring intensities of the second harmonic generation signals from the reflection beam, and identifying an initial second harmonic generation intensity and a time evolution of second harmonic generation intensity from the measured second harmonic generation intensities so as to determine the at least one interface property of the layered structure.
    Type: Application
    Filed: December 21, 2004
    Publication date: March 2, 2006
    Applicant: Vanderbilt University
    Inventors: Michael Alles, Norman Tolk, Bongim Jun, Robert Pasternak, Ron Schrimpf, Sorin Cristoloveanu