Abstract: A system for detecting a low battery power condition and providing an audible warning of such a condition to a user of an electronic device such as a hearing aid is disclosed. In one embodiment, the battery output voltage is monitored and compared to a first threshold voltage at specified sampling intervals. When a battery output voltage measurement below the first threshold voltage is detected, this measurement is verified by a rule specifying that a low battery condition is not deemed to exist unless a predetermined percentage of voltage measurements within a predetermined time interval indicate that the battery output voltage is below the first threshold voltage. If the low battery condition is verified, an audible warning is generated, which is repeated at specified warning intervals. This audible warning affords an opportunity to the user for replacing the batteries in the device before loss of operation or degraded sound quality are experienced.

Abstract: In a serial interface for a programmable hearing aid, no address is provided for the data transferred to or read from the hearing aid, rather, for each instruction, the number of data words being transferred pursuant to each instruction and the beginning word are known in the controlled device. In the serial interface, the data is clocked into and out of the hearing aid on a serial data pin by a serial clock. Because no addresses are sent along with the data to the controlled device, the amount of data transferred to the hearing aid is significantly reduced, and no circuitry is required to save the address.

Abstract: A semiconductor wafer testing fixture facilitates burn-in testing of multiple wafers, whereby individual wafers have an array of individual die or integrated circuit chips with their own test circuitry. The wafer has Vcc and Vss buses provided thereon which are coupled to the individual integrated circuit chips and test circuitry. The fixture has a housing sized to accommodate multiple semiconductor wafers in a selected orientation. The wafers are supported within the housing on corresponding shelves, which provides a back bias voltage to the wafer. The fixture has first and second conductive arms for supplying selected voltages to the Vcc and Vss buses for imparting test cycling of the integrated circuits. The first arm has multiple hands which engage the Vcc buses on the wafers supported on corresponding shelves. Likewise, the second arm has multiple second hands which engage the Vss buses on the wafers supported on corresponding shelves.

Abstract: A MISFET dynamic random access memory chip having 4,096 single transistor, single capacitor storage cells yet packaged in a standard sixteen pin dual inline package is disclosed. Six bit row address and six bit column address data are sequentially multiplexed into row address latches and column address latches through six address pins by sequentially occurring row address and column address strobes. Sixty-four bits of information from an address row are read and transferred to a sixty-four bit column register. One bit of the column register is then selected by the column address decoder so that data is transferred from that bit to a data output latch. Data is transferred into a data input latch and then to the addressed bit of the storage matrix as well as to the addressed column register by a write signal.