Patents by Inventor Robert Spinner

Robert Spinner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10598722
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: October 16, 2017
    Date of Patent: March 24, 2020
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 10151791
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: November 24, 2017
    Date of Patent: December 11, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 10097818
    Abstract: Method and modular system for generating, capturing and re-displaying SDI video signals. When generating a video signal, data blocks are arranged in a line parameter memory, each corresponding to a complete video line and containing pointers to specific entries for lines of the video signal in a primary image memory holding a main bit-mapped image, and a video line construct memory holding data enable and blanking patterns before being serialized into a output data stream. On the capture side, a de-serializer/equalizer accepts an input data stream extracts Y (luminance), CB (blue-difference chroma) and CR (red-difference chroma) data along with clock/sync information which can be used for re-display. Optional support of HDMI, DVI and analog formats, such as composite video, raster video and stroke video, allows a single instrument to generate, acquire and process virtually all known video interfaces, using standard or custom image/formats.
    Type: Grant
    Filed: December 11, 2017
    Date of Patent: October 9, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi
  • Patent number: 9961787
    Abstract: Chassis for an automated test system including a housing and at least a first and a second backplane in the housing. The first backplane provides electrical connections for at least one functional module of a first type when engaged with the first backplane, while the second backplane provides electrical connections for at least one functional module of a second type different than the first type when engaged with the second backplane. The first and second backplanes include electrical circuitry to enable signals to be provided for the functional modules when engaged therewith. A bottom of the housing includes ducts to enable cooling of both types of functional modules when engaged with the housing.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: May 1, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Richard Engel, Eli Levi, Robert Spinner, Thomas Leddy
  • Patent number: 9933984
    Abstract: Method and arrangement for displaying a digital waveform in an eye diagram simultaneously with an indication of acceptability of the digital waveform. A decoded digital waveform is separated into overlapping waveform permutations based on a number of digital states and transition points in the eye diagram. Submasks equal in number to the waveform permutations and that are derived from a common, known good waveform, are retrieved from a memory component. Each retrieved submask is applied to a corresponding waveform permutation to determine any locations at which the waveform permutation exceeds a boundary of the submask. Only one submask is applied to each waveform permutation. The waveform is displayed in the eye diagram simultaneous with a visual indication of the locations at which any of the waveform permutations exceeds the boundary of the corresponding submask, to enable visual assessment of the acceptability/validity of the digital waveform.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: April 3, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: William Biagiotti, Eli Levi, Robert Spinner
  • Patent number: 9864003
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: June 12, 2017
    Date of Patent: January 9, 2018
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 9739827
    Abstract: A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: August 22, 2017
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Jim McKenna, William Harold Leippe, William Biagiotti, Richard Engel
  • Patent number: 9488673
    Abstract: Chassis for an automated test system including a housing and at least a first and a second backplane in the housing. The first backplane provides electrical connections for at least one functional module of a first type when engaged with the first backplane, while the second backplane provides electrical connections for at least one functional module of a second type different than the first type when engaged with the second backplane. The first and second backplanes include electrical circuitry to enable signals to be provided for the functional modules when engaged therewith. A bottom of the housing includes ducts to enable cooling of both types of functional modules when engaged with the housing.
    Type: Grant
    Filed: April 24, 2015
    Date of Patent: November 8, 2016
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Richard Engel, Eli Levi, Robert Spinner, Thomas Leddy
  • Patent number: 9480184
    Abstract: A module that incorporates a chassis for enabling use of at least one smaller functional module in at least one slot of a chassis designed to mate with a larger functional module having a different standard than the smaller functional module. The module has a housing having electrical connections adapted to mate with electrical connections provided by the chassis for the larger functional module and dimensions that fit within at least one slot provided by the chassis for housing the larger functional module. The module includes at least one set of electrical connections adapted to mate with the electrical connections of the smaller functional module(s) and at least one air passage for conveying air from an opening of the chassis that provides air flow to cool the larger functional module to an area in which the smaller functional module(s) is/are situated when mated with the housing.
    Type: Grant
    Filed: November 9, 2015
    Date of Patent: October 25, 2016
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Richard Engel, Robert Spinner, Eli Levi
  • Patent number: 9295169
    Abstract: Arrangement in an automated test system to connect to a plurality of functional modules of different forms including a common chassis defining a plurality of identical connectors and a backplane associated with the chassis and providing electrical connections for functional modules when engaged with the connectors. A set of adapters is provided including a first adapter having a coupling at an attachment end and a module receiving end configured to mate with one or more functional modules each having a first form, and a second adapter having a coupling at an attachment end and a module receiving end configured to mate with one or more functional modules each having a second form different than the first form. The couplings of the adapters are the same such that the adapters are freely insertable via their attachment ends into engagement with any of the connectors.
    Type: Grant
    Filed: September 16, 2014
    Date of Patent: March 22, 2016
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Richard Engel
  • Patent number: 9231354
    Abstract: Cable interconnection terminated by a pin or socket includes a housing, an inner conductor arranged in the housing and having a first end adapted to couple to the pin or socket, and an outer sheath adapted to couple to an outer sheath of a cable including at least one conductor, e.g., a coaxial cable, twin-axial cable or tri-axial cable. The interconnection also includes first and second pins. The first pin is arranged at a second end of the inner conductor while the second pin is electrically connected to the outer sheath. The first and second pins each have a mating portion, and both mating portions terminate at a common plane a set distance from the housing. This termination in a common plane, substantially perpendicular to the axial direction of the pins, enables the cable to mate with a wide range of electronic componentry.
    Type: Grant
    Filed: September 3, 2014
    Date of Patent: January 5, 2016
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, Richard Engel, Thomas Leddy
  • Patent number: 8996742
    Abstract: Method and system for testing any type of video display, video monitor or other device that produces a video signal, and that is capable of providing information about the video and optionally audio specifications and/or capabilities of the output signal to an external device when coupled thereto. The external device obtains the information about the specifications and/or capabilities and based thereon, assembles one or more pre-defined tests from a test database/repository containing tests to enable testing of compliance of the video signal producing device to those specifications and/or capabilities. This compliance testing may entail generating video or audio content at a source generator, providing it to the video signal producing device, and determining the accuracy of the output of the video signal producing device to the input content. A determination of the results of this test may be provided to an operator of the testing apparatus.
    Type: Grant
    Filed: October 2, 2013
    Date of Patent: March 31, 2015
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi
  • Patent number: 8489381
    Abstract: Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.
    Type: Grant
    Filed: March 5, 2012
    Date of Patent: July 16, 2013
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, Eli Levi, William Harold Leippe, Emery Korpi, Michael Lai, James Kuveikis, Richard E. Chalmers, Richard Engel, Peter F. Britch, William Biagiotti, David Howell
  • Patent number: 8484618
    Abstract: Electronic test system including hardware and software components and method of use which provide obsolescence mitigation. A test program set (TPS) including a test program test is created to enable units to be tested. When a new component is introduced, the change is detected and a new TPS is created with at least part of the test program test. If the new TPS complies with defined, governing rules for the system, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.
    Type: Grant
    Filed: November 23, 2011
    Date of Patent: July 9, 2013
    Assignee: Advanced Testing Technologies, Inc.
    Inventor: Robert Spinner
  • Patent number: 8359585
    Abstract: Methods and systems for obsolescence mitigation of electronic systems including hardware and software components, in particular methods and systems for managing obsolete instrument hardware and application software used in legacy Automated Test Systems (ATS) or Automatic Test Equipment (ATE). When one or more components of a test program set (TPS) has been rendered obsolete, migration to one or more replacement instruments without any impact to the TPS or other remaining legacy instruments in the ATE or ATS is obtained by a translator module interposed between the new instrument and the system bus for translating instructions for the obsolete instrument or set of instruments into instructions or procedures for the new instrument whereby the new instrument thus functions in the same manner as the obsolete instrument or set of instruments.
    Type: Grant
    Filed: November 13, 2007
    Date of Patent: January 22, 2013
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Robert Spinner, William Harold Leippe, James McKenna, Timothy Fox
  • Patent number: 8356282
    Abstract: Integrated application of specific CASE tools that allow a user to accomplish instrument programming and control when generating, capturing and/or analyzing electronic signals, and in doing so automatically generate automation code to replicate a desired instrument setup, acquisition, analysis and sequence control. The CASE tools include, but are not limited to, GUI instrument programming tools, an electronic signal redisplay tool, a waveform analyzer tool, automated code generation tools, macro generation tools, macro and sequence playback tools, a test creation tool, a test sequencer tool, a decision engine that may be part of the test sequencer tool, and test result data logger. A method for analyzing electronic signals that enables multiple tests to be performed after a single signal acquisition, and enables results from the multiple tests to be analyzed is also disclosed.
    Type: Grant
    Filed: September 20, 2011
    Date of Patent: January 15, 2013
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: William Harold Leippe, William Biagiotti, Eli Levi, Robert Spinner
  • Patent number: 8300153
    Abstract: Video selection display unit that is capable of routing real-time output signals having a video component from different video signal sources, e.g., different instruments or home entertainment devices, to a single output for display on a monitor or other type of video display. The video selection display unit may be part of an automatic test system or home entertainment system. Control of the video selection display unit can be effected locally via a user interface, such as one or more pushbuttons, and/or remotely over a network which may be the same network used for communication with the instruments or devices or using an infrared remote control unit.
    Type: Grant
    Filed: March 6, 2008
    Date of Patent: October 30, 2012
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: Richard Engel, Robert Spinner, William Harold Leippe
  • Publication number: 20120072774
    Abstract: Electronic test system including hardware and software components and method of use which provide obsolescence mitigation. A test program set (TPS) including a test program test is created to enable units to be tested. When a new component is introduced, the change is detected and a new TPS is created with at least part of the test program test. If the new TPS complies with defined, governing rules for the system, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.
    Type: Application
    Filed: November 23, 2011
    Publication date: March 22, 2012
    Applicant: ADVANCED TESTING TECHNOLOGIES, INC.
    Inventor: ROBERT SPINNER
  • Patent number: 8131529
    Abstract: Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: March 6, 2012
    Assignee: Advanced Testing Technologies Inc.
    Inventors: Robert Spinner, Eli Levi, William Harold Leippe, Emery Korpi, Michael Lai, James Kuveikis, Richard E. Chalmers, Richard Engel, Peter F. Britch, William Biagiotti, David Howell
  • Patent number: RE43553
    Abstract: Electronic test system including hardware and software components and method of use of same which provide obsolescence mitigation. A set of governing rules for the system is defined and a test program test (TPS) is created to enable units to be tested. When a new component is introduced into the system, the change is detected and a new TPS is created. If the new TPS complies with the rules, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of the removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.
    Type: Grant
    Filed: July 6, 2010
    Date of Patent: July 24, 2012
    Assignee: Advanced Testing Technologies, Inc.
    Inventor: Robert Spinner