Abstract: A stand for a heater pedestal with a base member and a support member detachably coupled to the base member, the support member having a plurality of ring members and at least one spacer member extending vertically from the base member, a ring member separated from another ring member by a spacer member, a ring member having an aperture which extends through the ring member in a horizontal direction, the at least one spacer member forming at least one opening between two corresponding ring members, and the ring member furthest from the base member configured to support a heater pedestal, and the apertures of the ring members of the support member being configured to receive a susceptor of the heater pedestal.

Abstract: A stand for a heater pedestal with a base member and a support member detachably coupled to the base member, the support member having a plurality of ring members and at least one spacer member extending vertically from the base member, a ring member separated from another ring member by a spacer member, a ring member having an aperture which extends through the ring member in a horizontal direction, the at least one spacer member forming at least one opening between two corresponding ring members, and the ring member furthest from the base member configured to support a heater pedestal, and the apertures of the ring members of the support member being configured to receive a susceptor of the heater pedestal.

Abstract: A process system of performing a fabrication process on a wafer includes a wafer storage cassette, process chambers, a transfer chamber having a body and a lid that detachably covers the body, a frame configured to support the transfer chamber, and a lifting tool connected to the lid and extended from the lid over a portion of the frame. The body of the transfer chamber is connected to the wafer storage cassette and the plurality of process chambers so that the wafer is transferred from the wafer storage cassette through the body of the transfer chamber to one of the process chambers.

Abstract: A system for use in fabrication of carbon nanotubes (CNTs) includes a wafer having a circuitry and a plurality of CNT seed sites. The system also includes a base assembly configured to support the wafer. The system further includes a first tube disposed over the wafer and configured to surround the CNTs that form on the seed sites. The circuitry in the wafer is configured to conduct at least one static charge. The wafer includes a top surface having a plurality of CNT seed sites, each seed site coupled to the circuitry and configured to receive one of the at least one static charge.

Abstract: A system for use in fabrication of carbon nanotubes (CNTs) includes a wafer having a circuitry and a plurality of CNT seed sites. The system also includes a base assembly configured to support the wafer. The system further includes a first tube disposed over the wafer and configured to surround the CNTs that form on the seed sites. The circuitry in the wafer is configured to conduct at least one static charge. The wafer includes a top surface having a plurality of CNT seed sites, each seed site coupled to the circuitry and configured to receive one of the at least one static charge.

Abstract: Components to be verified for compatibility are identified. Each of the components maintains a relationship with the other components such that all of the components are compatible with one another. A change to one component triggers an automatic evaluation of the relationships between the changed component and the other components to determine if compatibility is maintained. The automatic evaluation of the relationships is based on predetermined compatibility information provided in a compatibility matrix. When the automatic evaluation identifies incompatibility between the changed component and the other components, the change is rejected.

Abstract: A method, apparatus and circuit for testing a radio altimeter is disclosed. During the test-mode operation of the altimeter, a signal processor controls a transmitter to generate a radio frequency signal at a first period of time, which is transmitted through an attenuator, transmitted then through a receiver and received by the signal processor at a second period of time for processing of altimeter operational information.

Abstract: A method, apparatus and circuit for testing a radio altimeter is disclosed. During the test-mode operation of the altimeter, a signal processor controls a transmitter to generate a radio frequency signal at a first period of time, which is transmitted through an attenuator, transmitted then through a receiver and received by the signal processor at a second period of time for processing of altimeter operational information.