Patents by Inventor Robin S. King

Robin S. King has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determination of young'S modulus of porous thin films using ultra-low load nano-indentation
    Patent number: 9766170
    Abstract: A method and computer product program for determining Young's modulus. The method includes placing a probe in contact with a surface of a material on a substrate and, with an initial force of 800 nano newtons or less; determining the location of the surface relative to an initial indentation depth for the initial force; increasing the force on the probe from the initial force to a maximum force greater than the initial force to generate a load curve; decreasing the force on the probe from the maximum force to the initial force to generate an unload curve, the maximum force selected such that the unload curve is independent of the presence of the substrate; and using the unload curve, determining a relationship between (i) the reduced modulus of the sample material and (ii) the ratio of probe penetration depth and the thickness of the layer.
    Type: Grant
    Filed: January 28, 2015
    Date of Patent: September 19, 2017
    Assignee: International Business Machines Corporation
    Inventors: Geraud J. Dubois, Jane E. Frommer, Robin S. King, Krystelle Lionti, Kumar R. Virwani, Willi Volksen
  • DETERMINATION OF YOUNG'S MODULUS OF POROUS THIN FILMS USING ULTRA-LOW LOAD NANO-INDENTATION
    Publication number: 20160216184
    Abstract: A method and computer product program for determining Young's modulus. The method includes placing a probe in contact with a surface of a material on a substrate and, with an initial force of 800 nano newtons or less; determining the location of the surface relative to an initial indentation depth for the initial force; increasing the force on the probe from the initial force to a maximum force greater than the initial force to generate a load curve; decreasing the force on the probe from the maximum force to the initial force to generate an unload curve, the maximum force selected such that the unload curve is independent of the presence of the substrate; and using the unload curve, determining a relationship between (i) the reduced modulus of the sample material and (ii) the ratio of probe penetration depth and the thickness of the layer.
    Type: Application
    Filed: January 28, 2015
    Publication date: July 28, 2016
    Inventors: Geraud J. Dubois, Jane E. Frommer, Robin S. King, Krystelle Lionti, Kumar R. Virwani, Willli Volksen