Abstract: A failure-effect validation system includes an effects modeler configured to develop a cumulative effects model for failure modes of the complex system, and by which a model of the complex system is extendible to form an extended complex-system model. The effects modeler is also configured to develop search targets each of which includes logical expressions of notable hazards and other factors that contribute to the cumulative effects, such as crew workload, safety margin and/or physiological effects. A model analysis system is configured to perform an automated analysis using the extended complex-system model and search targets, and in which the automated analysis includes a graph search of possible states of the extended complex-system model to locate search targets. And the effects assessment system is configured to selectively generate a layout of failure analysis data including at least a portion of the extended complex-system model and results of the automated analysis.

Abstract: A failure analysis system for monitoring sub-system failures in an aircraft that comprises a plurality of sub-systems, the aircraft having a plurality of functions, wherein each function is available when one or more associated sub-systems is operating correctly. The failure analysis system comprising: a plurality of monitors for monitoring the status of one or more sub-systems of the aircraft and determining if a failure has occurred; a memory arranged to store a list of a plurality of flight phases or operating modes to be completed by the monitored system and data associating one or more of the functions with each flight phase or operating mode; and a processor in communication with the monitors and the memory and arranged to model the response of the sub-systems to a failure determined by the monitors to identify which functions required by the flight phases or operating modes are degraded or are not available.

Abstract: A failure analysis system for monitoring sub-system failures in an aircraft that comprises a plurality of sub-systems, the aircraft having a plurality of functions, wherein each function is available when one or more associated sub-systems is operating correctly. The failure analysis system comprising: a plurality of monitors for monitoring the status of one or more sub-systems of the aircraft and determining if a failure has occurred; a memory arranged to store a list of a plurality of flight phases or operating modes to be completed by the monitored system and data associating one or more of the functions with each flight phase or operating mode; and a processor in communication with the monitors and the memory and arranged to model the response of the sub-systems to a failure determined by the monitors to identify which functions required by the flight phases or operating modes are degraded or are not available.

Abstract: A failure-effect validation system includes an effects modeler configured to develop a cumulative effects model for failure modes of the complex system, and by which a model of the complex system is extendible to form an extended complex-system model. The effects modeler is also configured to develop search targets each of which includes logical expressions of notable hazards and other factors that contribute to the cumulative effects, such as crew workload, safety margin and/or physiological effects. A model analysis system is configured to perform an automated analysis using the extended complex-system model and search targets, and in which the automated analysis includes a graph search of possible states of the extended complex-system model to locate search targets. And the effects assessment system is configured to selectively generate a layout of failure analysis data including at least a portion of the extended complex-system model and results of the automated analysis.

Abstract: A method of processing a semiconductor device comprises: applying a focused ion beam to a structure of a semiconductor device to be processed; producing a live detector signal by detecting secondary electrons emitted as the focused ion beam is applied to the structure; comparing the live detector signal with a reference trace having a region indicative of an expected material boundary and a stop marker within said region; and terminating or altering a FIB operation when the live detector signal exhibits a characteristic corresponding to said region of the reference trace.