Abstract: The invention provides a memory circuit comprising a plurality of storage cells for storing data and redundant spare storage cells for replacing defective storage cells, and a memory access logic for accessing said storage cells connected to a replacement setting register which is writeable during operation of said memory circuit to store replacement settings.

Abstract: The invention provides a method and an apparatus for determining a skew of each data bit of an encoded data word received by a receiver via an interface from a transmitter comprising the steps of performing an error check and correction of the received and sampled encoded data word to calculate an error corrected encoded data word corresponding to the encoded data word transmitted by the transmitter, and correlating a sequence of error corrected encoded data words with the sampled encoded data words to determine a skew of each data bit of said received encoded data words.

Abstract: A memory device comprising at least a plurality of memory cells and a memory control unit to read and write user data to said memory cells is provided. The memory device comprises further a monitoring unit for retrieving a plurality of data concerning the memory device and a comparing unit. The comparing unit receives an output signal of the monitoring unit and is configured to compare the plurality of retrieved data with a plurality of reference values.

Abstract: A method and apparatus for reducing the number of DQ pins and current used to access data in a memory system or data transfer device, wherein an additional bit is temporally encoded on a data word during a singular access cycle. During an access cycle, the pulse level or levels of encoded bits may determine one or more bits values in a data word being expressed, while the pulse/pulses position in time within a data access cycle determines the remaining bits.

Abstract: An integrated semiconductor memory device includes a clock terminal that applies an external clock signal. Read and write accesses are controlled synchronously with the external clock signal. A frequency detector is connected to the clock terminal to detect the frequency of the external clock signal. The frequency detector circuit generates a control signal in a manner dependent on the frequency of the external clock signal, the control signal being used to drive a controllable voltage generator, which generates a level of an internal supply voltage in a manner dependent on the control signal, from which supply voltage further control and supply voltages are derived. The integrated semiconductor memory device makes it possible to adapt the level of internally generated voltages of the integrated semiconductor memory device to the frequency of the external clock signal.

Abstract: The invention is directed to an arrangement and a method for measuring the anterior segment of the eye using interferometric means. The eye is illuminated by a convergent beam bundle and aligned with the optical axis of the measuring device by generating directional stimuli and accommodation stimuli by means of a display which is mirrored into the beam path.

Abstract: Combined equipment for non-contacting determination of axial length (AL), anterior chamber depth (VKT) and corneal curvature (HHK) of the eye, are also important for the selection of the intraocular lens IOL to be implanted, particularly the selection of an intraocular lens (IOL) to be implanted, preferably with fixation of the eye by means of a fixating lamp and/or illumination through light sources grouped eccentrically about the observation axis.

Abstract: Combined equipment for non-contacting determination of axial length (AL), anterior chamber depth (VKT) and corneal curvature (HHK) of the eye, are also important for the selection of the intraocular lens IOL to be implanted, particularly the selection of an intraocular lens (IOL) to be implanted, preferably with fixation of the eye by means of a fixating lamp and/or illumination through light sources grouped eccentrically about the observation axis.

Abstract: The invention relates to a method for determining distances in the anterior ocular segment, preferably of the pupils and/or the diameter of the iris, wherein the image of at least part of the eye is recorded and digitized using an imaging device and an array for illuminating the eye. On the basis of said digital image, a center of gravity analysis and the determination of the central point are carried out, especially for the position of the pupils, by conducting an intensity and threshold analysis as rough determination. Based on said rough determination, a fine detection of the position of the edges of the pupil and/or the edges of the iris is carried out. Additionally, the angle between the visual axis and the optical axis of the eye can be determined from the position of a fixed reflection to the center of the pupil and/or the center of the iris.

Abstract: In the context of functional tests a check is made to ascertain whether an integrated semiconductor memory satisfies specified operating parameters. In this case, operating parameters, such as the externally applied operating frequency or the externally applied operating voltage, are varied within specific limits. Integrated semiconductor memories which function without errors within a wide variation range of the operating parameters are classified as having high quality. Integrated semiconductor memories which, by contrast, function without any errors only in narrower tolerance ranges of the operating parameters are classified as having lower quality. During production of an integrated semiconductor memory, a data bit is stored in a memory circuit, the state of the data bit specifying whether the integrated semiconductor memory is of higher or lower quality. During operation of the integrated semiconductor memory, the quality of the semiconductor memory can be established by read-out of the memory circuit.

Abstract: An integrated semiconductor memory device includes a clock terminal that applies an external clock signal. Read and write accesses are controlled synchronously with the external clock signal. A frequency detector is connected to the clock terminal to detect the frequency of the external clock signal. The frequency detector circuit generates a control signal in a manner dependent on the frequency of the external clock signal, the control signal being used to drive a controllable voltage generator, which generates a level of an internal supply voltage in a manner dependent on the control signal, from which supply voltage further control and supply voltages are derived. The integrated semiconductor memory device makes it possible to adapt the level of internally generated voltages of the integrated semiconductor memory device to the frequency of the external clock signal.

Abstract: A method transfers data in a memory device including at least one memory module and a memory controller. The method includes coupling the memory module to the memory controller via a mechanically detachable data transfer connection, transferring data between the memory controller and an interface unit assigned to the memory module and disposed on the same side of the mechanically detachable data transfer connection as the memory controller, and transferring data between the interface unit and the memory module via the mechanically detachable data transfer connection.

Abstract: The invention is directed to an arrangement and a method for measuring the anterior segment of the eye using interferometric means. The eye is illuminated by a convergent beam bundle and aligned with the optical axis of the measuring device by generating directional stimuli and accommodation stimuli by means of a display which is mirrored into the beam path.

Abstract: Combined equipment for non-contacting determination of axial length (AL), anterior chamber depth (VKT) and corneal curvature (HHK) of the eye, are also important for the selection of the intraocular lens IOL to be implanted, particularly the selection of an intraocular lens (IOL) to be implanted, preferably with fixation of the eye by means of a fixating lamp and/or illumination through light sources grouped eccentrically about the observation axis.

Abstract: A temperature sensor is integrated together with an integrated circuit on a chip, the sensor delivering a temperature-dependent measuring signal or at least emitting a signal when the chip temperature falls below a specific prescribed value. For such an eventuality, the chip includes a special circuit device thereon, by which a current flow is generated through a provided structure of electrical conductors that keeps the temperature of the integrated circuit above a prescribed minimum temperature.

Abstract: Topographic measurement of eye structures based on short coherence interferometry is the subject of the invention. The problem occurring in this connection is that longitudinal and transverse eye movements during signal registration lead to errors in the measured structure. The influences of longitudinal eye movements are compensated in that the reference beam, independent from the measurement beam, is directed to the corneal vertex and is reflected at the latter. The influences of longitudinal eye movements are minimized in that the transverse position of the eye is monitored by means of a direction-dependent registration of the light reflected at the corneal vertex by means of a diode array or a four-quadrant diode and transverse misalignment is detected and compensated.

Abstract: Combined equipment for non-contacting determination of axial length (AL), anterior chamber depth (VKT) and corneal curvature (HHK) of the eye are also important for the selection of the intraocular lens IOL to be implanted, particularly the selection of an intraocular lens IOL to be implanted, preferably with fixation of the eye by means of a fixating lamp and/or illumination through light sources grouped eccentrically about the observation axis.

Abstract: The invention relates to a method for determining distances in the anterior ocular segment, preferably of the pupils and/or the diameter of the iris, wherein the image of at least part of the eye is recorded and digitized using an imaging device and an array for illuminating the eye. On the basis of said digital image, a center of gravity analysis and the determination of the central point are carried out, especially for the position of the pupils, by conducting an intensity and threshold analysis as rough determination. Based on said rough determination, a fine detection of the position of the edges of the pupil and/or the edges of the iris is carried out. Additionally, the angle between the visual axis and the optical axis of the eye can be determined from the position of a fixed reflection to the center of the pupil and/or the center of the iris.

Abstract: A temperature sensor is integrated together with an integrated circuit on a chip, the sensor delivering a temperature-dependent measuring signal or at least emitting a signal when the chip temperature falls below a specific prescribed value. For such an eventuality, the chip includes a special circuit device thereon, by which a current flow is generated through a provided structure of electrical conductors that keeps the temperature of the integrated circuit above a prescribed minimum temperature.

Abstract: A dynamic semiconductor memory and a method for operating such a memory includes memory banks with memory cells disposed in rows, and registers associated with the memory banks for storing an address of an open, activated word line. In the event of an external refresh command, a control device causes, after the refresh operation, the state of the memory banks to be reestablished, in particular, the word line whose address was stored in the register to be reactivated. Such a purely on-chip measure increases the operating speed of the memory.