Abstract: The present invention relates to an optical device for imaging and measuring characteristics of an objects surface shape, surface spectral reflectance and structure of sub-surface layers. In particular, the invention relates to imaging of topography of human skin and skin sub-surface layers and determination of concentration of skin constituents. The present invention has applications in areas such as skin care, dermatology, cosmetics, wound management and tricology. The imaging device of the invention significantly improves photometric stereo measurements by suppressing specular reflection and allows accurate determination of the surface shape. Consequently the device allows elimination of the influence of the shape and illumination conditions on spectral measurements and allows accurate measurement of skin constituents.

Abstract: The present invention relates to an optical device for imaging and measuring characteristics of an objects surface shape, surface spectral reflectance and structure of sub-surface layers. In particular, the invention relates to imaging of topography of human skin and skin sub-surface layers and determination of concentration of skin constituents. The present invention has applications in areas such as skin care, dermatology, cosmetics, wound management and tricology. The imaging device of the invention significantly improves photometric stereo measurements by suppressing specular reflection and allows accurate determination of the surface shape. Consequently the device allows elimination of the influence of the shape and illumination conditions on spectral measurements and allows accurate measurement of skin constituents.

Abstract: The present invention relates to an optical device for imaging and measuring characteristics of an objects surface shape, surface spectral reflectance and structure of sub-surface layers. In particular, the invention relates to imaging of topography of human skin and skin sub-surface layers and determination of concentration of skin constituents. The present invention has applications in areas such as skin care, dermatology, cosmetics, wound management and tricology. The imaging device of the invention significantly improves photometric stereo measurements by suppressing specular reflection and allows accurate determination of the surface shape. Consequently the device allows elimination of the influence of the shape and illumination conditions on spectral measurements and allows accurate measurement of skin constituents.

Abstract: The invention relates to a method and apparatus for the inspection of high frequency and microwave circuits such as printed test circuit boards. The invention uses a probe or antenna (3) which is separated from the device under test (DUT) (2). The invention provides a relatively long central protruding conductor (8) for the antenna (3) which protrudes from its shielding (7). In the method, the antenna (3) is used to acquire microwave electromagnetic field measurements in a near field region of a test pont of the DUT (2). Generally, this is done at two test positions with a difference in separation (?l) between the apex (8) of the antenna (3) and the DUT (2). The two test results calculated and recorded and the difference of the microwave properties of the two tests is obtained to provide information about the operation of the DUT (2). The antenna (3) can be either a straight electric field antenna or loop antenna.