Abstract: The disclosure relates to a method for identifying a change in the operating behavior of a crankshaft drive of a motor vehicle. In particular, the disclosure relates to a method for identifying error states of a torsional-vibration damper in the crankshaft drive, such as a jamming or slipping of a secondary mass of the torsional-vibration damper. The crankshaft drive comprises a crankshaft, a pulse generator that rotates when the crankshaft is in operation and a fixed sensor device, which generates a rotational speed signal N as a function of the rotational speed of the pulse generator.

Abstract: Methods, computer programs with instructions, and apparatus for estimating a position of an emitter or reflector in a sample are disclosed. Also disclosed are microscopes using a method or an apparatus according to the present principles. In the method, the sample is illuminated with excitation light at at least one set of target coordinates. Fluorescence photons or reflected photons are detected for the individual target coordinates of the set of target coordinates. A position of an emitter or reflector is estimated from the detected fluorescence photons or reflected photons. The estimation of the position of the emitter or reflector comprises a comparison of estimated positions determined from subsets of the set of target coordinates. Alternatively, the excitation light has an intensity distribution having a central minimum and three or more local maxima arranged around the central minimum, wherein the angular positions of the three or more local maxima change along the optical axis.

Abstract: For detecting movements of a sample with respect to an objective, the sample is imaged onto an image sensor comprising an array of pixels by means of the objective. Images of the sample are recorded in that light coming from the sample is registered at the pixels. Variations of intensities of the light coming from the sample and registered at the pixels are determined during a set-up period in that a temporal course of the intensity of the light, which has been registered at a respective one of the pixels over the set-up period, is analyzed. Using these variations as a criterion, a subset of not more than 90% of the pixels of the image sensor is selected. Parts of the images that each correspond to the selected subset are compared to parts of at least one reference image that also correspond to the subset.

Abstract: A method for producing a semiconductor component for emitting light includes providing a base body, the base body comprising an active layer for generating the light and a tunnel contact, and forming a stop structure by implantation in a region of the tunnel contact. The stop structure delimits the tunnel contact and serves to constrict a current introduced into the active layer. Defects due to crystal imperfections are generated by the implantation so that the implanted region is transparent for the light having an emitted wavelength.

Abstract: Embodiments of the invention relates to a method for localizing or tracking emitters in a sample, wherein the sample is illuminated with an intensity distribution of an illumination light having a local minimum, wherein the illumination light induces or modulates light emissions of the emitters, and wherein the local minimum is positioned in a region around a presumed position of an emitter in the sample, detecting light emissions (L) of the emitter, and determining the position of the emitter in the sample, wherein light emanating from the sample is detected with a plurality of detector elements having respective active areas whose projections into a focal plane in the sample are not congruent, wherein a background is estimated based on the light detected by the plurality of detector elements, and wherein a background correction is performed, a light microscope and a computer program for performing the method.

Abstract: The present invention is related to a method, a computer program, and apparatus for adapting an estimator for use in a microscope for estimating a position of an emitter in a sample based on a method, in which the sample is illuminated with light at one or more sets of probe positions and fluorescence photons are acquired for the sets of probe positions. The invention is further related to a microscope, which makes use of such a method or apparatus. The sample is illuminated with light at one or more sets of probe positions and fluorescence photons are acquired for the sets of probe positions. Photon counts of the acquired photons are then added to vectors of photon counts or sums of photon counts are determined for the sets of probe positions. A value representative of background noise is determined and used for adapting the estimator in real-time.

Abstract: The present specification relates to a method for light microscopic examination of a sample (6), in particular by means of laser scanning or MINFLUX microscopy, in which a drift of the sample (6) or of an object in a sample (6) with respect to the light microscope (26) is detected and, if necessary, corrected. In particular, the present specification relates to a corresponding method for examining the sample (6) using laser scanning or MINFLUX microscopy. For this purpose, reference markers (8, 13) are located in the sample, the position of which is repeatedly determined according to the MINFLUX principle in order to determine the drift.

Abstract: The invention relates to a method for localizing individual emitters in a sample with a first localization step comprising illuminating the sample with illumination light, detecting the light emissions of the emitter and determining the location of the emitter in the sample from the detected light emissions, and a second localization step with an increased accuracy compared to the first localization step comprising illuminating the emitter with an intensity distribution of the illumination light having a local minimum at illumination positions arranged around the location of the emitter determined in the first localization step, detecting the light emissions of the emitter for the illumination positions, and determining the location of the emitter from the light emissions detected for the illumination positions, wherein the location of the emitter determined in the first localization step comprises a systematic deviation with respect to the location of the same emitter determined in the second localization st

Abstract: The invention relates to a method for localizing individual emitters in a sample, comprising a pre-localization comprising an illumination of the sample with illumination light, wherein the illumination light induces or modulates light emissions of an individual and stationary emitter in the sample, detecting the light emissions of the emitter and estimating the position of the emitter in the sample from the detected light emissions and a subsequent main localization comprising illuminating the sample with an intensity distribution of the illumination light at illumination positions, the intensity distribution comprising a local minimum, detecting the light emissions of the emitter for the illumination positions, and determining the position of the emitter in the sample from the light emissions detected for the illumination positions, wherein the illumination positions are arranged in a first iteration about the estimated position and wherein the illumination positions in at least one second iteration are arr

Abstract: The present invention is a method for spatially highly accurate location determination of individual dye molecules of a fluorescent dye by scanning with an intensity distribution of a scanning light having a local minimum. The invention is characterized by the fact that the scanning is not performed uniformly for all dye molecules, but is individually adapted to the dye molecule to be scanned and, if necessary, to its environment in the sample, in order to achieve the most accurate location determination possible with the smallest possible number of fluorescence photons.

Abstract: The present disclosure relates to MINFLUX nanoscopy. The present disclosure improves three-dimensional localization of isolated emitters, particularly of isolated fluorescent emitters. The utilization of the emitted photons of isolated excitable emitters, in particular of isolated excitable fluorescent emitters, for a three-dimensional localization is improved by separating the localization according to the MINFLUX principle using a 3D excitation donut into a sequence of separate steps, wherein in one step either an axial location or a lateral location of the fluorophore is determined. Thereby, the more precise knowledge of the axial position increases the quality of a following lateral localization and vice versa. The three-dimensional localization is further improved by a method for axial localization by scanning an axial scanning area with a 3D excitation donut and a preferably following evaluation of the measured intensities or photon numbers by forming a vector sum.

Abstract: The present disclosure relates to localisation microscopic investigations of samples stained with multiple dyes. According to the present disclosure, it is either provided that a singulated excitable fluorophore of a first species is excited with excitation light of two different wavelengths and that a localisation of the fluorophore is obtained for each of the two wavelengths, or that first test excitation is performed in order to then select a wavelength for excitation light with which a singulated fluorophore is localised. In the first case, the difference in the localisations of the one or preferably multiple individual fluorophores obtained in this way is determined and used to obtain localisations of fluorophores of a different species and those of the first species in a common spatial reference system. The second case is advantageously applicable for tracking structures. Also in the second case, the advantages of the first case can be additionally realised.

Abstract: The invention relates to a method for estimating a position of an emitter (2) in a sample (1) comprising illuminating the sample (1) with light at one or more sets of probe positions (Pi), acquiring photons for the sets of probe positions (Pi), and determining vectors of photon counts or sums of photon counts for the sets of probe positions from the acquired photons, and-estimating the position of the emitter (2) from the vectors of photon counts or sums of photon counts, wherein the one or more sets of probe positions (Pi) each comprise six or more probe positions (Pi), which are arranged rotationally symmetric on a circle around a center, wherein the one or more sets of probe positions lacks a central probe position. The invention further relates to an apparatus (40) for implementing the method, a microscope (10) using the apparatus (40) and a computer program implementing the method.

Abstract: The invention relates to a method for localizing an emitter (F) in a sample (S) comprising illuminating the sample (S) with a stationary donut-shaped excitation beam (E), acquiring fluorescence photons; and estimating a position of the emitter (F) in the sample (S) from the acquired fluorescence photons. The invention further relates to an apparatus (1) for localizing an emitter (F) in a sample (S) comprising illumination means (10), acquisition means (20) and processing means (30) and a computer program comprising instruction to cause the apparatus (1) to execute the method for localizing an emitter (F).

Abstract: The invention relates to a method for determining positions of mutually spaced molecules (M) in a sample (20), having the steps of generating (101) a plurality of light distributions, each light distribution having a local intensity minimum (110, 310) and adjacent regions (120, 320) of increasing intensity, comprising an excitation light distribution (100) and a deactivation light distribution (300); illuminating (102) the sample (20) with the excitation light distribution (100) and the deactivation light distribution (300); detecting (103) photons emitted by the molecule (M) for different positions of the excitation light distribution (100); and deriving (104) the position of the molecule (M) on the basis of the photons detected for the different positions of the excitation light distribution (100), wherein the local minimum (110) of the excitation light distribution (100) is arranged at a plurality of scanning positions (201) one after the other within a scanning region (200), and the light intensity of the

Abstract: The present disclosure is directed to a method of disturbance correction and to a laser scanning microscope carrying out this method. Specifically, it is directed to an image recording method according to the MINFLUX principle, in which a spatially isolated fluorescence dye molecule is illuminated at a sequence of scan positions by an intensity distribution with a local intensity minimum, and the number of fluorescence photons emitted by the fluorescence dye molecule is detected at each of the scan positions. The location of the molecule is determined with a high spatial resolution from the scan positions and the numbers of fluorescence photons. A disturbance is captured when illuminating the fluorescence dye molecule and detecting the fluorescence light, said disturbance being considered in corrective fashion when determining the location of the fluorescence dye molecule.

Abstract: For detecting movements of a sample with respect to an objective, the sample is imaged onto an image sensor comprising an array of pixels by means of the objective. Images of the sample are recorded in that light coming from the sample is registered at the pixels. Variations of intensities of the light coming from the sample and registered at the pixels are determined during a set-up period in that a temporal course of the intensity of the light, which has been registered at a respective one of the pixels over the set-up period, is analyzed. Using these variations as a criterion, a subset of not more than 90% of the pixels of the image sensor is selected. Parts of the images that each correspond to the selected subset are compared to parts of at least one reference image that also correspond to the subset.

Abstract: The present invention is related to a method, a computer program, and apparatus for adapting an estimator for use in a microscope for estimating a position of an emitter in a sample based on a method, in which the sample is illuminated with light at one or more sets of probe positions and fluorescence photons are acquired for the sets of probe positions. The invention is further related to a microscope, which makes use of such a method or apparatus. The sample is illuminated with light at one or more sets of probe positions and fluorescence photons are acquired for the sets of probe positions. Photon counts of the acquired photons are then added to vectors of photon counts or sums of photon counts are determined for the sets of probe positions. A value representative of background noise is determined and used for adapting the estimator in real-time.

Abstract: An apparatus for detecting movements of a sample with respect to an objective comprises imaging optics which include the objective, which have an image plane and which are configured to image light from at least one reference object that is connected to the sample arranged in front of the objective into reference object images in the image plane. The apparatus further comprises a camera which is arranged in the image plane of the imaging optics and which is configured to record the reference object images at consecutive points in time, and an optical device arranged between the objective and the camera in a plane that is Fourier-conjugated with respect to the image plane. The optical device is configured to mask out low spatial frequencies of reference object images which the imaging optics image into the image plane.

Abstract: The present invention is related to a valve assembly and a method of manufacturing same. An extruded profile is used as a housing of the valve assembly, within said housing a single-component valve-element is injection-moulded, having a shaft-part and a plate-part, by moulding said single-component valve-element within a central bore against said housing during injection-moulding. Curing of the single-component valve-element and contracting thereof is allowed, providing for a clearance between the single-component valve-element and components of said housing for relative movement therebetween.