Patents by Inventor Ron KATZIR
Ron KATZIR has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11882262Abstract: A system and method of stereoscopic image processing by at least one processor may include receiving, from a first imaging device, having a first field of view (FOV), and located at a first, initially unknown position, a first image of a scene; receiving, from a second imaging device, having a second, different FOV, and located at a second, initially unknown position, a second image of the scene; calculating a plurality of flow lines in the first image, wherein each flow line represents an optical flow between a pixel of the first image and a corresponding pixel of the second image; and calibrating the imaging devices by determining at least one parameter of relative position between the first imaging device and second imaging device, based on the calculated flow lines.Type: GrantFiled: November 8, 2022Date of Patent: January 23, 2024Assignee: FORESIGHT AUTOMOTIVE LTD.Inventors: Omri Danziger, Ron Katzir, Ivgeny Kopilevich, Eliav Elul
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Publication number: 20230141515Abstract: A system and method of stereoscopic image processing by at least one processor may include receiving, from a first imaging device, having a first field of view (FOV), and located at a first, initially unknown position, a first image of a scene; receiving, from a second imaging device, having a second, different FOV, and located at a second, initially unknown position, a second image of the scene; calculating a plurality of flow lines in the first image, wherein each flow line represents an optical flow between a pixel of the first image and a corresponding pixel of the second image; and calibrating the imaging devices by determining at least one parameter of relative position between the first imaging device and second imaging device, based on the calculated flow lines.Type: ApplicationFiled: November 8, 2022Publication date: May 11, 2023Applicant: FORESIGHT AUTOMOTIVE LTD.Inventors: Omri DANZIGER, Ron KATZIR, Ivgeny KOPILEVICH, Eliav ELUL
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Patent number: 10571406Abstract: One or more metrology objects and one or more metrology operations may be identified. A design-based representation of a first metrology object of the one or more metrology objects may be received. Furthermore, an image-based representation of the first metrology object of the one or more metrology objects may be received where the one or more metrology operations include a first metrology operation associated with the first metrology object that is to be performed on the image-based representation of the first metrology object. The design-based representation of the first metrology object may be mapped with the image-based representation of the first metrology object. The first metrology operation may be performed based on the mapping.Type: GrantFiled: November 2, 2018Date of Patent: February 25, 2020Assignee: Applied Materials Israel Ltd.Inventors: Ron Katzir, Imry Kissos, Lavi Shachar, Amit Batikoff, Shaul Cohen, Noam Zac
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Patent number: 10545490Abstract: There are provided a method of generating an inspection recipe usable for inspecting an inspection area of a specimen and a recipe generating unit. The recipe generating unit is configured: upon obtaining design data informative of design structural elements comprised in a design PoI corresponding to the at least one PoI, to provide global segmentation of a test image captured by an inspection tool unit from the inspection area and comprising at least one test PoI of substantially the same design as the at least one PoI, thereby to obtain segmented structural elements comprised in the test PoI and segmentation configuration data; to associate the segmented structural elements comprised in the test PoI with the design structural elements comprised in the design PoI, thereby to obtain design association data; and to generate an inspection recipe comprising, at least, segmentation configuration data and design association data.Type: GrantFiled: June 1, 2015Date of Patent: January 28, 2020Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Michele Dalla-Torre, Amit Batikoff, Efrat Rozenman, Ron Katzir, Imry Kissos
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Patent number: 10504693Abstract: A method for evaluating an object, the method may include acquiring, by a charged particle beam system, an image of an area of a reference object, wherein the area includes multiple instances of a structure of interest, and the structure of interest is of a nanometric scale; determining multiple types of attributes from the image; reducing a number of the attributes to provide reduced attribute information; generating guidelines, based on the reduced attribute information and on reference data, for evaluating the reduced attribute information; and evaluating an actual object by implementing the guidelines.Type: GrantFiled: September 14, 2018Date of Patent: December 10, 2019Assignee: Applied Materials Israel Ltd.Inventors: Shay Attal, Shaul Cohen, Guy Maoz, Noam Zac, Mor Baram, Lee Moldovan, Ishai Schwarzband, Ron Katzir, Kfir Ben-Zikri, Doron Girmonsky
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Patent number: 10296702Abstract: There are provided system and method of performing metrology operations related to a specimen. The method comprises: generating an examination recipe in accordance with a metrology application, the examination recipe specifying one or more metrology objects and one or more metrology operations related to the metrology application; obtaining an image-based representation of the specimen and a design-based representation of the specimen; mapping between the design-based representation of at least first metrology object and the image-based representation of at least first metrology object; and performing at least first metrology operation of the one or more metrology operations according to the examination recipe using the mapping, the at least first metrology operation specified as related to the at least first metrology object and to be performed on at least the image-based representation of the specimen.Type: GrantFiled: September 7, 2017Date of Patent: May 21, 2019Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Amit Batikoff, Shaul Cohen, Noam Zac
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Publication number: 20190121933Abstract: One or more metrology objects and one or more metrology operations may be identified. A design-based representation of a first metrology object of the one or more metrology objects may be received. Furthermore, an image-based representation of the first metrology object of the one or more metrology objects may be received where the one or more metrology operations include a first metrology operation associated with the first metrology object that is to be performed on the image-based representation of the first metrology object. The design-based representation of the first metrology object may be mapped with the image-based representation of the first metrology object. The first metrology operation may be performed based on the mapping.Type: ApplicationFiled: November 2, 2018Publication date: April 25, 2019Inventors: Ron KATZIR, Imry KISSOS, Lavi SHACHAR, Amit BATIKOFF, Shaul COHEN, Noam ZAC
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Publication number: 20190088444Abstract: A method for evaluating an object, the method may include acquiring, by a charged particle beam system, an image of an area of a reference object, wherein the area includes multiple instances of a structure of interest, and the structure of interest is of a nanometric scale; determining multiple types of attributes from the image; reducing a number of the attributes to provide reduced attribute information; generating guidelines, based on the reduced attribute information and on reference data, for evaluating the reduced attribute information; and evaluating an actual object by implementing the guidelines.Type: ApplicationFiled: September 14, 2018Publication date: March 21, 2019Inventors: Shay Attal, Shaul Cohen, Guy Maoz, Noam Zac, Mor Baram, Lee Moldovan, Ishai Schwarzband, Ron Katzir, Kfir Ben-Zikri, Doron Girmonsky
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Patent number: 10120973Abstract: There are provided system and method of performing metrology operations related to a specimen.Type: GrantFiled: March 15, 2017Date of Patent: November 6, 2018Assignee: APPLIED MATERIALS ISRAEL LTD.Inventors: Ron Katzir, Imry Kissos, Lavi Jacov Shachar, Amit Batikoff, Shaul Cohen, Noam Zac
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Publication number: 20180268099Abstract: There are provided system and method of performing metrology operations related to a specimen. The method comprises: generating an examination recipe in accordance with a metrology application, the examination recipe specifying one or more metrology objects and one or more metrology operations related to the metrology application; obtaining an image-based representation of the specimen and a design-based representation of the specimen; mapping between the design-based representation of at least first metrology object and the image-based representation of at least first metrology object; and performing at least first metrology operation of the one or more metrology operations according to the examination recipe using the mapping, the at least first metrology operation specified as related to the at least first metrology object and to be performed on at least the image-based representation of the specimen.Type: ApplicationFiled: September 7, 2017Publication date: September 20, 2018Inventors: Ron KATZIR, Imry KISSOS, Lavi Jacov SHACHAR, Amit BATIKOFF, Shaul COHEN, Noam ZAC
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Publication number: 20180268098Abstract: There are provided system and method of performing metrology operations related to a specimen.Type: ApplicationFiled: March 15, 2017Publication date: September 20, 2018Inventors: Ron KATZIR, Imry KISSOS, Lavi Jacov SHACHAR, Amit BATIKOFF, Shaul COHEN, Noam ZAC
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Patent number: 9851714Abstract: There are provided a method of inspecting the inspection area and an inspection system thereof. The inspection system comprises an inspection control unit operatively coupled to an inspection tool unit and to a recipe generating unit. The inspection control unit is configured to obtain the design data and the inspection recipe; to provide local segmentation of at least one inspection PoI comprised in an inspection image captured from the inspection area by the inspection tool unit, thereby obtaining inspection structural elements comprised in the at least one inspection PoI, the local segmentation is provided using segmentation configuration data specified in the inspection recipe; to identify one or more target structural elements and design structural elements corresponding thereto, identifying is provided using design association data specified in the inspection recipe; and to enable metrology measurements for the one or more target structural elements using the identified design structural elements.Type: GrantFiled: June 2, 2015Date of Patent: December 26, 2017Assignee: APPLIED MATERIALS ISRAEL, LTD.Inventors: Michele Dalla-Torre, Amit Batikoff, Efrat Rozenman, Ron Katzir, Imry Kissos
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Publication number: 20160349742Abstract: There are provided a method of generating an inspection recipe usable for inspecting an inspection area of a specimen and a recipe generating unit. The recipe generating unit is configured: upon obtaining design data informative of design structural elements comprised in a design PoI corresponding to the at least one PoI, to provide global segmentation of a test image captured by an inspection tool unit from the inspection area and comprising at least one test PoI of substantially the same design as the at least one PoI, thereby to obtain segmented structural elements comprised in the test PoI and segmentation configuration data; to associate the segmented structural elements comprised in the test PoI with the design structural elements comprised in the design PoI, thereby to obtain design association data; and to generate an inspection recipe comprising, at least, segmentation configuration data and design association data.Type: ApplicationFiled: June 1, 2015Publication date: December 1, 2016Inventors: Michele DALLA-TORRE, Amit BATIKOFF, Efrat ROZENMAN, Ron KATZIR, Imry KISSOS
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Publication number: 20160350905Abstract: There are provided a method of inspecting the inspection area and an inspection system thereof. The inspection system comprises an inspection control unit operatively coupled to an inspection tool unit and to a recipe generating unit. The inspection control unit is configured to obtain the design data and the inspection recipe; to provide local segmentation of at least one inspection PoI comprised in an inspection image captured from the inspection area by the inspection tool unit, thereby obtaining inspection structural elements comprised in the at least one inspection PoI, the local segmentation is provided using segmentation configuration data specified in the inspection recipe; to identify one or more target structural elements and design structural elements corresponding thereto, identifying is provided using design association data specified in the inspection recipe; and to enable metrology measurements for the one or more target structural elements using the identified design structural elements.Type: ApplicationFiled: June 2, 2015Publication date: December 1, 2016Inventors: Michele DALLA-TORRE, Amit BATIKOFF, Efrat ROZENMAN, Ron KATZIR, Imry KISSOS