Patents by Inventor Ronak J. Bhatt

Ronak J. Bhatt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110121194
    Abstract: A charged-particle beam control system includes a plurality of external magnets that generate an axially-varying longitudinal magnetic (AVLM)/axially-varying quadrupole magnetic (AVQM) field. A plurality of external electrode geometries generates an axially-varying longitudinal electrostatic (AVLE)/axially-varying quadrupole electrostatic (AVQE) field. The external electrode geometries and magnets control and confine a charged-particle beam of elliptic cross-section.
    Type: Application
    Filed: October 16, 2007
    Publication date: May 26, 2011
    Inventors: Ronak J. Bhatt, Chiping Chen, Jing Zhou
  • Patent number: 7663327
    Abstract: A permanent magnet focusing system includes an electron gun that provides an electron ribbon beam having an elliptical shape. A plurality of permanent magnets provide transport for the electron ribbon beam. The permanent magnets produce a non-axisymmetric periodic permanent magnet (PPM) focusing field to allow the electron ribbon beam to be transported in the permanent magnet focusing system.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: February 16, 2010
    Assignee: Massachusetts Institute of Technology
    Inventors: Ronak J. Bhatt, Chiping Chen, Jing Zhou, Alexey Radovinsky
  • Patent number: 7619224
    Abstract: A high-brightness, space-charge-dominated circular charged-particle beam system includes a flat circular emitter that emits charge particles to form a space-charge-dominated circular charged-particle beam. The space-charge-dominated circular charged-particle beam is emitted from the flat circular emitter with a uniform density and having a current emission being space-charge-limited, obeying the Child-Langmuir law. A diode includes at least one electrode at the flat circular emitter and at least one additional electrode that accelerates the charged particles. A beam tunnel is coupled electrically to at least one of the additional electrodes. An applied axisymmetric magnetic field focuses the space-charge-dominated circular charged-particle beam. A depressed collector collects the space-charge-dominated circular charged-particle beam.
    Type: Grant
    Filed: November 15, 2007
    Date of Patent: November 17, 2009
    Assignee: Massachusetts Institute of Technology
    Inventors: Chiping Chen, Thomas M. Bemis, Ronak J. Bhatt, Jing Zhou
  • Patent number: 7612346
    Abstract: The charged-particle beam system includes a non-axisymmetric diode forms a non-axisymmetric beam having an elliptic cross-section. A focusing element utilizes a magnetic field for focusing and transporting the non-axisymmetric beam, wherein the non-axisymmetric beam is approximately matched with the channel of the focusing element.
    Type: Grant
    Filed: January 3, 2008
    Date of Patent: November 3, 2009
    Assignee: Massachusetts Institute of Technology
    Inventors: Ronak J. Bhatt, Chiping Chen, Jing Zhou
  • Publication number: 20080191144
    Abstract: The charged-particle beam system includes a non-axisymmetric diode forms a non-axisymmetric beam having an elliptic cross-section. A focusing element utilizes a magnetic field for focusing and transporting the non-axisymmetric beam, wherein the non-axisymmetric beam is approximately matched with the channel of the focusing element.
    Type: Application
    Filed: January 3, 2008
    Publication date: August 14, 2008
    Inventors: Ronak J. Bhatt, Chiping Chen, Jing Zhou
  • Publication number: 20080173827
    Abstract: A high-brightness, space-charge-dominated circular charged-particle beam system includes a flat circular emitter that emits charge particles to form a space-charge-dominated circular charged-particle beam. The space-charge-dominated circular charged-particle beam is emitted from the flat circular emitter with a uniform density and having a current emission being space-charge-limited, obeying the Child-Langmuir law. A diode includes at least one electrode at the flat circular emitter and at least one additional electrode that accelerates the charged particles. A beam tunnel is coupled electrically to at least one of the additional electrodes. An applied axisymmetric magnetic field focuses the space-charge-dominated circular charged-particle beam. A depressed collector collects the space-charge-dominated circular charged-particle beam.
    Type: Application
    Filed: November 15, 2007
    Publication date: July 24, 2008
    Inventors: Chiping Chen, Thomas M. Bemis, Ronak J. Bhatt, Jing Zhou
  • Patent number: 7381967
    Abstract: The charged-particle beam system includes a non-axisymmetric diode forms a non-axisymmetric beam having an elliptic cross-section. A focusing element utilizes a magnetic field for focusing and transporting the non-axisymmetric beam, wherein the non-axisymmetric beam is approximately matched with the channel of the focusing element.
    Type: Grant
    Filed: June 6, 2005
    Date of Patent: June 3, 2008
    Assignee: Massachusetts Institute of Technology
    Inventors: Ronak J. Bhatt, Chiping Chen, Jing Zhou