Abstract: A data integration hub system includes a centralized database storing data according to a dimensional modeling schema. The data integration hub system accepts an external dataset from an external data source that stores data according to a database schema that differs from the dimensional modeling schema of the central database. The data integration hub translates the external data set into a first importable format compatible with the dimensional modeling scheme of the centralized database, and imports the translated external dataset into the centralized database. The data integration hub also accepts online platform data from an online platform and imports the online platform data into the centralized database. In some cases, the data integration hub translated the online platform data prior to importation. The data integration hub generates client valuation profiles based on the data imported from the external data source and the online platform.

Abstract: A shielded interconnect array and associated methods are described. Examples of the shielded interconnect array include socket connections that include conductive members with flexible bends. In examples shown, corresponding grounded conductive members with flexible bends are located adjacent to other conductive members with flexible bends to provide shielding.

Abstract: A shielded interconnect array and associated methods are described. Examples of the shielded interconnect array include socket connections that include conductive members with flexible bends. In examples shown, corresponding grounded conductive members with flexible bends are located adjacent to other conductive members with flexible bends to provide shielding.

Abstract: Embodiments of an apparatus and method for providing cooling of probes for testing of integrated circuits are generally described herein. In some embodiments, an apparatus comprises a probe head assembly configured to hold one or more probes that are adapted to provide electrical contact with an integrated circuit device under test (DUT), a DUT chuck adapted to hold the DUT for contact with the probes, a seal arranged between the probe head assembly and the DUT chuck to form a chamber when the seal is in contact with the probe head assembly and the DUT chuck, and a first port and a second port arranged to provide fluid flow into and fluid flow out of the chamber.

Abstract: Embodiments of an apparatus and method for providing cooling of probes for testing of integrated circuits are generally described herein. In some embodiments, an apparatus comprises a probe head assembly configured to hold one or more probes that are adapted to provide electrical contact with an integrated circuit device under test (DUT), a DUT chuck adapted to hold the DUT for contact with the probes, a seal arranged between the probe head assembly and the DUT chuck to form a chamber when the seal is in contact with the probe head assembly and the DUT chuck, and a first port and a second port arranged to provide fluid flow into and fluid flow out of the chamber.

Abstract: A rotatable element is disposed in the central plenum of a minifold which rotates in response to the flow of the air-fuel mixture through the plenum and manifold. The rotation of the element enhances the atomization of entrained liquid fuel droplets in the flow and redirects the flow uniformly to all port runners. The rotatable element may include vanes for causing its rotation.

Abstract: An intake valve for use in an internal combustion engine has a plurality of impellers rigidly attached to its inlet side and oriented to optimize the vaporization and homogenity of fuel within the combustion chamber. The impellers harness the fuel/air mixture and create overlapping airflow vortexes within the combustion chamber.