Abstract: The invention pertains to a defect detection system for inspecting fabric wherein fabric is scanned by electronic light-sensing apparatus for inconsistencies in light reflecting capability and defects produce electronic signals which are counted, and preferably, are automatically counted with respect to a predetermined time interval wherein fabric manufacturing apparatus may be automatically monitored to maintain a predetermined quality of product. Preferably, infrared frequencies are utilized for defect sensing purposes and electronic signal retention counting and timing apparatus automatically terminates fabric production if defect occurence exceeds a predetermined frequency in a given time interval.