Patents by Inventor Rui Prazeres

Rui Prazeres has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High frequency deflection measurement of IR absorption
    Patent number: 8607622
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
    Type: Grant
    Filed: July 18, 2011
    Date of Patent: December 17, 2013
    Assignee: Anasys Instruments Corporation
    Inventors: Alexandre Dazzi, Rui Prazeres, Kevin Kjoller, Michael Reading
  • High frequency deflection measurement of IR absorption
    Publication number: 20110283428
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Application
    Filed: July 18, 2011
    Publication date: November 17, 2011
    Inventors: A. Dazzi Dazzi, Kevin Kjoller, Rui Prazeres, Michael Reading
  • High frequency deflection measurement of IR absorption
    Patent number: 8001830
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Grant
    Filed: May 15, 2007
    Date of Patent: August 23, 2011
    Assignee: Anasys Instruments, Inc.
    Inventors: Alexandre Dazzi, Rui Prazeres, Kevin Kjoller, Michael Reading
  • High frequency deflection measurement of IR absorption
    Publication number: 20080283755
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
    Type: Application
    Filed: May 15, 2007
    Publication date: November 20, 2008
    Inventors: A. Dazzi Dazzi, Rui Prazeres, Mike Reading, Kevin Kjoller