Patents by Inventor Ruwang Guo

Ruwang Guo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Aperture measuring device and an aperture measuring method
    Patent number: 10627207
    Abstract: An aperture measuring device and aperture measuring method for measuring the size of the aperture of a through-hole in a conductive structure is described to reduce the aperture measurement time and improve the working efficiency. The aperture measuring device includes: an aperture testing component for being inserted into the through-hole, wherein the aperture measuring device includes a plurality of resistor segments with different diameters, the individual resistor segments being successively connected in series in an order of the sizes of their diameters; and a measuring module for measuring the resistance value of a resistor segment unable to be inserted into the through-hole in the aperture testing component to determine the size of the aperture of the through-hole.
    Type: Grant
    Filed: May 11, 2018
    Date of Patent: April 21, 2020
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Dingyuan Li, Ruwang Guo, Haifeng Chen, Jie Wang
  • APERTURE MEASURING DEVICE AND AN APERTURE MEASURING METHOD
    Publication number: 20190017800
    Abstract: An aperture measuring device and aperture measuring method for measuring the size of the aperture of a through-hole in a conductive structure is described to reduce the aperture measurement time and improve the working efficiency. The aperture measuring device includes: an aperture testing component for being inserted into the through-hole, wherein the aperture measuring device includes a plurality of resistor segments with different diameters, the individual resistor segments being successively connected in series in an order of the sizes of their diameters; and a measuring module for measuring the resistance value of a resistor segment unable to be inserted into the through-hole in the aperture testing component to determine the size of the aperture of the through-hole.
    Type: Application
    Filed: May 11, 2018
    Publication date: January 17, 2019
    Inventors: Dingyuan LI, Ruwang GUO, Haifeng CHEN, Jie WANG
  • Display substrate and manufacturing method thereof, and display device
    Patent number: 9875999
    Abstract: A display substrate is provided, the display substrate comprising at least one pixel unit, the pixel unit including a pixel driving circuit (A2) located in an active driving circuit backplane, and a light-emitting diode chip (A1) disposed on the active driving circuit backplane; the light-emitting diode chip (A1) being electrically connected with the pixel driving circuit (A2). And a manufacturing method of the display substrate, and a display device comprising the display substrate are further provided.
    Type: Grant
    Filed: November 7, 2014
    Date of Patent: January 23, 2018
    Assignee: BOE Technology Group Co., Ltd.
    Inventors: Wulin Shen, Yanzhao Li, Jingang Fang, Ruwang Guo
  • Display Substrate and Manufacturing Method Thereof, and Display Device
    Publication number: 20160268239
    Abstract: A display substrate is provided, the display substrate comprising at least one pixel unit, the pixel unit including a pixel driving circuit (A2) located in an active driving circuit backplane, and a light-emitting diode chip (A1) disposed on the active driving circuit backplane; the light-emitting diode chip (A1) being electrically connected with the pixel driving circuit (A2). And a manufacturing method of the display substrate, and a display device comprising the display substrate are further provided.
    Type: Application
    Filed: November 7, 2014
    Publication date: September 15, 2016
    Inventors: Wulin Shen, Yanzhao Li, Jingang Fang, Ruwang Guo