Patents by Inventor Ryan C. Fredrickson

Ryan C. Fredrickson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process yield learning
    Patent number: 7114143
    Abstract: A method for producing yield enhancement data from integrated circuits on a substrate. A database of defects on the substrate is compared to a database of design information for the integrated circuits. The defects on the substrate are associated with classes of design information to produce the yield enhancement data.
    Type: Grant
    Filed: October 29, 2003
    Date of Patent: September 26, 2006
    Assignee: LSI Logic Corporation
    Inventors: Jeffrey F. Hanson, Ryan C. Fredrickson