Patents by Inventor Ryan G. Fronk
Ryan G. Fronk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230259768Abstract: The present disclosure describes aspects of a machine-learned (ML) spectrum analysis configured to distinguish between a plurality of radioisotope types and/or a plurality of emission levels of respective radioisotope types within spectrum data. The ML spectrum analyzer may utilize an artificial neural network (ANN) having an output layer configured to produce prediction data for respective labels, each label corresponding to a respective radioisotope. The prediction data may be configured to quantify an amount of each respective radioisotope within a subject of the spectrum.Type: ApplicationFiled: February 3, 2023Publication date: August 17, 2023Applicant: Battelle Energy Alliance, LLCInventors: Ryan G. Fronk, Matthew W. Anderson, Michael A. Reichenberger, Dawn M. Scates, Edward L. Reber
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Publication number: 20230236331Abstract: This application relates generally to improving energy resolution of measured energy data. One or more embodiments includes a method including obtaining first energy data representative of amounts of energy measured at a first number of energy levels. The method may also include generating second energy data based on the first energy data. The second energy data may be representative of amounts of energy at a second number of energy levels. The second energy data may exhibit a higher energy resolution than the first energy data. Related devices, systems and methods are also disclosed.Type: ApplicationFiled: January 26, 2022Publication date: July 27, 2023Inventors: Ryan G. Fronk, Matthew W. Anderson, Michael A. Reichenberger, Edward L. Reber, Dawn M. Scates, Graeme M. Holliday
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Patent number: 10107924Abstract: A semiconductor neutron detector and a semiconductor process is provided to manufacture a semiconductor neutron detector. First, a substrate with flat surface having a dielectric layer is formed thereon is provided. Thereafter, a masking pattern is applied and etched into the dielectric layer to expose semiconductor features on opposite sides of the substrate. The semiconductor substrate is submerged into an etchant composed of a semiconductor etching solution to etch deep cavities into the substrate in the exposed regions. Afterwards, dopant impurities are introduced and are driven into the semiconductor, under high temperature, into opposite sides of the etched features to produce one or more rectifying junctions. Afterwards, LiF and/or B particles are forced into the cavities through high velocity methods.Type: GrantFiled: July 11, 2016Date of Patent: October 23, 2018Inventors: Steven L. Bellinger, Ryan G. Fronk, Douglas S. McGregor
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Patent number: 9958561Abstract: A neutron detection apparatus includes a neutron detector and an analyzer. The neutron detector includes a plurality of neutron detector assemblies, where each of the neutron detector assemblies includes a plurality of neutron detection devices. The neutron detector also includes a moderating volume. The plurality of neutron detector assemblies are disposed within the moderating volume so as to form a three-dimensional array of neutron detection devices within the moderating volume. The analyzer is communicatively coupled to each of the neutron detection devices of the plurality of neutron detector assemblies. The analyzer configured to receive one or more measured response signals from each of the neutron detection devices, and perform one or more analysis procedures to determine one or more characteristics associated with the one or more neutron sources based at least on the received one or more measured response signals.Type: GrantFiled: October 10, 2016Date of Patent: May 1, 2018Assignees: The Curators of the University of Missouri, Kansas State University Research FoundationInventors: Steven L. Bellinger, Simon Bolding, Anthony N. Caruso, Brian Cooper, Joseph A. Crow, James Currie, Ryan G. Fronk, Cory B. Hoshor, Douglas S. McGregor, William H. Miller, Eliot R. Myers, Thomas M. Oakes, Brent J. Rogers, John K. Shultis, Philip B. Ugorowski, Stephen M. Young
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Publication number: 20170153340Abstract: A neutron detection apparatus includes a neutron detector and an analyzer. The neutron detector includes a plurality of neutron detector assemblies, where each of the neutron detector assemblies includes a plurality of neutron detection devices. The neutron detector also includes a moderating volume. The plurality of neutron detector assemblies are disposed within the moderating volume so as to form a three-dimensional array of neutron detection devices within the moderating volume. The analyzer is communicatively coupled to each of the neutron detection devices of the plurality of neutron detector assemblies. The analyzer configured to receive one or more measured response signals from each of the neutron detection devices, and perform one or more analysis procedures to determine one or more characteristics associated with the one or more neutron sources based at least on the received one or more measured response signals.Type: ApplicationFiled: October 10, 2016Publication date: June 1, 2017Inventors: Steven L. Bellinger, Simon Bolding, Anthony N. Caruso, Brian Cooper, Joseph A. Crow, James Currie, Ryan G. Fronk, Cory B. Hoshor, Douglas S. McGregor, William H. Miller, Eliot R. Myers, Thomas M. Oakes, Brent J. Rogers, John K. Shultis, Philip B. Ugorowski, Stephen M. Young
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Patent number: 9625590Abstract: A neutron detection system may include a neutron detector including a plurality of neutron detection devices, a plurality of discrete neutron moderating elements, wherein each of the neutron moderating elements is disposed between two or more neutron detection devices, the plurality of neutron detection devices and the plurality of discrete neutron moderating elements disposed along a common axis, a control system configured to generate a detector response library, wherein the detector response library includes one or more sets of data indicative of a response of the detector to a known neutron source, receive one or more measured neutron response signals from each of the neutron devices, the one or more measured response signals response to a detected neutron event, and determine one or more characteristics of neutrons emanating from a measured neutron source by comparing the one or more measured neutron response signals to the detector response library.Type: GrantFiled: May 19, 2015Date of Patent: April 18, 2017Assignees: The Curators of the Univesity of Missouri, Kansas State University Research FoundationInventors: Steven L. Bellinger, Anthony N. Caruso, Brian Cooper, William L. Dunn, Ryan G. Fronk, Douglas S. McGregor, William H. Miller, Eliot R. Myers, Thomas M. Oakes, Philip B. Ugorowski, John K. Shultis, Timothy J. Sobering, Cory B. Hoshor
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Publication number: 20170010370Abstract: A semiconductor neutron detector and a semiconductor process is provided to manufacture a semiconductor neutron detector. First, a substrate with flat surface having a dielectric layer is formed thereon is provided. Thereafter, a masking pattern is applied and etched into the dielectric layer to expose semiconductor features on opposite sides of the substrate. The semiconductor substrate is submerged into an etchant composed of a semiconductor etching solution to etch deep cavities into the substrate in the exposed regions. Afterwards, dopant impurities are introduced and are driven into the semiconductor, under high temperature, into opposite sides of the etched features to produce one or more rectifying junctions. Afterwards, LiF and/or B particles are forced into the cavities through high velocity methods.Type: ApplicationFiled: July 11, 2016Publication date: January 12, 2017Inventors: Steven L. Bellinger, Ryan G. Fronk, Douglas S. McGregor
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Patent number: 9465120Abstract: A neutron detection system includes a plurality of neutron detector assemblies, the neutron detector assemblies including a plurality of neutron detection devices, wherein the neutron detection devices are configured to detect one or more characteristics of neutrons emanating from one or more neutron sources and impinging on one or more neutron detection devices; a plurality of discrete moderating elements, wherein each of the discrete moderating elements is disposed proximate to at least one neutron detector assembly, the plurality of neutron detector assemblies and the plurality of discrete moderating elements disposed along a common axis, wherein the discrete moderating elements are configured to moderate the energy of neutrons impinging on one or more of the neutron-photon detector assemblies; and a control system configured to: determine one or more characteristics associated with the one or more neutron sources based on the received one or more measured response signals.Type: GrantFiled: March 5, 2015Date of Patent: October 11, 2016Inventors: Steven L. Bellinger, Simon Bolding, Anthony N. Caruso, Brian Cooper, Joseph A. Crow, James Currie, Ryan G. Fronk, Cory B. Hoshor, Douglas S. McGregor, William H. Miller, Eliot R Myers, Thomas M. Oakes, Brent J. Rogers, John K. Shultis, Philip B. Ugorowski, Stephen M. Young
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Patent number: 9081100Abstract: A neutron detection system may include a neutron detector including a plurality of neutron detection devices, a plurality of discrete neutron moderating elements, wherein each of the neutron moderating elements is disposed between two or more neutron detection devices, the plurality of neutron detection devices and the plurality of discrete neutron moderating elements disposed along a common axis, a control system configured to generate a detector response library, wherein the detector response library includes one or more sets of data indicative of a response of the detector to a known neutron source, receive one or more measured neutron response signals from each of the neutron devices, the one or more measured response signals response to a detected neutron event, and determine one or more characteristics of neutrons emanating from a measured neutron source by comparing the one or more measured neutron response signals to the detector response library.Type: GrantFiled: October 29, 2012Date of Patent: July 14, 2015Assignees: The Curator of the University of Missouri, Kansas State University Research FoundationInventors: Steven L. Bellinger, Anthony N. Caruso, Brian Cooper, William L. Dunn, Ryan G. Fronk, Douglas S. McGregor, William H. Miller, Eliot R. Myers, Thomas M. Oakes, Philip B. Ugorowski, John K. Shultis, Timothy J. Sobering, Cory B. Hoshor
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Patent number: 8778715Abstract: A method of making a neutron detector such as a microstructured semiconductor neutron detector is provided. The method includes the step of providing a particle-detecting substrate having a surface and a plurality of cavities extending into the substrate from the surface. The method also includes filling the plurality of cavities with a neutron-responsive material. The step of filling including the step of centrifuging nanoparticles of the neutron-responsive material with the substrate for a time and a rotational velocity sufficient to backfill the cavities with the nanoparticles. The material is responsive to neutrons absorbed, thereby, for releasing ionizing radiation reaction products.Type: GrantFiled: June 24, 2013Date of Patent: July 15, 2014Assignee: Radiation Detection Technologies, Inc.Inventors: Steven L. Bellinger, Ryan G. Fronk, Douglas S. McGregor
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Publication number: 20130344636Abstract: A method of making a neutron detector such as a microstructured semiconductor neutron detector is provided. The method includes the step of providing a particle-detecting substrate having a surface and a plurality of cavities extending into the substrate from the surface. The method also includes filling the plurality of cavities with a neutron-responsive material. The step of filling including the step of centrifuging nanoparticles of the neutron-responsive material with the substrate for a time and a rotational velocity sufficient to backfill the cavities with the nanoparticles.Type: ApplicationFiled: June 24, 2013Publication date: December 26, 2013Inventors: Steven L. Bellinger, Ryan G. Fronk, Douglas S. McGregor