Patents by Inventor Ryo IKEUCHI

Ryo IKEUCHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11867569
    Abstract: A temperature abnormality detection system of the present invention includes a first temperature sensor that measures a first temperature indicated by a target device and a second temperature sensor that measures a second temperature indicated by ambient air around the target device. A temperature difference between the first temperature and the second temperature is calculated, and when this temperature difference becomes a predetermined threshold value or more, it is determined that a temperature abnormality of the target device has occurred.
    Type: Grant
    Filed: March 31, 2021
    Date of Patent: January 9, 2024
    Assignee: OMRON CORPORATION
    Inventors: Ryo Ikeuchi, Takaaki Yamada, Tatsuaki Kozono
  • Publication number: 20220214220
    Abstract: A temperature abnormality detection device includes a plurality of infrared temperature sensors respectively capable of detecting temperature in a different detection area of an equipment, and a device body including a temperature abnormality determination unit that determines that the temperature in the detection area detected by each of the plurality of infrared temperature sensors is abnormal when the temperature in the detection area is higher than a reference temperature. The plurality of infrared temperature sensors is connected to each other by crossover wiring.
    Type: Application
    Filed: February 21, 2020
    Publication date: July 7, 2022
    Inventors: Ryo IKEUCHI, Koji TAKATORI, Takahiro NAKAMURA, Hironori OGAWA, Tadahiko OGAWA, Akira TAKAISHI
  • Publication number: 20220170987
    Abstract: Provided is an abnormality diagnosis device capable of diagnosing an abnormality of a motor without setting many parameters. An abnormality diagnosis device includes a current measuring unit that measures a load current of the motor; a frequency analyzing unit that performs frequency analysis of the load current; and a deterioration degree calculating unit that calculates a degree of deterioration by adding up a preset number of intensity values from top in a preset frequency range.
    Type: Application
    Filed: January 24, 2020
    Publication date: June 2, 2022
    Inventors: Toru MATSUMOTO, Takahiro SATO, Tomohiro YAMADA, Koji YOKOTA, Ryohei TAKATANI, Tsuyoshi TAKEUCHI, Ryo IKEUCHI
  • Publication number: 20210215546
    Abstract: A temperature abnormality detection system of the present invention includes a first temperature sensor that measures a first temperature indicated by a target device and a second temperature sensor that measures a second temperature indicated by ambient air around the target device. A temperature difference between the first temperature and the second temperature is calculated, and when this temperature difference becomes a predetermined threshold value or more, it is determined that a temperature abnormality of the target device has occurred.
    Type: Application
    Filed: March 31, 2021
    Publication date: July 15, 2021
    Inventors: Ryo IKEUCHI, Takaaki YAMADA, Tatsuaki KOZONO
  • Publication number: 20210215545
    Abstract: The temperature threshold determining device includes a temperature data storage unit, a representative temperature value determining unit, and a temperature threshold determining unit. The temperature data storage unit stores temperature data that indicates the temperature of a target apparatus during past operation. The representative temperature value determining unit determines a representative temperature value of the target apparatus during the past operation, which is derived using the temperature data stored in the temperature data storage unit. The temperature threshold determining unit determines at least one temperature threshold by using the representative temperature value during the past operation and a reference temperature value that is preset and configured to prevent the temperature abnormality.
    Type: Application
    Filed: March 31, 2021
    Publication date: July 15, 2021
    Inventors: Takahiro NAKAMURA, Ryo IKEUCHI, Tatsuaki KOZONO, Takaaki YAMADA
  • Patent number: 10402606
    Abstract: An RFID data management device includes an RFID data acquisition unit acquiring RFID management data including identification information of an RFID, a relevant data acquisition unit acquiring RFID relevant data including a use start date of the RFID, and a remaining time calculation unit calculating a remaining data guarantee time of the RFID using a data guarantee period dependent on the identification information and the environmental temperature of the RFID, and the environmental temperature. The remaining time calculation unit calculates the remaining time using an environmental temperature in a first period from a manufacturing date of the RFID to a use start timing, a data guarantee period according to the environmental temperature in the first period, an environmental temperature in a second period from the use start timing to a timing of confirmation, and a data guarantee period according to the environmental temperature in the second period.
    Type: Grant
    Filed: December 15, 2017
    Date of Patent: September 3, 2019
    Assignee: OMRON Corporation
    Inventors: Takahiro Sato, Koji Takatori, Hidekatsu Nogami, Ryo Ikeuchi, Takema Sato
  • Publication number: 20180268179
    Abstract: An RFID data management device includes an RFID data acquisition unit acquiring RFID management data including identification information of an RFID, a relevant data acquisition unit acquiring RFID relevant data including a use start date of the RFID, and a remaining time calculation unit calculating a remaining data guarantee time of the RFID using a data guarantee period dependent on the identification information and the environmental temperature of the RFID, and the environmental temperature. The remaining time calculation unit calculates the remaining time using an environmental temperature in a first period from a manufacturing date of the RFID to a use start timing, a data guarantee period according to the environmental temperature in the first period, an environmental temperature in a second period from the use start timing to a timing of confirmation, and a data guarantee period according to the environmental temperature in the second period.
    Type: Application
    Filed: December 15, 2017
    Publication date: September 20, 2018
    Applicant: OMRON Corporation
    Inventors: Takahiro SATO, Koji TAKATORI, Hidekatsu NOGAMI, Ryo IKEUCHI, Takema SATO
  • Patent number: D950359
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: May 3, 2022
    Assignee: OMRON Corporation
    Inventors: Tadahiko Ogawa, Koji Takatori, Ryo Ikeuchi, Takahiro Nakamura