Patents by Inventor Ryou Nakagaki

Ryou Nakagaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for observing specimen and device therefor
    Patent number: 6756589
    Abstract: During closer inspection with a local defect area being magnified, it is desirable to reduce image acquisition time by making the number of stage moves as few as possible so that a defect can be observed efficiently.
    Type: Grant
    Filed: January 9, 2001
    Date of Patent: June 29, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Kenji Obara, Yuji Takagi, Atsushi Shimoda, Ryou Nakagaki, Seiji Isogai, Yasuhiko Ozawa, Hideka Banba, Kenji Watanabe, Chie Shishido
  • Method for classifying defects and device for the same
    Publication number: 20010042705
    Abstract: A method for classifying defects includes imaging an inspected object. An image of a defect candidate is extracted from an image obtained by said imaging step. Said extracted defect candidate image is classified into a first category. Said extracted defect candidate image is classified into a second category. Said extracted defect candidate image and information relating to said classification into said first category and information relating to said classification into said second category are displayed on a screen.
    Type: Application
    Filed: March 30, 2001
    Publication date: November 22, 2001
    Inventors: Ryou Nakagaki, Yuji Takagi, Kenji Obara, Yasuhiko Ozawa, Toshiei Kurosaki, Takehiro Hirai