Patents by Inventor Ryouji Hamasaki

Ryouji Hamasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6849191
    Abstract: According to the present invention, there is provided a sample surface treating apparatus for processing a fine pattern by plasma etching, including a stage provided in a chamber, on which a sample to be subjected to a surface treatment is placed; etching gas supply source for continuously supplying an etching gas for plasma generation into the chamber; a plasma generator for generating a high-density plasma in the chamber; a bias power supply for applying a bias voltage of 100 kHz or higher to the stage independently of the plasma generation; and a pulse modulator for modulating the bias power supply at a frequency of 100 Hz to 10 kHz, wherein a surface treatment in which the minimum feature size is 1 ?m or smaller is performed on the sample placed on the stage.
    Type: Grant
    Filed: February 12, 1999
    Date of Patent: February 1, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Tetsuo Ono, Tatsumi Mizutani, Ryouji Hamasaki, Tokuo Kure, Takafumi Tokunaga, Masayuki Kojima
  • Patent number: 6767838
    Abstract: A method and apparatus of treating a surface of a sample. A sample is arranged on a stage provided in a chamber, an etching gas is continuously supplied into the chamber and a plasma is generated from the etching gas. An rf bias at a frequency of 100 kHz or higher is applied to the stage independently of the generation of the plasma, and the rf bias is modulated at a frequency of 100 Hz to 10 kHz. Thereby, a surface treatment in which a minimum feature size is 1 &mgr;m or smaller is performed on the sample.
    Type: Grant
    Filed: October 19, 2000
    Date of Patent: July 27, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Tetsuo Ono, Tatsumi Mizutani, Ryouji Hamasaki, Tokuo Kure, Takafumi Tokunaga, Masayuki Kojima
  • Publication number: 20020125207
    Abstract: A plasma processing method for etching a sample includes generating a plasma in a treatment chamber having a stage on which the sample is placed, wherein the plasma is generated by use of electromagnetic waves, applying an rf bias to the stage with a frequency which enables reduction of ions having an intermediate energy, and on-off modulating the rf bias so that reaction products are deposited on the sample during the off period of the rf bias.
    Type: Application
    Filed: May 1, 2002
    Publication date: September 12, 2002
    Inventors: Tetsuo Ono, Tatsumi Mizutani, Ryouji Hamasaki, Tokuo Kure, Takafumi Tokunaga, Masayuki Kojima
  • Patent number: 6235146
    Abstract: A stage with an electrostatic attracting means is adapted for use in a wafer treatment at a high temperature in a vacuum treatment system. In a vacuum treatment system having a stage provided in a treatment chamber, which electrostatically attracts an object to the stage in a low pressure atmosphere, and treats the object at high temperature by heating the stage, an electrode member of the stage is made of titanium or a titanium alloy and a dielectric film for electrostatic attraction is formed on the electrode member. In order to bond firmly titanium and alumina ceramics, it is desirable to sandwich a nickel alloy (Ni—Al) between the materials.
    Type: Grant
    Filed: May 18, 1999
    Date of Patent: May 22, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Masanori Kadotani, Saburo Kanai, Youichi Itou, Takashi Fujii, Hironobu Kawahara, Ryouji Hamasaki, Kazue Takahashi, Motohiko Yoshigai