Patents by Inventor Ryuei Ono

Ryuei Ono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080186513
    Abstract: By the method of measuring a gap depth of a thin film magnetic head for horizontal magnetic recording, the gap depth of a write-magnetic pole can be easily and correctly measured. The method comprises the steps of: forming a first standard marker; measuring a distance between an actual position of a rear end of a lapping guide and the position of the first standard marker; calculating a lapping guide shift length; forming a second standard marker; measuring a distance between an actual position of a zero throat and a position of the second standard marker; calculating a zero throat shift length; and calculating an actual gap depth of a write-magnetic pole by adding the lapping guide shift length and the zero throat shift length to a designed gap depth.
    Type: Application
    Filed: November 20, 2007
    Publication date: August 7, 2008
    Applicant: Fujitsu Limited
    Inventor: Ryuei Ono
  • Publication number: 20080100960
    Abstract: The present invention provides an insulation characteristic measuring method of measuring electrical insulation of magnetic head elements formed on a wafer. Each of the magnetic head elements includes an upper magnetic pole layer, a lower magnetic pole layer, insulation layers disposed between the upper and lower magnetic pole layers, and a coil layer formed of a conductive material and disposed between the insulation layers. In at least one of the magnetic head elements, the upper and lower magnetic pole layers are electrically insulated from each other, and the upper and lower magnetic pole layers and the coil layer of the element are respectively connected to terminals of electrodes for measuring insulation. The insulation characteristic of the magnetic head elements is measured by the electrodes. It is therefore possible to measure whether insulation is ensured between layers of the magnetic head elements, which need to be insulated from each other.
    Type: Application
    Filed: March 30, 2007
    Publication date: May 1, 2008
    Inventors: Masahiro Kakehi, Ryuei Ono
  • Publication number: 20080038849
    Abstract: An evaluation method includes the steps of forming a dummy pattern having a patterned part with the same critical dimension as a minimum critical dimension of an actual device having a fine pattern that is so fine that a probe for a continuity test cannot be connected to both ends of the fine pattern, in forming the fine pattern, while connecting both ends of the dummy pattern to a pair of pads to which the probe is connectible, performing the continuity test of the dummy pattern using the probe and the pads, and evaluating an insulating characteristic of the fine pattern based on a result of the continuity test.
    Type: Application
    Filed: December 29, 2006
    Publication date: February 14, 2008
    Applicant: FUJITSU LIMITED
    Inventors: Takamitsu Orimoto, Ryuei Ono
  • Publication number: 20070297096
    Abstract: In the magnetic head, characteristics of a read-element is not badly influenced by external electromagnetic waves, and the magnetic head is highly resistant to external electromagnetic waves. The magnetic head comprises: a write-head; a read-head having a read-element, which is grounded to a substrate via a resistance; and an electromagnetic wave shielding layer covering over a resistance area, in which the resistance is formed.
    Type: Application
    Filed: October 5, 2006
    Publication date: December 27, 2007
    Inventors: Tomoka Aoki, Ryuei Ono
  • Publication number: 20070285836
    Abstract: The method is capable of producing a compact magnetic head, which has superior characteristics with a small size recording coil and which is capable of restraining magnetic loss. The magnetic head includes a recording coil, a lower magnetic pole and a back gap section. The method comprises the steps of: forming a seed layer for plating on a lower layer; forming the recording coil on the seed layer, by electrolytic plating, with using the seed layer as an electric power feeding layer; patterning resist on the seed layer so as to form the lower magnetic pole and the back gap section; removing exposed parts of the seed layer; exposing parts of the lower layer, in which the lower magnetic pole and the back gap section will be formed; and forming the lower magnetic pole and the back gap section in the lower layer, by electrolytic plating.
    Type: Application
    Filed: October 4, 2006
    Publication date: December 13, 2007
    Inventors: Ryuei Ono, Takashi Ito