Patents by Inventor Ryuichi Naganawa

Ryuichi Naganawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of analyzing gas using quartz oscillator and apparatus therefor
    Patent number: 6977506
    Abstract: A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfaces each provided with an electrode, at least one of the electrodes being reactable with the decomposition product so that the decomposition product when contacted with the reactable electrode is reacted with the reactable electrode to cause a frequency deviation which is detected by a frequency measuring device.
    Type: Grant
    Filed: September 9, 2003
    Date of Patent: December 20, 2005
    Assignees: National Institute of Advanced Industrial Science and Technology, Gastec Corporation
    Inventors: Kazutoshi Noda, Ryuichi Naganawa, Kunitoshi Matsunobu, Katsuhide Uchida, Kouta Kobayashi
  • Method of analyzing gas using quartz oscillator and apparatus therefor
    Publication number: 20040051535
    Abstract: A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfaces each provided with an electrode, at least one of the electrodes being reactable with the decomposition product so that the decomposition product when contacted with the reactable electrode is reacted with the reactable electrode to cause a frequency deviation which is detected by a frequency measuring device.
    Type: Application
    Filed: September 9, 2003
    Publication date: March 18, 2004
    Applicants: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, GASTEC CORPORATION
    Inventors: Kazutoshi Noda, Ryuichi Naganawa, Kunitoshi Matsunobu, Katsuhide Uchida, Kouta Kobayashi
  • Method of analyzing concentration of target substance using quartz oscillator and device therefor
    Patent number: 6339954
    Abstract: In a method of analyzing a concentration of a target substance contained in a fluid using a quartz oscillator having a surface covered with a layer capable of absorbing the target substance, the temperature of the fluid and the quartz oscillator is controlled at substantially the same predetermined temperature selected according to the concentration of the target substance in said fluid, so that the analysis can be made with optimum sensitivity. A device for analyzing a concentration of a target substance contained in a fluid, includes a contacting chamber accommodating a quartz oscillator, a temperature controller, disposed in a feed passage for feeding the fluid into said contacting chamber, for adjusting a temperature of the fluid at a desired predetermined temperature; and a detector of a frequency of the quartz oscillator.
    Type: Grant
    Filed: March 20, 2000
    Date of Patent: January 22, 2002
    Assignee: Secretary of Agency of Industrial Science and Technology
    Inventors: Ryuichi Naganawa, Kazutoshi Noda, Hiroaki Tao, Mamoru Tominaga