Abstract: Oxidation of a metal film disposed under a high permittivity insulation film can be suppressed, and the productivity of a film-forming process can be improved. In a method of manufacturing a semiconductor device, a first high permittivity insulation film is formed on a substrate by alternately repeating a process of supplying a source into a processing chamber in which the substrate is accommodated and exhausting the source and a process of supplying a first oxidizing source into the processing chamber and exhausting the first oxidizing source; and a second high permittivity insulation film is formed on the first high permittivity insulation film by alternately repeating a process of supplying the source into the processing chamber and exhausting the source and a process of supplying a second oxidizing source different from the first oxidizing source into the processing chamber and exhausting the second oxidizing source.

Abstract: The ability to control a concentration ratio of a metal and silicon in a metal silicate film is improved, allowing a high-quality semiconductor device to be manufactured. A step is provided for supplying a first raw material, which contains a metal atom, and a second raw material, which contains a silicon atom and a nitrogen atom, into a processing chamber (4); and forming on a substrate (30) a metal silicate film containing the metal atom and silicon atom. A raw material supply ratio of the first and second raw materials is controlled in the step of forming a metal silicate film, thereby controlling a concentration ratio of the metal and silicon in the resulting metal silicate film.

Abstract: A substrate is held by a susceptor (holding tool) in a processing chamber. A plate is provided on a periphery of the substrate. Gas supply ports are constructed to be provided on a side of the substrate and above the plate, and to supply gas to the substrate from a space above the plate. Outlets are provided at least on an upstream side and downstream side of the substrate on the plate, and are adapted to discharge the gas to a space below the plate. An exhaust port communicates with the outlets, and is provided on an opposite side to the gas supply ports with the substrate sandwiched there between and below the plate. The outlets are composed so that conductance of the upstream outlet in a gas flow between the outlets can be larger than conductance of the downstream outlet.

Abstract: Nitrogen supplied into the high dielectric constant film is prevented from leaving from the film. A semiconductor device manufacturing method, includes the steps of: nitriding a high dielectric constant film, formed on a substrate by using plasma, heat treating the nitrided high dielectric constant film, and transferring the heat treated substrate, wherein the nitriding step and the heat treating step are performed consecutively or simultaneously in the same substrate processing apparatus without exposing the substrate to air, and the step of transferring the substrate is performed while, the substrate is exposed to air.

Abstract: To prevent particles from generating by reducing a contact-gas area and improve a purge efficiency by reducing a flow passage capacity.

Abstract: The throughput in the overall gate stack forming process is improved. When using a cluster apparatus to perform a gate stack forming process including a high dielectric film forming step, a plasma nitriding step, an annealing step and a gate electrode forming step, the final ongoing gate electrode forming step is stopped in the middle, and the remainder of the gate electrode forming step is performed on multiple wafers as batch processing. This shortens the standby time for consecutive steps in the cluster apparatus to improve the throughput in the overall gate stack forming process.

Abstract: Productivity and product yield, as well as the step coverage and the adhesion are improved. A film forming process includes an initial film forming step, and a main film forming step. In the initial film forming step, a step of supplying a material gas into a processing chamber to adsorb the material gas on the substrate, and a step of supplying a first reaction gas not containing oxygen atoms into the processing chamber to cause a reaction with the material gas adsorbed on the substrate in order to from a thin film on the substrate, are repeated multiple cycles to form the thin film with the specified thickness on the substrate.

Abstract: To provide a manufacturing method of a semiconductor device and a substrate processing apparatus capable of easily controlling a nitrogen concentration distribution in a film containing a metal atom and a silicon atom, and manufacturing a high quality semiconductor device. The method comprises a step of forming a film containing the metal atom and the silicon atom on a substrate 30 in a reaction chamber 4, and performing a nitriding process for the film, wherein the film is formed by changing a silicon concentration at least in two stages in the step of forming a film.

Abstract: To obtain a conductive metal film having superior step coverage, adhesiveness, and high productivity. A conductive metal film or metal oxidized film suitable as a capacitor electrode is formed on a substrate by performing an excited-gas supplying step after a source gas supplying step. In the source gas supplying step, gas obtained by vaporizing an organic source is supplied to the substrate, and the gas thus supplied is allowed to be adsorbed on the substrate. In the excited-gas supplying step, oxygen or nitrogen containing gas excited by plasma is supplied to the substrate to decompose the source adsorbed on the substrate, thus forming a film. An initial film-forming stop is a step of forming the film by repeating the source gas supplying step and the excited-gas supplying step once or multiple times. A desired thickness can be obtained by one step of the initial film-forming step.

Abstract: A method of manufacturing a semiconductor device of the present invention includes a first step of forming a metal oxide film containing at least one or more kinds of elements selected from the group consisting of hafnium, yttrium, lanthanum, aluminium, zirconium, strontium, titanium, barium, tantalum, niobium, on a substrate having a metal thin film formed on the surface, at a first temperature allowing no oxidization of the metal thin film to occur, and allowing the metal oxide film to be set in an amorphous state; and a second step of forming a metal oxide film containing at least one or more kinds of elements selected from the group consisting of hafnium, yttrium, lanthanum, aluminium, zirconium, strontium, titanium, barium, tantalum, niobium on the metal oxide film formed in the first step, up to a target film thickness, at a second temperature exceeding the first temperature.

Abstract: A method of manufacturing a semiconductor device includes the steps of loading a substrate into a processing chamber; processing the substrate by supplying plural kinds of reaction substances into the processing chamber multiple number of times; and unloading the processed substrate from the processing chamber, wherein at least one of the plural kinds of reaction substances contains a source gas obtained by vaporizing a liquid source by a vaporizing part; in the step of processing the substrate, vaporizing operation of supplying the liquid source to the vaporizing part and vaporizing the liquid source is intermittently performed, and at least at a time other than performing the vaporizing operation of the liquid source, a solvent capable of dissolving the liquid source is flown to the vaporizing part at a first flow rate; and at a time other than performing the vaporizing operation of the liquid source and every time performing the vaporizing operation of the liquid source prescribed number of times, the solv

Abstract: The present invention provides a manufacturing method of a semiconductor device that has a rapid film formation rate and high productivity, and to provide a substrate processing apparatus.

Abstract: Disclosed are a method for producing a semiconductor device and a substrate processing apparatus. The method comprises a step of carrying a substrate into a processing chamber, a step of feeding a material gas into the processing chamber to thereby form a high dielectric constant film on the substrate, a step of carrying the substrate after film formation thereon out of the processing chamber, and a step of feeding an O3 gas and a Cl-containing gas into the processing chamber under the condition that, when the number of the Cl atoms in the Cl-containing gas is indicated by n, the flow rate of the O3 gas is at least 2n times the flow rate of the Cl-containing gas, thereby removing the film adhering inside the processing chamber to clean the inside of the processing chamber.

Abstract: The ability to control a concentration ratio of a metal and silicon in a metal silicate film is improved, allowing a high-quality semiconductor device to be manufactured. A step is provided for supplying a first raw material, which contains a metal atom, and a second raw material, which contains a silicon atom and a nitrogen atom, into a processing chamber (4); and forming on a substrate (30) a metal silicate film containing the metal atom and silicon atom. A raw material supply ratio of the first and second raw materials is controlled in the step of forming a metal silicate film, thereby controlling a concentration ratio of the metal and silicon in the resulting metal silicate film.

Abstract: To prevent particles from generating by reducing a contact-gas area and improve a purge efficiency by reducing a flow passage capacity.

Abstract: A semiconductor device manufacturing method by which a process chamber can be self-cleaned, while keeping a temperature in the process chamber low or a semiconductor device manufacturing method by which a high-k film adhering in the process chamber can be effectively removed. The method is provided with a pre-coat process, a film forming process and a cleaning process. Activated F* or Cl* by remote plasma passes through a high-k film (31), reacts to a pre-coat film (30) composed of SiO2 or Si. Since the pre-coat film (30) peels in pieces, the high-k film over the pre-coat film can be removed together.

Abstract: To provide a manufacturing method of a semiconductor device and a substrate processing apparatus capable of easily controlling a nitrogen concentration distribution in a film containing a metal atom and a silicon atom, and manufacturing a high quality semiconductor device. The method comprises a step of forming a film containing the metal atom and the silicon atom on a substrate 30 in a reaction chamber 4, and performing a nitriding process for the film, wherein the film is formed by changing a silicon concentration at least in two stages in the step of forming a film.

Abstract: An oxidizer supply device (30) comprises an ozonizer (31) for generating ozone (32), a bubbler (34) wherein deionized water (35) is kept and an ozone supply pipe (33) for supplying ozone (32) from the ozonizer (31) is immersed in the deionized water (35) so as to bubble ozone, and a supply pipe (36) for supplying oxidizer (37) containing OH* generated by bubbling of the ozone (32). The device (30) is connected to a feed pipe (18) of an oxide film forming device (10). The oxidizer containing OH* generated by bubbling ozone in the water possesses a powerful oxidizing effect so oxide film can be formed on the wafer at a relatively low temperature in a short time. Semiconductor devices or circuit patterns previously formed on the wafer can be prevented from being damaged by plasma since no plasma is used. The throughput, performance and reliability of the oxide film forming device are therefore improved.

Abstract: To improve throughput of a substrate processing without wastefully using a source as a reactant by repeating supply steps of a plurality of reactants for a plurality of times. A substrate processing apparatus includes a source gas obtained by vaporizing a liquid source as a reactant, and functions to process a substrate by repeating the supply of the source gas into a processing chamber 1, and the supply of the reactant different from the source gas into the processing chamber 1, which is executed subsequently, for a plurality of times. A flow rate of the liquid source is controlled by an injection drive control mechanism 6. The injection drive control mechanism 6 is designed to fix the flow rate per one injecting operation of the liquid source directly flowing into a vaporization section in a vaporizer 3, and intermittently inject the liquid source to a vaporization section 31.

Abstract: To obtain a conductive metal film having superior step coverage, adhesiveness, and high productivity. A conductive metal film or metal oxidized film suitable as a capacitor electrode is formed on a substrate by performing an excited-gas supplying step after a source gas supplying step. In the source gas supplying step, gas obtained by vaporizing an organic source is supplied to the substrate, and the gas thus supplied is allowed to be adsorbed on the substrate. In the excited-gas supplying step, oxygen or nitrogen containing gas excited by plasma is supplied to the substrate to decompose the source adsorbed on the substrate, thus forming a film. An initial film-forming stop is a step of forming the film by repeating the source gas supplying step and the excited-gas supplying step once or multiple times. A desired thickness can be obtained by one step of the initial film-forming step.