Patents by Inventor Saeed Zafar

Saeed Zafar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical connectors and IC chip tester embodying same
    Patent number: 5127837
    Abstract: A novel wadded wire-plunger contact is provided which possesses excellent durability and desired functional characteristics in a large variety of applications such as the testing of IC chips.
    Type: Grant
    Filed: August 28, 1991
    Date of Patent: July 7, 1992
    Assignee: Labinal Components and Systems, Inc.
    Inventors: Arun J. Shah, David W. McClung, Albert N. Hopfer, Richard J. Linderman, Saeed Zafar