Patents by Inventor Saem PARK

Saem PARK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of analyzing lattice strain of semiconductor device
    Patent number: 10410332
    Abstract: A method of analyzing lattice strain of a semiconductor device includes generating a spectrum image by performing a Fourier Transform on an image of a semiconductor device, providing a first hybrid mask filter t filter designed to select at least one peak frequency from the spectrum image, filtering the spectrum image using the first hybrid mask filter to generate a filtered spectrum image, and generating a first strain image by performing an inverse Fourier Transform on the filtered spectrum image.
    Type: Grant
    Filed: February 1, 2017
    Date of Patent: September 10, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Myoung-Ki Ahn, Gwang-Seon Byun, Han-Saem Park, Hyun-Koo Kwak, Su-Bong Shon, Ung-Keun Cho
  • METHOD OF ANALYZING LATTICE STRAIN OF SEMICONDUCTOR DEVICE
    Publication number: 20180012348
    Abstract: A method of analyzing lattice strain of a semiconductor device includes generating a spectrum image by performing a Fourier Transform on an image of a semiconductor device, providing a first hybrid mask filter t filter designed to select at least one peak frequency from the spectrum image, filtering the spectrum image using the first hybrid mask filter to generate a filtered spectrum image, and generating a first strain image by performing an inverse Fourier Transform on the filtered spectrum image.
    Type: Application
    Filed: February 1, 2017
    Publication date: January 11, 2018
    Inventors: MYOUNG-KI AHN, GWANG-SEON BYUN, HAN-SAEM PARK, HYUN-KOO KWAK, SU-BONG SHON, UNG-KEUN CHO