Abstract: In one general embodiment, a method for selecting parameters of an error recovery procedure includes detecting an error during performance of a data operation on a data storage medium by an apparatus. In response to detecting the error, parameters of an error recovery procedure are selected based at least in part on: (a) first information about previous interactions between the apparatus and multiple data storage media, and (b) second information about previous interactions between the data storage medium and other apparatuses.

Abstract: A tape may be mounted into a tape drive. Mounting the tape into the tape drive may include loading the tape from a storage slot. The tape drive may request a first record of the tape from a tape storage subsystem. The tape drive may determine whether the first record of the tape exists in the tape storage subsystem. The tape drive may load the first record of the tape in random access memory (RAM) of the tape drive. The first record may include one or more data entries. The tape drive may append a new data entry to the first record. The first record may be transitioned to a second record upon being appended with the new data entry. The tape may be unmounted from the tape drive.

Abstract: A tape may be mounted into a tape drive. Mounting the tape into the tape drive may include loading the tape from a storage slot. The tape drive may request a first record of the tape from a tape storage subsystem. The tape drive may determine whether the first record of the tape exists in the tape storage subsystem. The tape drive may load the first record of the tape in random access memory (RAM) of the tape drive. The first record may include one or more data entries. The tape drive may append a new data entry to the first record. The first record may be transitioned to a second record upon being appended with the new data entry. The tape may be unmounted from the tape drive.

Abstract: A computer-implemented method, according to one embodiment, includes: collecting performance data corresponding to a tape drive and/or a magnetic tape head, storing the performance data in memory, and using the data to perform problem analysis. The performance data includes a resistance of the tape drive and/or magnetic tape head and a resolution of the tape drive and/or the magnetic tape head. Moreover, performing the problem analysis includes: determining a condition of the tape drive and/or the magnetic tape head, wherein the condition is selected from a group consisting of: wear, corrosion, defective leads and wire bonds. Other systems, methods, and computer program products are described in additional embodiments.

Abstract: A method, according to one embodiment, includes writing a plurality of shingled tracks using an array of writers. The array of readers is repositioned to various locations between first and second positions and data is read from the shingled tracks at the various locations. A read offset point where read performance is about the highest during the reading performed when repositioning the array of readers between the first and second positions is determined. The method includes computing, using the read offset point, data describing a lateral writing position to use during writing such that shingled tracks are written in a location specified by a format. As a result, methods according to the present embodiment are able to provide desirable track alignment and reduced readback error rates for data of shingled tracks written to magnetic medium.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for compensating for loss of current through shorted tunneling magnetoresistance (TMR) sensors. In one embodiment, for a magnetic head having multiple TMR read sensors, a first voltage limit is set for most parts and a second voltage limit is set for all of the parts. A number of TMR read sensors which are allowed to function between the first and the second voltage limits is determined using a probability algorithm, which determines the probability that the application of the second voltage limit will result in a dielectric breakdown within an expected lifetime of a drive is below a threshold value. For the number of TMR read sensors which are allowed to function at voltages between the first and second voltage limits, a determined subset of those sensors are then allowed to function at the second voltage limit.

Abstract: A computer-implemented method according to one embodiment includes collecting, by the computer, performance data corresponding to a tape drive and/or a magnetic tape head. The performance data is stored in memory, and used by the computer to perform problem analysis. A computer-implemented method according to another embodiment includes collecting, by the computer, performance data corresponding to a tape drive and/or a magnetic tape head. The collected performance data is condensed to reduce a size of the collected performance data. The condensed performance data is stored in memory, and used to perform problem analysis.

Abstract: A method, according to one embodiment, includes writing a plurality of shingled tracks using an array of writers. The array of readers is repositioned to various locations between first and second positions and data is read from the shingled tracks at the various locations. A read offset point where read performance is about the highest during the reading performed when repositioning the array of readers between the first and second positions is determined. The method includes computing, using the read offset point, data describing a lateral writing position to use during writing such that shingled tracks are written in a location specified by a format. As a result, methods according to the present embodiment are able to provide desirable track alignment and reduced readback error rates for data of shingled tracks written to magnetic medium.

Abstract: A computer-implemented method, according to one embodiment, includes: collecting performance data corresponding to a tape drive and/or a magnetic tape head, storing the performance data in memory, and using the data to perform problem analysis. The performance data includes a resistance of the tape drive and/or magnetic tape head and a resolution of the tape drive and/or the magnetic tape head. Moreover, performing the problem analysis includes: determining a condition of the tape drive and/or the magnetic tape head, wherein the condition is selected from a group consisting of: wear, corrosion, defective leads and wire bonds. Other systems, methods, and computer program products are described in additional embodiments.

Abstract: A computer-implemented method according to one embodiment includes collecting, by the computer, performance data corresponding to a tape drive and/or a magnetic tape head. The performance data is stored in memory, and used by the computer to perform problem analysis. A computer-implemented method according to another embodiment includes collecting, by the computer, performance data corresponding to a tape drive and/or a magnetic tape head. The collected performance data is condensed to reduce a size of the collected performance data. The condensed performance data is stored in memory, and used to perform problem analysis.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for compensating for loss of current through shorted tunneling magnetoresistance (TMR) sensors. In one embodiment, for a magnetic head having multiple TMR read sensors, a first voltage limit is set for most parts and a second voltage limit is set for all of the parts. A number of TMR read sensors which are allowed to function between the first and the second voltage limits is determined using a probability algorithm, which determines the probability that the application of the second voltage limit will result in a dielectric breakdown within an expected lifetime of a drive is below a threshold value. For the number of TMR read sensors which are allowed to function at voltages between the first and second voltage limits, a determined subset of those sensors are then allowed to function at the second voltage limit.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for compensating for loss of current through shorted tunneling magnetoresistance (TMR) sensors. In one embodiment, for a magnetic head having multiple TMR read sensors, a first voltage limit is set for most parts and a second voltage limit is set for all of the parts. A number of TMR read sensors which are allowed to function between the first and the second voltage limits is determined using a probability algorithm, which determines the probability that the application of the second voltage limit will result in a dielectric breakdown within an expected lifetime of a drive is below a threshold value. For the number of TMR read sensors which are allowed to function at voltages between the first and second voltage limits, a determined subset of those sensors are then allowed to function at the second voltage limit.

Abstract: A method, according to one embodiment, includes writing a plurality of shingled tracks using an array of writers, determining first and second positions of an array of readers relative to the shingled tracks, the first and second positions being above and/or beyond track edges of the shingled tracks, repositioning the array of readers to various locations between the first and second positions and reading data from the shingled tracks, determining a read offset point where read performance is about the highest during the reading performed when repositioning the array of readers between the first and second positions, and computing, using the read offset point, data describing a lateral writing position to use during writing such that shingled tracks are written in a location specified by a format. Other systems, methods, and computer program products are described in additional embodiments.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for compensating for loss of current through shorted tunneling magnetoresistance (TMR) sensors. In one embodiment, for a magnetic head having multiple TMR read sensors, a first voltage limit is set for most parts and a second voltage limit is set for all of the parts. A number of TMR read sensors which are allowed to function between the first and the second voltage limits is determined using a probability algorithm, which determines the probability that the application of the second voltage limit will result in a dielectric breakdown within an expected lifetime of a drive is below a threshold value. For the number of TMR read sensors which are allowed to function at voltages between the first and second voltage limits, a determined subset of those sensors are then allowed to function at the second voltage limit.

Abstract: A method, according to one embodiment, includes writing a plurality of shingled tracks using an array of writers, determining first and second positions of an array of readers relative to the shingled tracks, the first and second positions being above and/or beyond track edges of the shingled tracks, repositioning the array of readers to various locations between the first and second positions and reading data from the shingled tracks, determining a read offset point where read performance is about the highest during the reading performed when repositioning the array of readers between the first and second positions, and computing, using the read offset point, data describing a lateral writing position to use during writing such that shingled tracks are written in a location specified by a format. Other systems, methods, and computer program products are described in additional embodiments.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for compensating for loss of current through shorted tunneling magnetoresistance (TMR) sensors. In one embodiment, for a magnetic head having multiple TMR read sensors, a first voltage limit is set for most parts and a second voltage limit is set for all of the parts. A number of TMR read sensors which are allowed to function between the first and the second voltage limits is determined using a probability algorithm, which determines the probability that the application of the second voltage limit will result in a dielectric breakdown within an expected lifetime of a drive is below a threshold value. For the number of TMR read sensors which are allowed to function at voltages between the first and second voltage limits, a determined subset of those sensors are then allowed to function at the second voltage limit.

Abstract: Magnetoresistive (MR) bias is dynamically controlled in a tape drive using a processor device. Median tape head amplitude is monitored during a calibration operation, as measured across all tracks of the tape head, against predetermined thresholds of the tape drive for determining if the median tape head amplitude is below the threshold value. Upon determining the median tape head amplitude is below the threshold value during the calibration operation, a reference MR bias and a MR bias range is dynamically adjusted, during the calibration operation, for increasing the median tape head amplitude.

Abstract: Magnetoresistive (MR) bias is dynamically controlled in a tape drive using a processor device. Median tape head amplitude is monitored during a calibration operation, as measured across all tracks of the tape head, against predetermined thresholds of the tape drive for determining if the median tape head amplitude is below the threshold value. Upon determining the median tape head amplitude is below the threshold value during the calibration operation, a reference MR bias and a MR bias range is dynamically adjusted, during the calibration operation, for increasing the median tape head amplitude.

Abstract: In one embodiment, an extended data storage system employs a first data storage and an extended data storage. A first level of metadata is established with respect to data from the using entity, the first level of metadata is provided in the first data storage. The data from the using entity is stored in the extended data storage. A second level of metadata at least describing the data as stored in the extended data storage is also established, wherein the second level of metadata associated with the first level of metadata for the stored data. The first level of metadata is made accessible to the using entity at the first data storage; and the second level of metadata is made unavailable to the using entity. Thus, the data is stored in the extended data storage and a small amount of metadata is stored in the first data storage.

Abstract: In one embodiment, an extended data storage system employs a first data storage and an extended data storage. A first level of metadata is established with respect to data from the using entity, the first level of metadata is provided in the first data storage. The data from the using entity is stored in the extended data storage. A second level of metadata at least describing the data as stored in the extended data storage is also established, wherein the second level of metadata associated with the first level of metadata for the stored data. The first level of metadata is made accessible to the using entity at the first data storage; and the second level of metadata is made unavailable to the using entity. Thus, the data is stored in the extended data storage and a small amount of metadata is stored in the first data storage.