Abstract: Technologies are described herein for photobleaching a display. A display may be photobleached by exposing the display to light emitted by an external lamp and/or may be photobleached using one or more display lights of the electronic device during a burn-in period. In some examples, the light emitted by the lamp is filtered to remove wavelengths below a certain wavelength. The light that is received by the display from the lamp may include wavelengths between about 310 nm and 700 nm. These wavelengths correspond to visible light and near-visible light. The display may be exposed to the light for some duration or until some dose of light is received by the display. In other configurations, a burn-in period is performed for about eighteen hours.

Abstract: This disclosure is directed to a test fixture to test a robustness of a connection port of an electronic device, a cable connector coupled to the connection port, or both. The test fixture may enable repeatable testing using predetermined test parameters. The test fixture may secure the electronic device using a clamp. A pendulum may be mounted in the test fixture and rotatable to cause an impact of a weight against a cable connector coupled to the connection port of an electronic device. After the impact, the integrity and/or functionality of the cable connector, the connection port, or both may be inspected. In accordance with one or more embodiments, the test fixture may be under at least partial control of a controller. The controller may enable creation or control of test parameters, repeat testing, cycle testing, and/or inspection (e.g., determining whether the connection is maintained and/or functional, etc.).