Abstract: Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link with a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.

Abstract: A shoe including a releasable attachment system on the exposed surfaces of the shoe upper. A ornamental cover is shaped to fit the shoe upper and has a mating attachment system on its lower surface. A kit may contain a number of covers of various colors and/or carrying various ornamental designs or patterns or elements such as colored beads. By changing the covers, the appearance of the shoe can be completely changed. Shoes may be of the flip-flop or sandal type in which the uppers are formed primarily of strap or ribbon shaped members.