Patents by Inventor Sandeep Dewangan

Sandeep Dewangan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110004452
    Abstract: A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.
    Type: Application
    Filed: December 31, 2007
    Publication date: January 6, 2011
    Inventors: Sanghamithra Korukonda, Sandeep Dewangan, Preeti Pisupati, William Stewart McKnight, Gigi Gambrell, Ui Suh, Changting Wang
  • Publication number: 20100312494
    Abstract: A method for testing a component using an eddy current array probe is provided. The method includes calibrating the eddy current array probe, collecting data from the eddy current array probe for analysis, and processing the collected data to at least one of compensate for response variations due to a detected orientation of a detected imperfection and to facilitate minimizing noise.
    Type: Application
    Filed: December 28, 2007
    Publication date: December 9, 2010
    Inventors: Sanghamithra Korukonda, Sandeep Dewangan, William Stewart McKnight, Gigi Gambrell, Changting Wang, Ui Suh
  • Publication number: 20060219011
    Abstract: A method and apparatus for estimating a depth of a crack from ultrasound scan data are provided. The method includes mapping multiple amplitude responses from the ultrasound scan data, each mapped amplitude response being representative of a signal from one of the sensors. The method further includes locating multiple linear responses among the mapped amplitude responses, each linear response being an indicator of a reflected signal from the crack. One or more sensor that corresponds to the linear responses from a given crack is identified. The depth of the crack is estimated using data from the identified sensors.
    Type: Application
    Filed: March 31, 2005
    Publication date: October 5, 2006
    Inventors: Dinesh Siddu, Sandeep Dewangan, Gopichand Katragadda, Sivaramanivas Ramaswamy
  • Publication number: 20060137451
    Abstract: A method and system for detecting weld signatures from an ultrasound scan data obtained from scanning a pipeline is provided. The method includes a step for mapping multiple amplitude responses from the ultrasound scan data, each amplitude response being representative of a respective sensor signal. Continuous amplitude responses are located from the amplitude responses and corresponding signatures are identified for the continuous amplitude responses. The method also includes a step for tagging the corresponding signatures as weld signatures.
    Type: Application
    Filed: December 27, 2004
    Publication date: June 29, 2006
    Inventors: Sandeep Dewangan, Anandraj Sengupta, Amitabha Dutta
  • Publication number: 20060065055
    Abstract: In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity of an object. The exemplary testing apparatus includes a phased array transducer, which is disposed external to the object. The phased array transducer is configured to transmit a first set of ultrasonic signals and to receive a second set of ultrasonic signals. The testing apparatus further includes logic circuitry coupled to the phased array transducer. The logic circuitry is configured to dynamically control apertures for transmitting the first set of ultrasonic signals and receiving the second set of ultrasonic signals based on a region of interest and a testing speed.
    Type: Application
    Filed: September 30, 2004
    Publication date: March 30, 2006
    Inventors: James Barshinger, Sandeep Dewangan, Sivaramanivas Ramaswamy, Jian Li