Patents by Inventor Sandeep Kumar Dewangan

Sandeep Kumar Dewangan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140288908
    Abstract: The present invention provides a method and system for determining a time-to-failure of an asset. A probabilistic non-linear model of a limit state of the asset is simulated and approximated by a predetermined set of particles. A numerical scheme for computation of a conditional probability distribution of a size of the defect, based on a value of the limit state is evaluated. A set of future values of a weight factor of each particle is predicted based on an initial assigned value. The predicted set of future values can be updated on capturing a new set of inspection data. A probability of the time-failure of the asset is estimated by summing the weight factor of a set of particles, the set of particles comprising particles at which the limit state is less than a zero limit threshold.
    Type: Application
    Filed: March 14, 2014
    Publication date: September 25, 2014
    Applicant: Infosys Limited
    Inventors: HARI MANASSERY KODUVELY, GOPICHAND AGNIHOTRAM, SANDEEP KUMAR DEWANGAN, PREETI PISUPATI
  • Publication number: 20140122023
    Abstract: The present invention provides a method and system for managing integrity of a field asset. A request for managing the integrity of the field asset is received by a handheld device. A set of integrity data essential for resolution of the request is captured by the handheld device. One or more workflows, cross referenced from one or more existing engineering processes, are executed and a set of fitness for service evaluations are performed on the captured set of integrity data, during the execution of the one or more workflows. A report of the received request is created, when the one or more workflows are executed completely.
    Type: Application
    Filed: October 28, 2013
    Publication date: May 1, 2014
    Applicant: Infosys Limited
    Inventors: Sandeep Kumar Dewangan, Preeti Pisupati
  • Patent number: 8670893
    Abstract: A framework for supporting one or more repair processes of one or more aircraft. The repair processes are based on repair information or repair solution corresponding to the damages to one or more structural components of the aircraft. The framework includes a knowledge engine, and a deployment engine. The knowledge engine automatically generates one or more knowledge interpretation systems based on the user inputs. The knowledge interpretation systems provide the repair information corresponding to the various structural components of the aircraft based on the user inputs. The deployment engine fulfills the deployment requirements corresponding to the one or more knowledge interpretation systems.
    Type: Grant
    Filed: February 9, 2012
    Date of Patent: March 11, 2014
    Assignee: Infosys Limited
    Inventors: Veera Venkata Ravi Kumar Geddam, Sambasiva Rao Maddali, Devaraja Holla Vaderahobli, Narendhar Rao Soma, Rajesh Balakrishnan, Venugopal Subbarao, Sandeep Kumar Dewangan
  • Patent number: 8510147
    Abstract: A method and system for calculating pipeline integrity business risk score for a pipeline network is provided. The method includes a step of first calculating a structural risk score, an operational risk score and a commercial risk score for each pipeline segment in a pipeline network. The method further includes calculating pipeline integrity business risk score for each pipeline segment. The structural risk score, operational risk score, commercial risk score and pipeline integrity business risk score for each pipeline segment is rolled-up to calculate the respective risk scores of a pipeline network. The rolled-up risk scores are calculated by computing weight factors for each pipeline segment, relative risk scores weight of each pipeline segment and relative risk scores contribution of each pipeline segment. The system of the invention comprises executable files, dynamic linked libraries and risk score computing modules configured to display the risk scores using a dashboard.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: August 13, 2013
    Assignee: Infosys Limited
    Inventors: Dipayan Mitra, Sandeep Kumar Dewangan, Larry Joesph Rubenacker, Manish Verma, Prakash Dhake, Paras Sachdeva
  • Publication number: 20120143908
    Abstract: A framework for supporting one or more repair processes of one or more aircraft. The repair processes are based on repair information or repair solution corresponding to the damages to one or more structural components of the aircraft. The framework includes a knowledge engine, and a deployment engine. The knowledge engine automatically generates one or more knowledge interpretation systems based on the user inputs. The knowledge interpretation systems provide the repair information corresponding to the various structural components of the aircraft based on the user inputs. The deployment engine fulfils the deployment requirements corresponding to the one or more knowledge interpretation systems.
    Type: Application
    Filed: February 9, 2012
    Publication date: June 7, 2012
    Applicant: INFOSYS TECHNOLOGIES LIMITED
    Inventors: Veera Venkata Ravi Kumar Geddam, Sambasiva Rao Maddali, Devaraja Holla Vaderahobli, Narendhar Rao Soma, Rajesh Balakrishnan, Venugopal Subbarao, Sandeep Kumar Dewangan
  • Publication number: 20110137704
    Abstract: A method and system for calculating pipeline integrity business risk score for a pipeline network is provided. The method includes a step of first calculating a structural risk score, an operational risk score and a commercial risk score for each pipeline segment in a pipeline network. The method further includes calculating pipeline integrity business risk score for each pipeline segment. The structural risk score, operational risk score, commercial risk score and pipeline integrity business risk score for each pipeline segment is rolled-up to calculate the respective risk scores of a pipeline network. The rolled-up risk scores are calculated by computing weight factors for each pipeline segment, relative risk scores weight of each pipeline segment and relative risk scores contribution of each pipeline segment. The system of the invention comprises executable files, dynamic linked libraries and risk score computing modules configured to display the risk scores using a dashboard.
    Type: Application
    Filed: February 3, 2010
    Publication date: June 9, 2011
    Applicant: INFOSYS TECHNOLOGIES LIMITED
    Inventors: Dipayan MITRA, Sandeep Kumar DEWANGAN, Larry Joesph RUBENACKER, Manish VERMA, Prakash Dhake, Paras SACHDEVA
  • Publication number: 20100318396
    Abstract: A framework for supporting one or more repair processes of one or more aircraft. The repair processes are based on repair information or repair solution corresponding to the damages to one or more structural components of the aircraft. The framework includes a knowledge engine, and a deployment engine. The knowledge engine automatically generates one or more knowledge interpretation systems based on the user inputs. The knowledge interpretation systems provide the repair information corresponding to the various structural components of the aircraft based on the user inputs. The deployment engine fulfils the deployment requirements corresponding to the one or more knowledge interpretation systems.
    Type: Application
    Filed: July 29, 2009
    Publication date: December 16, 2010
    Applicant: INFOSYS TECHNOLOGIES LIMITED
    Inventors: Veera Venkata Ravi Kumar Geddam, Sambasiva Rao Maddali, Devaraja Holla Vaderahobli, Narendhar Rao Soma, Rajesh Balakrishnan, Venugopal Subbarao, Sandeep Kumar Dewangan
  • Patent number: 7817845
    Abstract: A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: October 19, 2010
    Assignee: General Electric Company
    Inventors: Ui Won Suh, Gigi Olive Gambrell, William Stewart McKnight, Preeti Pisupati, Peyush Kumar Mishra, Sandeep Kumar Dewangan, Changting Wang
  • Publication number: 20080159619
    Abstract: A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.
    Type: Application
    Filed: December 29, 2006
    Publication date: July 3, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Ui Won SUH, Gigi Olive GAMBRELL, William Stewart MCKNIGHT, Preeti PISUPATI, Peyush Kumar MISHRA, Sandeep Kumar DEWANGAN, Changting WANG
  • Patent number: 7305885
    Abstract: In accordance with one embodiment, the present technique provides a testing apparatus for testing material integrity of an object. The exemplary testing apparatus includes a phased array transducer, which is disposed external to the object. The phased array transducer is configured to transmit a first set of ultrasonic signals and to receive a second set of ultrasonic signals. The testing apparatus further includes logic circuitry coupled to the phased array transducer. The logic circuitry is configured to dynamically control apertures for transmitting the first set of ultrasonic signals and receiving the second set of ultrasonic signals based on a region of interest and a testing speed.
    Type: Grant
    Filed: September 30, 2004
    Date of Patent: December 11, 2007
    Assignee: General Electric Company
    Inventors: James Norman Barshinger, Sandeep Kumar Dewangan, Sivaramanivas Ramaswamy, Jian Li
  • Patent number: 7299697
    Abstract: A method and apparatus for estimating a depth of a crack from ultrasound scan data are provided. The method includes mapping multiple amplitude responses from the ultrasound scan data, each mapped amplitude response being representative of a signal from one of the sensors. The method further includes locating multiple linear responses among the mapped amplitude responses, each linear response being an indicator of a reflected signal from the crack. One or more sensor that corresponds to the linear responses from a given crack is identified. The depth of the crack is estimated using data from the identified sensors.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: November 27, 2007
    Assignee: General Electric Company
    Inventors: Dinesh Mysore Siddu, Sandeep Kumar Dewangan, Gopichand Katragadda, Sivaramanivas Ramaswamy
  • Patent number: 7234355
    Abstract: A method and system for detecting weld signatures from an ultrasound scan data obtained from scanning a pipeline is provided. The method includes a step for mapping multiple amplitude responses from the ultrasound scan data, each amplitude response being representative of a respective sensor signal. Continuous amplitude responses are located from the amplitude responses and corresponding signatures are identified for the continuous amplitude responses. The method also includes a step for tagging the corresponding signatures as weld signatures.
    Type: Grant
    Filed: December 27, 2004
    Date of Patent: June 26, 2007
    Assignee: General Electric Company
    Inventors: Sandeep Kumar Dewangan, Anandraj Sengupta, Amitabha Dutta
  • Patent number: 6911826
    Abstract: A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
    Type: Grant
    Filed: December 3, 2003
    Date of Patent: June 28, 2005
    Assignee: General Electric Company
    Inventors: Yuri Alexeyevich Plotnikov, Thomas James Batzinger, Shridhar Champaknath Nath, Sandeep Kumar Dewangan, Carl Stephen Lester, Kenneth Gordon Herd, Curtis Wayne Rose
  • Publication number: 20040245997
    Abstract: A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
    Type: Application
    Filed: December 3, 2003
    Publication date: December 9, 2004
    Inventors: Yuri Alexeyevich Plotnikov, Thomas James Batzinger, Shridhar Champaknath Nath, Sandeep Kumar Dewangan, Carl Stephen Lester, Kenneth Gordon Herd, Curtis Wayne Rose