Abstract: The present invention relates to a non-thermal plasma jet device as spatial ionization source for ambient mass spectrometry of the type which allows a free adjustment of the geometry of the plasma beam, wherein the device comprises a double dielectric barrier probe of non-thermal plasma or NTP probe, which generates a non-thermal plasma jet; a high voltage and high frequency transformer circuit that connects an outer electrode through which it is possible to perform a discharge for the ionization of a gas which produces plasma, and wherein said plasma generator circuit is in turn connected to a source of AC power; an inner electrode which is grounded and allows to perform the discharge for the production of plasma; a storage tank of a gas serving as discharge gas; a test sample on which the non-thermal plasma jet is applied; and a ion transfer adapter to direct the ions produced by the device from the vacuum-free sample into a mass analyzer.

Abstract: The present invention relates to a non-thermal plasma jet device as spatial ionization source for ambient mass spectrometry of the type which allows a free adjustment of the geometry of the plasma beam, wherein the device comprises a double dielectric barrier probe of non-thermal plasma or NTP probe, which generates a non-thermal plasma jet; a high voltage and high frequency transformer circuit that connects an outer electrode through which it is possible to perform a discharge for the ionization of a gas which produces plasma, and wherein said plasma generator circuit is in turn connected to a source of AC power; an inner electrode which is grounded and allows to perform the discharge for the production of plasma; a storage tank of a gas serving as discharge gas; a test sample on which the non-thermal plasma jet is applied; and a ion transfer adapter to direct the ions produced by the device from the vacuum-free sample into a mass analyzer.