Patents by Inventor SANGSOON IM

SANGSOON IM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test circuit using clock gating scheme to hold capture procedure and bypass mode, and integrated circuit including the same
    Patent number: 11959965
    Abstract: Disclosed is a test circuit for testing an integrated circuit core or an external circuit of the integrated circuit core. The test circuit may not only transmit a cell function input to a cell function output using only one multiplexer in a bypass mode, may but also use a clock gating scheme capable of blocking a clock signal from transmitting to a scan flip-flop to hold a capture procedure.
    Type: Grant
    Filed: June 28, 2022
    Date of Patent: April 16, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Giha Nam, Sangsoon Im
  • TEST CIRCUIT USING CLOCK GATING SCHEME TO HOLD CAPTURE PROCEDURE AND BYPASS MODE, AND INTEGRATED CIRCUIT INCLUDING THE SAME
    Publication number: 20230152372
    Abstract: Disclosed is a test circuit for testing an integrated circuit core or an external circuit of the integrated circuit core. The test circuit may not only transmit a cell function input to a cell function output using only one multiplexer in a bypass mode, may but also use a clock gating scheme capable of blocking a clock signal from transmitting to a scan flip-flop to hold a capture procedure.
    Type: Application
    Filed: June 28, 2022
    Publication date: May 18, 2023
    Inventors: GIHA NAM, SANGSOON IM