Patents by Inventor Sankara J. Subramanian

Sankara J. Subramanian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11810282
    Abstract: A system and method for quantitative image quality assessment for photogrammetry are disclosed.
    Type: Grant
    Filed: March 17, 2021
    Date of Patent: November 7, 2023
    Assignee: Photogauge, Inc.
    Inventors: Sameer Sharma, Arunnelson Xavier, Sankara J. Subramanian
  • Patent number: 11663732
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Grant
    Filed: July 5, 2022
    Date of Patent: May 30, 2023
    Assignee: PHOTOGAUGE, INC.
    Inventors: Sankara J. Subramanian, Azhar H. Khan, Sameer Sharma, Arunachalam Muthukaruppan
  • Publication number: 20220405913
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Application
    Filed: July 5, 2022
    Publication date: December 22, 2022
    Inventors: Sankara J. SUBRAMANIAN, Azhar H. KHAN, Sameer SHARMA, Arunachalam MUTHUKARUPPAN
  • Patent number: 11410293
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Grant
    Filed: December 20, 2020
    Date of Patent: August 9, 2022
    Assignee: PHOTOGAUGE, INC.
    Inventors: Sankara J. Subramanian, Azhar H. Khan, Sameer Sharma, Arunachalam Muthukaruppan
  • Patent number: 11269115
    Abstract: A speckled calibration artifact to calibrate metrology equipment is disclosed. A particular embodiment includes a geometric solid having a smooth outer surface of a solid base color; and a speckled contrasting color applied on the outer surface of the geometric solid in a randomly speckled pattern enabling portions of the solid base color and portions of the contrasting color to be visible on the smooth outer surface of the geometric solid.
    Type: Grant
    Filed: September 4, 2019
    Date of Patent: March 8, 2022
    Assignee: PHOTOGAUGE, INC.
    Inventors: Sankara J. Subramanian, Sameer Sharma, Iniyan Thiruselvam, Arunnelson Xavier
  • Publication number: 20210304395
    Abstract: A system and method for digital-representation-based flight path planning for object imaging is disclosed. An example embodiment is configured to: obtain a digital representation of an object; retrieve a dataset of image acquisition configuration parameters; extract a surface contour of the object from the digital representation of the object; generate a bounding polygon adjacent to the surface contour of the object, the bounding polygon being set-off from the surface contour of the object based on a configuration defined in the image acquisition configuration parameters; generate a configurable quantity of waypoints at configurable intervals along the bounding polygon; and generate an Image Acquisition Plan (IAP) from the waypoints, the IAP including, for each waypoint, a waypoint position, control instructions, and imaging instructions.
    Type: Application
    Filed: June 10, 2021
    Publication date: September 30, 2021
    Inventors: Sankara J. SUBRAMANIAN, Sameer SHARMA, Azhar H. KHAN
  • Publication number: 20210201473
    Abstract: A system and method for measurement of inflation pressure and load of tires from three-dimensional (3D) geometry measurements are disclosed.
    Type: Application
    Filed: March 17, 2021
    Publication date: July 1, 2021
    Inventors: Arunnelson XAVIER, Sameer SHARMA, Devendiran RENUGOPAL, Sankara J. SUBRAMANIAN
  • Publication number: 20210201469
    Abstract: A system and method for quantitative image quality assessment for photogrammetry are disclosed.
    Type: Application
    Filed: March 17, 2021
    Publication date: July 1, 2021
    Inventors: Sameer SHARMA, Arunnelson XAVIER, Sankara J. SUBRAMANIAN
  • Publication number: 20210201474
    Abstract: A system and method for performing visual inspection using synthetically generated images is disclosed. An example embodiment is configured to: receive one or more images of a compliant manufactured component; receive images of component defects; use the images of component defects to produce a variety of different synthetically-generated images of defects; combine the synthetically-generated images of defects with the one or more images of the compliant manufactured component to produce synthetically-generated images of a non-compliant manufactured component; and collect the one or more images of the compliant manufactured component with the synthetically-generated images of the non-compliant manufactured component into a training dataset to train a machine learning system.
    Type: Application
    Filed: March 17, 2021
    Publication date: July 1, 2021
    Inventors: Sameer SHARMA, Vishwanath VENKATARAMAN, Rohit MALIK, Yousaf BILAL, Sankara J. SUBRAMANIAN
  • Publication number: 20210110529
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Application
    Filed: December 20, 2020
    Publication date: April 15, 2021
    Inventors: Sankara J. SUBRAMANIAN, Azhar H. KHAN, Sameer SHARMA, Arunachalam MUTHUKARUPPAN
  • Publication number: 20210063604
    Abstract: A speckled calibration artifact to calibrate metrology equipment is disclosed. A particular embodiment includes a geometric solid having a smooth outer surface of a solid base color; and a speckled contrasting color applied on the outer surface of the geometric solid in a randomly speckled pattern enabling portions of the solid base color and portions of the contrasting color to be visible on the smooth outer surface of the geometric solid.
    Type: Application
    Filed: September 4, 2019
    Publication date: March 4, 2021
    Inventors: Sankara J. SUBRAMANIAN, Sameer SHARMA, Iniyan THIRUSELVAM, Arunnelson XAVIER
  • Patent number: 10885622
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Grant
    Filed: June 29, 2018
    Date of Patent: January 5, 2021
    Assignee: Photogauge, Inc.
    Inventors: Sankara J. Subramanian, Azhar H. Khan, Sameer Sharma, Arunachalam Muthukaruppan
  • Publication number: 20200005448
    Abstract: A system and method for using images from a commodity camera for object scanning, reverse engineering, metrology, assembly, and analysis are disclosed. A particular embodiment includes a mobile imaging system to: enable a user to align an object to be analyzed on a turntable with a stencil; issue commands, by use of a data processor, to the turntable for automatic rotation of the turntable and the object thereon to a particular orientation for a camera of a mobile imaging device; capture a plurality of images of the object being analyzed at different automatic rotations of the turntable; upload the plurality of images of the object to a server via a network interface and a data network; and cause the server to generate a three dimensional (3D) model of the object from the plurality of images of the object.
    Type: Application
    Filed: June 29, 2018
    Publication date: January 2, 2020
    Inventors: Sankara J. SUBRAMANIAN, Azhar H. KHAN, Sameer SHARMA, Arunachalam MUTHUKARUPPAN
  • Publication number: 20200005422
    Abstract: A system and method for using images for automatic visual inspection with machine learning are disclosed. A particular embodiment includes an inspection system to: train a machine learning system to detect defects in an object based on training with a set of training images including images of defective and non-defective objects; enable a user to use a camera to capture a plurality of images of an object being inspected at different poses of the object; and detect defects in the object being inspected based on the plurality of images of the object being inspected and the trained machine learning system.
    Type: Application
    Filed: September 14, 2018
    Publication date: January 2, 2020
    Inventors: Sankara J. SUBRAMANIAN, Azhar H. KHAN, Sameer SHARMA, Mazhar SHAIKH
  • Patent number: 9516752
    Abstract: An underfill device and method have been are provided. Advantages of devices and methods shown include dissipation of stresses at an interface between components such as a chip package and an adjacent circuit board. Another advantage includes faster manufacturing time and ease of manufacture using underfill devices and methods shown. An underfill assembly can be pre made with conductive structures included within the underfill assembly. Steps such as flowing epoxy and curing can be eliminated or performed concurrently with other manufacturing steps.
    Type: Grant
    Filed: March 18, 2013
    Date of Patent: December 6, 2016
    Assignee: Intel Corporation
    Inventors: Patricia A Brusso, Mitul B Modi, Carolyn R. McCormick, Ruben Cadena, Sankara J Subramanian, Edward L. Martin
  • Publication number: 20130208411
    Abstract: An underfill device and method have been are provided. Advantages of devices and methods shown include dissipation of stresses at an interface between components such as a chip package and an adjacent circuit board. Another advantage includes faster manufacturing time and ease of manufacture using underfill devices and methods shown. An underfill assembly can be pre made with conductive structures included within the underfill assembly. Steps such as flowing epoxy and curing can be eliminated or performed concurrently with other manufacturing steps.
    Type: Application
    Filed: March 18, 2013
    Publication date: August 15, 2013
    Inventors: Patricia A. Brusso, Mitul B. Modi, Carolyn R. McCormick, Ruben Cadena, Sankara J. Subramanian, Edward L. Martin
  • Patent number: 8399291
    Abstract: An underfill device and method have been are provided. Advantages of devices and methods shown include dissipation of stresses at an interface between components such as a chip package and an adjacent circuit board. Another advantage includes faster manufacturing time and ease of manufacture using underfill devices and methods shown. An underfill assembly can be pre made with conductive structures included within the underfill assembly. Steps such as flowing epoxy and curing can be eliminated or performed concurrently with other manufacturing steps.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: March 19, 2013
    Assignee: Intel Corporation
    Inventors: Patricia A Brusso, Mitul B Modi, Carolyn R. McCormick, Ruben Cadena, Sankara J Subramanian, Edward L. Martin
  • Patent number: 7719109
    Abstract: A linear coefficient of thermal expansion (CTE) mismatch between two materials, such as between a microelectronic die and a mounting substrate, may induce stress at the interface of the materials. The temperature changes present during the process of attaching a die to a mounting substrate can cause cracking and failure in the electrical connections used to connect the die and mounting substrate. A material with a CTE approximately matching the die CTE is introduced in the mounting substrate to reduce the stress and cracking at the electrical connections between the die and mounting substrate. Additionally, this material may comprise thin film capacitors useful for decoupling power supplies.
    Type: Grant
    Filed: September 29, 2006
    Date of Patent: May 18, 2010
    Assignee: Intel Corporation
    Inventors: Mitul Modi, Sudarshan V. Rangaraj, Shankar Ganapathysubramanian, Richard J. Harries, Sankara J. Subramanian
  • Patent number: 7692307
    Abstract: A compliant structure for an electronic device comprises a substrate (110) composed of a first material (111) and a compliant zone (120) within the substrate. A plurality of solder joints (280) are located between, and form a connection between, the substrate and the electronic device (290). The compliant zone reduces the degree of deformation experienced by the solder joints due to thermal mismatch loading between the substrate and the die during attachment of the die to the substrate (chip attach). This reduction in solder joint deformation reduces the likelihood that the solder joints will crack.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: April 6, 2010
    Assignee: Intel Corporation
    Inventors: Sudarshan Rangaraj, Shankar Ganapathysubramanian, Richard Harries, Mitul Modi, Sankara J. Subramanian
  • Patent number: 7633142
    Abstract: An IC package is disclosed that comprises a core region disposed between upper and lower build-up layer regions. In one embodiment, the core region comprises a low modulus material. In an alternative embodiment the core region comprises a medium modulus material. In an alternative embodiment, the core material is selected based upon considerations such as it modulus, its coefficient of thermal expansion, and/or the resulting total accumulated strain. In an alternative embodiment, boundaries with respect to the softness of the core material are established be considering the reflective density in opposing conductive build-up layers above and below the core region.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: December 15, 2009
    Assignee: Intel Corporation
    Inventors: Mitul B. Modi, Patricia A. Brusso, Ruben Cadena, Carolyn R. McCormick, Sankara J. Subramanian