Abstract: An automated approach is provided for evaluating stress upon analog components embedded in a digital electronic circuit design. The approach includes establishing a computer readable circuit definition of the digital electronic circuit design. The circuit definition is then partitioned into a plurality of circuit portions, which are re-defined to form a plurality of analog topologies. The analog topologies are adapted for automatic analog simulation one independent of the other, with all digital components substituted by at least one subcircuit including instantiation of a corresponding input output (IO) buffer model. Automatic analog simulation is carried out upon the analog topologies to generate simulated results data, which are automatically postprocessed to generate worst-case stress measurement data for one or more critical components identified in the analog topologies.