Patents by Inventor Satheesh Jeyaraman

Satheesh Jeyaraman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10845339
    Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: November 24, 2020
    Assignee: General Electric Company
    Inventors: Baskaran Ganesan, Satheesh Jeyaraman, Albrecht Maurer
  • Publication number: 20200041455
    Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
    Type: Application
    Filed: August 22, 2019
    Publication date: February 6, 2020
    Applicant: General Electric Company
    Inventors: Baskaran Ganesan, Satheesh Jeyaraman, Albrecht Maurer
  • Patent number: 10393705
    Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
    Type: Grant
    Filed: July 18, 2013
    Date of Patent: August 27, 2019
    Assignee: General Electric Company
    Inventors: Baskaran Ganesan, Satheesh Jeyaraman, Albrecht Maurer
  • Patent number: 10152784
    Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: December 11, 2018
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman, Esha SenGupta
  • Publication number: 20180005368
    Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
    Type: Application
    Filed: June 30, 2016
    Publication date: January 4, 2018
    Inventors: Venkata Vijayaraghava Nalladega, Thomas James Batzinger, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, Bryon Edward Knight, Satheesh Jeyaraman, Esha SenGupta
  • Publication number: 20150212048
    Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
    Type: Application
    Filed: July 18, 2013
    Publication date: July 30, 2015
    Inventors: Baskaran Ganesan, Satheesh Jeyaraman, Albrecht Maurer
  • Publication number: 20120163930
    Abstract: A cutting tool abnormality sensing apparatus is disclosed. The apparatus includes an image pickup device for taking individual images of teeth of the cutting tool. The apparatus further includes a triggering mechanism for triggering the image pickup device each time a tooth passes along a field of view of the image pickup device. One or more light sources are provided to illuminate the cutting tool. Further, the apparatus includes an image processor to process one or more criteria in the individual images for quantifying an extent of abnormality in the cutting tool.
    Type: Application
    Filed: December 23, 2010
    Publication date: June 28, 2012
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Satheesh Jeyaraman, Kevin George Harding, Megha Navalgund, John Robert Pfeiffer, Shaileshh Bojja Venkatakrishnan
  • Publication number: 20110317909
    Abstract: A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 29, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Satheesh Jeyaraman, Kevin George Harding, Anandraj Sengupta, Debasish Mishra, Suneel Tumkur Shankarappa, Howard Paul Weaver, Kevin William Meyer
  • Publication number: 20090249879
    Abstract: An inspection system includes an ultrasonic transducer configured to deliver ultrasonic wave energy to at least one sub volume of the part, and an ultrasonic receiver configured to receive ultrasonic wave energy from the part at a fundamental frequency and at least one harmonic frequency. Both the ultrasonic transducer and the ultrasonic receiver are located on the same side of the part in various configurations. In a method, ultrasonic wave energy is delivered to at least one subvolume of the part using an ultrasonic transducer and ultrasonic wave energy from the part at a fundamental frequency is received at least one harmonic frequency using an ultrasonic receiver positioned on the same side of the part to determine whether one or more material property anomalies are present in the part.
    Type: Application
    Filed: June 15, 2009
    Publication date: October 8, 2009
    Applicant: General Electric
    Inventors: Satheesh Jeyaraman, Sivaramanivas Ramaswamy, Vamshi Krishna Reddy Kommareddy, Baskan Ganesan