Patents by Inventor Satish Udpa

Satish Udpa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11137359
    Abstract: A defect sensing apparatus is configured to identify defects or targets in materials. A further aspect of the defect sensing apparatus includes a reference split-ring resonator coupled to the microstrip. The defect sensing apparatus includes a reference split-ring resonator located on a reference side of the microstrip and a first sensing split-ring resonator located on a sensing side of the microstrip.
    Type: Grant
    Filed: February 26, 2020
    Date of Patent: October 5, 2021
    Assignee: Board of Trustees of Michigan State University
    Inventors: Lalita Udpa, Satish Udpa, Saptarshi Mukherjee
  • Publication number: 20200278304
    Abstract: A defect sensing apparatus is configured to identify defects or targets in materials. A further aspect of the defect sensing apparatus includes a reference split-ring resonator coupled to the microstrip. The defect sensing apparatus includes a reference split-ring resonator located on a reference side of the microstrip and a first sensing split-ring resonator located on a sensing side of the microstrip.
    Type: Application
    Filed: February 26, 2020
    Publication date: September 3, 2020
    Applicant: Board of Trustees of Michigan State University
    Inventors: Lalita UDPA, Satish UDPA, Saptarshi MUKHERJEE
  • Publication number: 20100045276
    Abstract: An innovative method is provided for assessing structural integrity of a sample. The method comprises: capturing a signal indicative of magnetic flux density caused by an Eddy current flowing in the sample; extracting an envelope of the captured signal using a demodulation scheme; sampling the envelope at a frequency that is lower than the frequency of the excitation current signal which generated the Eddy current; and examining the sampled envelope to assess structural integrity of the sample.
    Type: Application
    Filed: January 24, 2008
    Publication date: February 25, 2010
    Applicant: Board of Trustees of Michigan State University
    Inventors: Satish Udpa, Lalita Udpa, Naveen V. Nair, Vikram Reddy Melapudi
  • Publication number: 20060239403
    Abstract: A tomographic imaging system comprising a source array emitting rays, a deformable mirror reflecting the rays emitted by the source array, and a detector array receiving the electromagnetic rays emitted by the source array and reflected by the deformable mirror. An object can be positioned between the deformable mirror and the detector array and the deformable mirror can be deformed to a plurality of configurations to form a tomographic image of the object. The system can also be used in radiation therapy.
    Type: Application
    Filed: April 20, 2006
    Publication date: October 26, 2006
    Inventors: Satish Udpa, Lalita Udpa
  • Publication number: 20060239404
    Abstract: A tomographic imaging system comprising a source array emitting rays, a deformable mirror reflecting the rays emitted by the source array, and a detector array receiving the electromagnetic rays emitted by the source array and reflected by the deformable mirror. An object can be positioned between the deformable mirror and the detector array and the deformable mirror can be deformed to a plurality of configurations to form a tomographic image of the object. The system can also be used in radiation therapy.
    Type: Application
    Filed: May 22, 2006
    Publication date: October 26, 2006
    Inventors: Satish Udpa, Lalita Udpa