Patents by Inventor Satish Venkatesh Herekar

Satish Venkatesh Herekar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for performing optical corrective procedures with real-time feedback
    Patent number: 6908196
    Abstract: A real-time refractory control system includes a laser refractive surgery instrument for modifying the refraction of the eye, an objective diagnostic apparatus for measuring the refraction and aberrations of the eye, and an aperture-sharing element to inject a refractive surgery beam and a monitoring diagnostic beam. An associated method of adjusting a refraction of an eye, includes: performing a procedure to modify the refraction of the eye; while the procedure is being performed, measuring the refraction and/or an aberration of the eye; and terminating the procedure when a change in the measured refraction and/or the measured aberration reaches a desired value.
    Type: Grant
    Filed: February 21, 2003
    Date of Patent: June 21, 2005
    Assignee: WaveFront Sciences, Inc.
    Inventors: Satish Venkatesh Herekar, Daniel R. Neal, Richard James Copland, David Neal
  • System and method for performing optical corrective procedures with real-time feedback
    Publication number: 20030174281
    Abstract: A real-time refractory control system includes a laser refractive surgery instrument for modifying the refraction of the eye, an objective diagnostic apparatus for measuring the refraction and aberrations of the eye, and an aperture-sharing element to inject a refractive surgery beam and a monitoring diagnostic beam. An associated method of adjusting a refraction of an eye, includes: performing a procedure to modify the refraction of the eye; while the procedure is being performed, measuring the refraction and/or an aberration of the eye; and terminating the procedure when a change in the measured refraction and/or the measured aberration reaches a desired value.
    Type: Application
    Filed: February 21, 2003
    Publication date: September 18, 2003
    Inventors: Satish Venkatesh Herekar, Daniel R. Neal, Richard James Copland, David Neal