Abstract: According to the invention, the precision of register in dual exposure can be measured by measuring the length of the periphery of a register mark exposed twice when a positive resist is used and by measuring the length of the outer part of the register mark exposed once when a negative resist is used.

Abstract: Provided are a flip flop and a shift resistor whose layout areas are small. A data input terminal is connected with a first terminal of a first switching element, and a second terminal of the first switching element is connected with an input terminal of a first inverter element. Further, an output of the first inverter element is inputted to a first terminal of a second switching element, a second terminal of the second switching element is connected with an input terminal of a second inverter element, and an output terminal of the second inverter element is a data output terminal.

Abstract: A hydraulic change speed system for a working vehicle includes a gear type change speed device shiftable by an actuator, a hydraulic clutch connected to a power transmission line including the gear type change speed device, a valve unit for switching operative states of the hydraulic clutch, a controller for controlling the valve unit, and a timer for measuring a shifting time of the gear type change speed device. The valve unit is interlocked to the actuator to be controllable to pressurize the hydraulic clutch rapidly for a predetermined time from a start of engagement of the hydraulic clutch and to pressurize the hydraulic clutch gradually the predetermined time. The controller sets the predetermined time based on the shifting time measured.

Abstract: A work vehicle has an engine (1), a PTO shaft (6, 7) driven by power from the engine, an operator's seat (19), an operator's presence sensor (26) for detecting presence/absence of an operator at the operator's seat, and an automatic engine stop unit (39) operable to automatically stop the engine in response to detection of the operator's absence at the operator's seat. The work vehicle includes a utility member (A) for the vehicle selectively movable between a use position and a non-use position, a non-use state detecting sensor (27) for detecting movement of the utility member to the non-use position, and an override unit (40) operable to override the automatic engine stop function of the automatic engine stop unit, the override unit providing an override signal to the automatic engine stop unit in response to detection by the non-use state detecting sensor of the movement of the utility member to the non-use position.

Abstract: A low-priced contact type color image sensor formed without the need to provide color filters on a linear image sensor. The color filters are formed on a surface of a document side of a transparent protective glass in direct contact with a document for flattening the light irradiation surface, such that the pitch thereof is equal to that of light receiving elements of a linear image sensor.

Abstract: A linear image sensor using phototransistors as light receiving elements has improved after-image characteristics and reduced production costs by providing a light-receiving MOS diode proximate each photosensor, placing the MOS diode in an inversion state during the accumulation of photo-charge so that the accumulated photo-charge is accumulated at a base region of the phototransistors, placing the MOS diode in an accumulating state during a reset operation to return the phototransistors to an initial state after a readout operation has been performed, so that residual charge without reading out is transferred to the base region of the phototransistors and an after-image caused by residual charge is reduced through an emitter of the phototransistors.

Abstract: An image sensor is provided in which a read rate can be increased and missing of data of the output signal of a light receiving element can be eliminated. There are disposed switch elements that connect the output terminals of all of a plurality of light receiving elements that output an output signal in accordance with the amount of received light. The switch elements are arbitrarily conductive connective in accordance with 1/n of the highest resolution from the highest resolution, and the output of the average value is held in respective sample/hold circuits at the plural same potential, to thereby read only arbitrary data in accordance with the resolution at the time of reading. In the case where there are unnecessary data, the data is skipped so as to increase a read rate and eliminate missing of data of the output signals of the light receiving elements.

Abstract: A scanning circuit has path switches connected between a plurality of data flip-flop circuits of the scanning circuit for sequentially reading an output signal in synchronism with a clock. A plurality of control signal lines select the path switches to arbitrarily skip reading of the flip-flop circuits that do not require the scanning circuit and always fix a potential of the skipped data flip-flop circuit. Only the arbitrary data is read, and in the case where unnecessary data exists, reading is skipped, to thereby increase the read rate.

Abstract: A method for manufacturing a highly reliable alignment mark in which by-products do not form at an aligning mark position during patterning. In this method, an intermediate layer is disposed on an upper layer of a first wiring to protect the first wiring. Then, a filling material is coated thereon to fill in a through hole. Thereafter, a plug is formed by etch-backing, and a second wiring is formed.

Abstract: A resist mark for measuring the accuracy of overlay of a photomask disposed on a semiconductor wafer, includes a first measurement mark having a first opening, formed on the substrate, an intermediate layer formed on the first measurement mark and in the first opening, a frame-shaped second measurement mark formed on the intermediate layer, and a third measurement mark that is spaced from the second measurement mark toward the outside, formed on the intermediate layer. The second measurement mark has a width which is short enough not to be influenced by a deformation caused by the thermal flow phenomenon.

Abstract: A resist mark for measuring the accuracy of overlay of a photomask disposed on a semiconductor wafer, includes a first measurement mark having a first opening, formed on the substrate, an intermediate layer formed on the first measurement mark and in the first opening, a frame-shaped second measurement mark formed on the intermediate layer, and a third measurement mark that is spaced from the second measurement mark toward the outside, formed on the intermediate layer. The second measurement mark has a width which is short enough not to be influenced by a deformation caused by the thermal flow phenomenon.

Abstract: A resist mark for measuring the accuracy of overlay of a photomask disposed on a semiconductor wafer, includes a first measurement mark having a first opening, formed on the substrate, an intermediate layer formed on the first measurement mark and in the first opening, a frame-shaped second measurement mark formed on the intermediate layer, and a third measurement mark that is spaced from the second measurement mark toward the outside, formed on the intermediate layer. The second measurement mark has a width which is short enough not to be influenced by a deformation caused by the thermal flow phenomenon.

Abstract: Provided is an image reader which is constituted by an image sensor having a plurality of image sensor ICs mounted therein linearly, wherein the plurality of image sensor ICs are divided into a plurality of blocks to read image signals of the blocks in the same period, and adjacent light receiving elements of the adjacent image sensor ICs between the blocks are arranged so as to be slipped from each other in a sub scanning direction in such a way that the reading areas of the image signals which are to be read in the same period in the sub scanning direction become identical to each other. Thus, no continuousness of an image is injured even in a joint between the adjacent blocks.

Abstract: According to the present invention, there is provided an image sensor for receiving light reflected from an original copy on which the light has been irradiated and for converting the received light into electrical signals, the image sensor having a simple configuration, no residual image, a small fluctuation in the dark outputs, and a good S/N ratio. In order to achieve such an image sensor, an output terminal of a photodiode is reset to a constant voltage, and an image signal output of the photodiode and the reference voltage output immediately after the photodiode is reset are performed succeedingly, using a clamping circuit.

Abstract: An automatic computer configuration system is disclosed wherein a portable terminal such as a portable telephone set which has been spread widely and is usually carried by a user can be used to automatically configure a computer suitably for a particular user. The automatic computer configuration system comprises a portable terminal and a computer connected to the portable terminal. The portable terminal stores unique computer configuration information to be used for configuration of a computer specified for a particular user. Upon login by a user, the computer communicates with the portable terminal to receive the computer configuration information stored in the portable terminal and automatically configures the computer itself based on the received computer configuration information.

Abstract: The present disclosure relates to a color image reading device that successively switches three color light sources to irradiate the color original copy and successively reads information on the original using a monochrome image sensor, and which is featured by simple construction and less reading time period. A plurality of image sensor ICs are linearly mounted. A start pulse output terminal of an anterior stage image sensor IC is connected to a start pulse input terminal of a posterior stage image sensor IC, thereby forming an image sensor block. A plurality of those image sensor blocks are provided such that start pulse input terminals of initial stage image sensor ICs in all blocks are connected together. By inputting start pulses to the terminals connected together, image signal outputs are read out simultaneously.

Abstract: An image reading apparatus includes a casing (1), an input member (2) having an input surface, a rotary member (3) formed of a transparent base material, a light source (4), a light detecting means (5) having a plurality of photoelectric conversion elements, and a signal processing means (8), wherein partial images obtained from light emitted from the light source toward the input surface and reflected by troughs of a finger (6) in contact with the input surface, and a light-dark pattern provided on the surface of one end portion of the rotary member adapted to rotate while in contact with the finger, are successively detected, whereby a whole image of a fingerprint is synthesized from the partial images by the signal processing means (8).

Abstract: A transfer switch is disposed between an output terminal of a photoelectric converter and an input terminal of an amplifier. The input terminal of the amplifier being connected to a reset switch. After accumulation of a light signal of the photoelectric converter, a reference signal held at the input terminal of the amplifier is read from the output terminal of the amplifier, the transfer switch is opened to transfer light signal charge of the photoelectric converter to the input terminal of the amplifier, after the transfer switch is closed, a light signal held at the input terminal of the amplifier is read from the output terminal of the amplifier as a light signal, the transfer switch and the reset switch are opened to reset the output terminal of the photoelectric converter and the input terminal of the amplifier, and after the reset switch is closed, the transfer switch is closed.

Abstract: A resist mark for measuring the accuracy of overlay of a photomask disposed on a semiconductor wafer, includes a first measurement mark having a first opening, formed on the substrate, an intermediate layer formed on the first measurement mark and in the first opening, a frame-shaped second measurement mark formed on the intermediate layer, and a third measurement mark that is spaced from the second measurement mark toward the outside, formed on the intermediate layer. The second measurement mark has a width which is short enough not to be influenced by a deformation caused by the thermal flow phenomenon.

Abstract: A method for manufacturing a highly reliable alignment mark in which by-products do not form at an aligning mark position during patterning. In this method, an intermediate layer is disposed on an upper layer of a first wiring to protect the first wiring. Then, a filling material is coated thereon to fill in a through hole. Thereafter, a plug is formed by etch-backing, and a second wiring is formed.