Abstract: An ASIC is disclosed that is formed on a die with multiple functional blocks distributed on the die, each functional block being able to send and to receive data, and each having two inputs labeled slow and fast. The slow input may have a delay component that creates a delay in receiving a data signal, and the fast input may have less delay than the slow input. A switch may be used to couple the slow input and the fast input of a receiving functional block to a data signal based on a distance of the receiving functional block from a sending functional block. The delay in the slow input is used to adjust input data timing to meet setup and hold timing specifications of the functional blocks without altering the ASIC circuit components aside from the functional blocks.

Abstract: An apparatus and method are disclosed for testing a hard macro that is embedded in a system on a chip (SOC) that is included in an integrated circuit chip. The SOC includes the hard macro. A logic design and operation of the hard macro are unknown. A test wrapper is embedded in the SOC. The test wrapper includes a scan chain. The test wrapper surrounds inputs and outputs of the hard macro. The test wrapper receives a known test data pattern in the scan chain that is included in the test wrapper. The hard macro receives from the test wrapper a set of non-test standard SOC inputs when the SOC is not in a test mode and receives the known test data pattern when the SOC is in the test mode. The hard macro generates a set of outputs in response to the inputs. The hard macro is tested utilizing the known test data pattern.

Abstract: A system (50) for disassembling test data includes a data structure definition system (54) and a machine readable file (52). A disassembly system (56) determines a first field from the data structure definition system (54) and converts a first portion of the machine readable file (52) to a human readable format (58) according to a definition of the first field in the data structure definition system (54).

Abstract: A network testing system (50) includes a message compiler (52) accepting a plurality of data inputs (54) to create a test message (56). A communicator (58) is capable of transmitting the test message (56) to a component under test (60). The test message (56) is compliant with any of a plurality of protocols. The communicator (58) is also capable of emulating a communication session using an emulation module.

Abstract: A network device simulation system (40) has a device message emulator (42). A data source (44) is connected to the device message emulator (42). A protocol translator (44) is connected to the device message emulator (42) and outputs a protocol data unit in one of a plurality of specified protocols.

Abstract: A system for generating test data (40) has a data structure definition system (42), a message creation system (46), and an execution system (44). The execution system (44) executes the message creation system (46) to create a message (48) having a record built according to the data structure definition system (42).