Patents by Inventor Scott Avery Beeker

Scott Avery Beeker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7607057
    Abstract: An apparatus and method are disclosed for testing a hard macro that is embedded in a system on a chip (SOC) that is included in an integrated circuit chip. The SOC includes the hard macro. A logic design and operation of the hard macro are unknown. A test wrapper is embedded in the SOC. The test wrapper includes a scan chain. The test wrapper surrounds inputs and outputs of the hard macro. The test wrapper receives a known test data pattern in the scan chain that is included in the test wrapper. The hard macro receives from the test wrapper a set of non-test standard SOC inputs when the SOC is not in a test mode and receives the known test data pattern when the SOC is in the test mode. The hard macro generates a set of outputs in response to the inputs. The hard macro is tested utilizing the known test data pattern.
    Type: Grant
    Filed: December 28, 2004
    Date of Patent: October 20, 2009
    Assignee: LSI Corporation
    Inventors: Mark Allen Boike, Seshagiri Prasad Kalluri, Vijayanand J. Angarai, David Mark Brantley, Scott Avery Beeker