Abstract: An air handling system and an apparatus and method for removing snow from the intake air for the air handling system. The apparatus includes a sequence of snow fence panels which each have alternating filter areas and open flow areas. The locations of the filter areas and open flow areas in each succeeding panel alternate so that a filter area in one panel is positioned in front of an open area in the next panel. During an extreme snow event, if the snow clogs the filter elements, the air continues to flow through the alternating open flow areas, which creates low pressure zones behind the clogged filter elements. The snow separates from the air flow in the low pressure zones and is retained in the low pressure zones by horizontal collection pans.

Abstract: A neuromorphic memory system including neuromorphic memory arrays. Each neuromorphic memory array includes rows and columns of neuromorphic memory cells. A column of postsynaptic circuits is electrically coupled to postsynaptic spike timing dependent plasticity (STDP) lines. Each postsynaptic STDP line is coupled to a row of neuromorphic memory cells. A column of summing circuits is electrically coupled to postsynaptic leaky integrate and fire (LIF) lines. Each postsynaptic LIF line is coupled to the row of neuromorphic memory cells at a respective memory array. Each summing circuit provides a sum of signals from the postsynaptic LIF lines to a respective postsynaptic circuit.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: A write pulse driver is provided. The write pulse driver includes a parameter storage, storing a set of parameters specifying characteristics of a write pulse, and driver circuitry configured to generate the write pulse on an output node, the write pulse having a leading edge, a trailing edge and an intermediate segment between the leading edge and the trailing edge, wherein the driver circuitry includes pulse shaping circuits that set shape characteristics of at least one of an amplitude, a duration and a slope of more than one of the leading edge, the trailing edge and the intermediate segment of the write pulse using the set of parameters.

Abstract: A memory configured to have data read therefrom is provided. The memory includes a data port including B transmitters disposed in parallel and for transferring data on both rising and falling edges of a clock, a first memory including a first data bus including N lines on which N bits can be transferred, and a second memory including a second data bus including N lines on which N bits can be transferred. The memory includes a data path controller including a data distributor disposed between the first and second memories and being connected to the data port, wherein, on the rising edge, the data distributor distributes a first data segment comprised of B bits from the first data bus to the data port and, on the falling edge, the data distributor distributes a second data segment comprised of B bits from the second data bus to the data port.

Abstract: A write pulse driver is provided. The write pulse driver includes a parameter storage, storing a set of parameters specifying characteristics of a write pulse, and driver circuitry configured to generate the write pulse on an output node, the write pulse having a leading edge, a trailing edge and an intermediate segment between the leading edge and the trailing edge, wherein the driver circuitry includes pulse shaping circuits that set shape characteristics of at least one of an amplitude, a duration and a slope of more than one of the leading edge, the trailing edge and the intermediate segment of the write pulse using the set of parameters.

Abstract: A memory configured to have data read therefrom is provided. The memory includes a data port including B transmitters disposed in parallel and for transferring data on both rising and falling edges of a clock, a first memory including a first data bus including N lines on which N bits can be transferred, and a second memory including a second data bus including N lines on which N bits can be transferred. The memory includes a data path controller including a data distributor disposed between the first and second memories and being connected to the data port, wherein, on the rising edge, the data distributor distributes a first data segment comprised of B bits from the first data bus to the data port and, on the falling edge, the data distributor distributes a second data segment comprised of B bits from the second data bus to the data port.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: A neuromorphic memory system including neuromorphic memory arrays. Each neuromorphic memory array includes rows and columns of neuromorphic memory cells. A column of postsynaptic circuits is electrically coupled to postsynaptic spike timing dependent plasticity (STDP) lines. Each postsynaptic STDP line is coupled to a row of neuromorphic memory cells. A column of summing circuits is electrically coupled to postsynaptic leaky integrate and fire (LIF) lines. Each postsynaptic LIF line is coupled to the row of neuromorphic memory cells at a respective memory array. Each summing circuit provides a sum of signals from the postsynaptic LIF lines to a respective postsynaptic circuit.

Abstract: A neuromorphic memory system including neuromorphic memory arrays. The neuromorphic memory system includes a presynaptic neuron circuit coupled to a postsynaptic neuron circuit by a resistive memory cell. The method includes generating a presynaptic LIF pulse on a presynaptic LIF line at time t1. An activating operation activates an access transistor coupled to the presynaptic LIF line in response to the presynaptic LIF pulse. The access transistor enables LIF current to pass through the resistive memory cell to a postsynaptic LIF line. An integrating operation integrates the LIF current at the postsynaptic LIF line over time. A comparing operation compares a LIF voltage at the postsynaptic LIF line to a threshold voltage. A generating operation generates a postsynaptic spike timing dependent plasticity (STDP) pulse on a postsynaptic STDP line if the LIF voltage is beyond the threshold voltage.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: Structures and methods for a multi-bit phase change memory are disclosed herein. A method includes establishing a write-reference voltage that incrementally ramps over a write period. The increments of the write-reference voltage correspond to discrete resistance states of a storage cell of the multi-bit phase change memory.

Abstract: A method for sensing at least one parameter indicative of a logical state of a multi-level memory cell includes the steps of: measuring the parameter of the multi-level memory cell; comparing the measured parameter of the multi-level memory cell with a prescribed reference signal, the reference signal having a value which varies as a function of time; and storing a time value corresponding to a point in time at which the reference signal is substantially equal to the measured parameter of the multi-level memory cell, the stored time value being indicative of a sensed logical state of the multi-level memory cell.