Abstract: An apparatus for reading data from a magnetic storage medium includes a plurality of magnetic read heads each configured to read a track of the magnetic storage medium and generate an analog data signal corresponding to the read track. The apparatus includes a converter to generate digital data samples from the analog data signals, and a plurality of equalizers to apply a plurality of coefficients to the digital data samples to generate a plurality of equalized signals. The plurality of coefficients are associated with different locations within the track. The apparatus includes a plurality of detectors to compute metrics and detect data bits for the plurality of equalized signals, and at least one selector to select one of the plurality of equalized signals that has a best metric from the computed metrics and to output the selected equalized signal.

Abstract: An apparatus for controlling a feedback loop includes a digital finite impulse response filter configured to equalize digital samples to yield equalized data, a data detector circuit configured to detect values of the equalized data to yield detected data, a pattern detection circuit configured to detect at least one pattern in the detected data, an expected value comparison circuit configured to compare the digital samples corresponding to the at least one pattern with an expected value, and a feedback loop adaptation circuit configured to control a feedback loop based in part on whether the at least one pattern is detected by the pattern detection circuit and on an output of the expected value comparison circuit.

Abstract: An apparatus for controlling a feedback loop includes a digital finite impulse response filter configured to equalize digital samples to yield equalized data, a data detector circuit configured to detect values of the equalized data to yield detected data, a pattern detection circuit configured to detect at least one pattern in the detected data, an expected value comparison circuit configured to compare the digital samples corresponding to the at least one pattern with an expected value, and a feedback loop adaptation circuit configured to control a feedback loop based in part on whether the at least one pattern is detected by the pattern detection circuit and on an output of the expected value comparison circuit.

Abstract: A method for calculating an average phase offset in a two dimensional magnetic recording system includes calculating a phase offset as a difference between a phase of a first signal derived from a first read head and a second phase of a second signal derived from a second read head, correcting for phase wrapping differences between the phase offset and a previous phase offset, determining whether the phase offset is consistent with the previous phase offset, and calculating an average phase offset which includes the phase offset only if it is consistent with the previous phase offset.

Abstract: A method for calculating an average phase offset in a two dimensional magnetic recording system includes calculating a phase offset as a difference between a phase of a first signal derived from a first read head and a second phase of a second signal derived from a second read head, correcting for phase wrapping differences between the phase offset and a previous phase offset, determining whether the phase offset is consistent with the previous phase offset, and calculating an average phase offset which includes the phase offset only if it is consistent with the previous phase offset.

Abstract: A system for accessing a data from a storage device includes a gain value calculation circuit operable to calculate a first gain value based upon a data set, an early gain acquisition circuit operable to generate a second gain value in parallel to calculation of the first gain value by the gain value calculation circuit, and a gain combination circuit operable to combine the first gain value and the second gain value to yield a third gain value.

Abstract: An apparatus for detecting media flaws includes an envelope based media defect detector operable to identify a media defect based on an envelope of an input signal, a periodic pattern detector operable to determine whether the input signal comprises a data pattern, and a media flaw signal generation circuit operable to indicate a media defect when the envelope based media defect detector identifies the media defect and the periodic pattern detector determines that the input signal does not comprise the data pattern.

Abstract: An apparatus for detecting media flaws includes an envelope based media defect detector operable to identify a media defect based on an envelope of an input signal, a periodic pattern detector operable to determine whether the input signal comprises a data pattern, and a media flaw signal generation circuit operable to indicate a media defect when the envelope based media defect detector identifies the media defect and the periodic pattern detector determines that the input signal does not comprise the data pattern.

Abstract: The present inventions are related to apparatuses and methods for detecting and classifying media defects. For example, an apparatus for classifying a media defect is disclosed including a DFT circuit operable to yield real and imaginary components of a signal derived from data read from a storage medium, a calculation circuit operable to calculate an amplitude and a phase of the signal based on the real and imaginary components, and a classifier operable to detect the media defect based on the amplitude and to classify the media defect based on the phase.

Abstract: The present inventions are related to apparatuses and methods for detecting and classifying media defects. For example, an apparatus for classifying a media defect is disclosed including a DFT circuit operable to yield real and imaginary components of a signal derived from data read from a storage medium, a calculation circuit operable to calculate an amplitude and a phase of the signal based on the real and imaginary components, and a classifier operable to detect the media defect based on the amplitude and to classify the media defect based on the phase.