Patents by Inventor Scott Hsieh
Scott Hsieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240102007Abstract: A gene editing system comprising: (a) a Type V CRISPR nuclease polypeptide or a first nucleic acid encoding the Type V CRISPR nuclease polypeptide; (b) a reverse transcriptase (RT) polypeptide or a second nucleic acid encoding the RT polypeptide; (c) a guide RNA (gRNA) or a third nucleic acid encoding the gRNA, wherein the gRNA comprises one or more binding sites recognizable by the Type V CRISPR nuclease (CRISPR nuclease binding sites) and a spacer sequence specific to a target sequence within a genomic site of interest, the target sequence being adjacent to a protospacer adjacent motif (PAM); and (d) a reverse transcription donor RNA (RT donor RNA) or a fourth nucleic acid encoding the RT donor RNA, wherein the RT donor RNA comprises a primer binding site (PBS) and a template sequence.Type: ApplicationFiled: June 1, 2022Publication date: March 28, 2024Applicant: Arbor Biotechnologies, Inc.Inventors: David A. Scott, Noah Michael Jakimo, Pratyusha Hunnewell, Fu-Kai Hsieh
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Publication number: 20200275077Abstract: Hardware and software configurations, optionally, for performing profilometry of an object are disclosed. An advantageous imaging device is described. An advantageous approach to determining imager position is also described. Each aspect described may be used independently of the other. Moreover, the teaching may find use in other fields including velocimetry, etc.Type: ApplicationFiled: December 4, 2018Publication date: August 27, 2020Inventors: Morteza Gharib, Alexei Harvard, Scott Hsieh, Jian Lu
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Patent number: 10742957Abstract: Hardware and software configurations, optionally, for performing profilometry of an object are disclosed. An advantageous imaging device is described. An advantageous approach to determining imager position is also described. Each aspect described may be used independently of the other. Moreover, the teaching may find use in other fields including velocimetry, etc.Type: GrantFiled: December 4, 2018Date of Patent: August 11, 2020Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Morteza Gharib, Alexei Harvard, Scott Hsieh, Jian Lu
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Publication number: 20190174117Abstract: Hardware and software configurations, optionally, for performing profilometry of an object are disclosed. An advantageous imaging device is described. An advantageous approach to determining imager position is also described. Each aspect described may be used independently of the other. Moreover, the teaching may find use in other fields including velocimetry, etc.Type: ApplicationFiled: December 4, 2018Publication date: June 6, 2019Inventors: Morteza Gharib, Alexei Harvard, Scott Hsieh, Jian Lu
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Patent number: 10182223Abstract: Hardware and software configurations, optionally, for performing profilometry of an object are disclosed. An advantageous imaging device is described. An advantageous approach to determining imager position is also described. Each aspect described may be used independently of the other. Moreover, the teaching may find use in other fields including velocimetry, etc.Type: GrantFiled: November 19, 2010Date of Patent: January 15, 2019Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Morteza Gharib, Alexei Harvard, Scott Hsieh, Jian Lu
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Patent number: 9993219Abstract: A device for estimating scatter in X-ray imaging is described. An anti-scatter grid with varying grid ratio is used in conjunction with an X-ray detector. The anti-scatter grid comprises attenuating lamellae that block scattered radiation. The anti-scatter grid contains regions of lesser or greater scatter rejection efficiency, which can be achieved by variations in the grid ratio. Contrast between these regions can be used to estimate residual scatter content. A method for estimating scatter from this device is further described.Type: GrantFiled: March 18, 2016Date of Patent: June 12, 2018Assignee: The Board of Trustees of the Leland Stanford Junior UniversityInventor: Scott Hsieh
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Patent number: 9596452Abstract: A lens and aperture device for determining 3D information. An SLR camera has a lens and aperture that allows the SLR camera to determine defocused information.Type: GrantFiled: June 13, 2014Date of Patent: March 14, 2017Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Morteza Gharib, Jian Lu, Scott Hsieh, Francisco Pereira, Alexei Harvard, David Jeon
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Patent number: 9521982Abstract: A CT apparatus for scanning an object is provided. An x-ray source is provided, wherein the x-ray source provides a collimated x-ray beam with a cross-section. A plurality of attenuation elements is provided between the source and object. An actuator is connected to the attenuation elements for moving the attenuation elements. An x-ray detector is located on an opposite side of the object from the x-ray source and is for detecting x-rays that pass through the object and the plurality of attenuation elements. A gantry rotates the x-ray source, the plurality of attenuation elements, and the x-ray detector around an axis of rotation.Type: GrantFiled: July 16, 2014Date of Patent: December 20, 2016Assignee: The Board of Trustees of the Leland Stanford Junior UniversityInventors: Scott Hsieh, Norbert J. Pelc
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Publication number: 20160328836Abstract: A device for estimating scatter in X-ray imaging is described. An anti-scatter grid with varying grid ratio is used in conjunction with an X-ray detector. The anti-scatter grid comprises attenuating lamellae that block scattered radiation. The anti-scatter grid contains regions of lesser or greater scatter rejection efficiency, which can be achieved by variations in the grid ratio. Contrast between these regions can be used to estimate residual scatter content. A method for estimating scatter from this device is further described.Type: ApplicationFiled: March 18, 2016Publication date: November 10, 2016Inventor: Scott Hsieh
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Patent number: 9414792Abstract: A CT apparatus for scanning an object is provided. An x-ray source is provided, wherein the x-ray source provides a collimated x-ray beam with a cross-section. A plurality of wedges is provided between the source and object. An actuator is connected to the wedges for moving the wedges substantially perpendicular to the length of the cross-section of the collimated x-ray beam. An x-ray detector is located on an opposite side of the object from the x-ray source and is for detecting x-rays that pass through the object and the plurality of wedges. A gantry rotates the x-ray source, the plurality of wedges, and the x-ray detector around an axis of rotation. A detection system measures the relative position of the plurality of wedges. The detection system comprises an optical sensor and a plurality of optical markers, where each wedge has at least one optical marker attached.Type: GrantFiled: June 10, 2014Date of Patent: August 16, 2016Assignee: THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITYInventors: Scott Hsieh, Norbert J. Pelc
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Patent number: 9392984Abstract: A CT apparatus for scanning an object is provided. An x-ray source is provided, wherein the x-ray source provides a collimated x-ray beam with a cross-section with a length and thickness. A plurality of wedges is provided between the source and object. An actuator is connected to the wedges for moving the wedges substantially perpendicular to the length of the cross-section of the collimated x-ray beam. An x-ray detector is located on an opposite side of the object from the x-ray source and is for detecting x-rays that pass through the object and the plurality of wedges. A gantry rotates the x-ray source, the plurality of wedges, and the x-ray detector around an axis of rotation.Type: GrantFiled: June 14, 2012Date of Patent: July 19, 2016Assignee: The Board of Trustees of the Leland Stanford Junior UniversityInventors: Norbert J. Pelc, Scott Hsieh
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Patent number: 9247235Abstract: A method and device for high-resolution three-dimensional (3-D) imaging which obtains camera pose using defocusing is disclosed. The device comprises a lens obstructed by a mask having two sets of apertures. The first set of apertures produces a plurality of defocused images of the object, which are used to obtain camera pose. The second set of optical filters produces a plurality of defocused images of a projected pattern of markers on the object. The images produced by the second set of apertures are differentiable from the images used to determine pose, and are used to construct a detailed 3-D image of the object. Using the known change in camera pose between captured images, the 3-D images produced can be overlaid to produce a high-resolution 3-D image of the object.Type: GrantFiled: July 15, 2013Date of Patent: January 26, 2016Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Morteza Gharib, Jian Lu, Scott Hsieh, Francisco Pereira, Alexei Harvard
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Patent number: 9196061Abstract: A method for performing truncation artifact correction includes acquiring a projection dataset of a patient, the projection dataset including measured data and truncated data, generating an initial estimate of a boundary between the measured data and the truncated data, using the measured data to revise the initial estimate of the boundary, estimating the truncated data using the revised estimate of the boundary, and using the measured data and the estimated truncated data to generate an image of the patient.Type: GrantFiled: November 2, 2012Date of Patent: November 24, 2015Assignee: General Electric CompanyInventors: Scott Hsieh, Norbert J. Pelc, Brian Edward Nett
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Publication number: 20140368617Abstract: A lens and aperture device for determining 3D information. An SLR camera has a lens and aperture that allows the SLR camera to determine defocused information.Type: ApplicationFiled: June 13, 2014Publication date: December 18, 2014Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGYInventors: Morteza Gharib, Jian Lu, Scott Hsieh, Francisco Pereira, Alexei Harvard, David Jeon
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Publication number: 20140328453Abstract: A CT apparatus for scanning an object is provided. An x-ray source is provided, wherein the x-ray source provides a collimated x-ray beam with a cross-section. A plurality of attenuation elements is provided between the source and object. An actuator is connected to the attenuation elements for moving the attenuation elements. An x-ray detector is located on an opposite side of the object from the x-ray source and is for detecting x-rays that pass through the object and the plurality of attenuation elements. A gantry rotates the x-ray source, the plurality of attenuation elements, and the x-ray detector around an axis of rotation.Type: ApplicationFiled: July 16, 2014Publication date: November 6, 2014Inventors: Scott HSIEH, Norbert J. PELC
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Publication number: 20140294141Abstract: A CT apparatus for scanning an object is provided. An x-ray source is provided, wherein the x-ray source provides a collimated x-ray beam with a cross-section. A plurality of wedges is provided between the source and object. An actuator is connected to the wedges for moving the wedges substantially perpendicular to the length of the cross-section of the collimated x-ray beam. An x-ray detector is located on an opposite side of the object from the x-ray source and is for detecting x-rays that pass through the object and the plurality of wedges. A gantry rotates the x-ray source, the plurality of wedges, and the x-ray detector around an axis of rotation. A detection system measures the relative position of the plurality of wedges. The detection system comprises an optical sensor and a plurality of optical markers, where each wedge has at least one optical marker attached.Type: ApplicationFiled: June 10, 2014Publication date: October 2, 2014Inventors: Scott HSIEH, Norbert J. PELC
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Publication number: 20140192950Abstract: A CT apparatus for scanning an object is provided. An x-ray source is provided, wherein the x-ray source provides a collimated x-ray beam with a cross-section with a length and thickness. A plurality of wedges is provided between the source and object. An actuator is connected to the wedges for moving the wedges substantially perpendicular to the length of the cross-section of the collimated x-ray beam. An x-ray detector is located on an opposite side of the object from the x-ray source and is for detecting x-rays that pass through the object and the plurality of wedges. A gantry rotates the x-ray source, the plurality of wedges, and the x-ray detector around an axis of rotation.Type: ApplicationFiled: June 14, 2012Publication date: July 10, 2014Applicant: The Board of Directors of the Leland Stanford Junior UniversityInventors: Norbert J. Pelc, Scott Hsieh
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Patent number: 8773514Abstract: A camera has a lens and aperture device for determining 3D information. A projector projects an optical pattern toward a surface. The camera has at least two off-axis apertures thereon, arranged to obtain an image of the projected pattern including defocused information. The camera is movable between different positions to image the surface from said different positions, and the projector is at a specified angle of at least 5° relative to said camera. A processor carries out a first operation using information received through the apertures to determine a pose of said camera, and to determine three dimensional information about the object based on a degree of deformation of said optical pattern on said surface indicative of a three dimensional surface. An embodiment projects a grid of laser dots and uses laser-dot defocusing for approximate Z and thus grid correspondence, which can greatly increase the working depth of the system.Type: GrantFiled: August 27, 2010Date of Patent: July 8, 2014Assignee: California Institute of TechnologyInventors: Morteza Gharib, Jian Lu, Alexei Harvard, Scott Hsieh
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Patent number: 8773507Abstract: A lens and aperture device for determining 3D information. An SLR camera has a lens and aperture that allows the SLR camera to determine defocused information.Type: GrantFiled: August 9, 2010Date of Patent: July 8, 2014Assignee: California Institute of TechnologyInventors: Morteza Gharib, Jian Lu, Scott Hsieh, Francisco Pereira, Alexei Harvard, David Jeon
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Publication number: 20140126784Abstract: A method for performing truncation artifact correction includes acquiring a projection dataset of a patient, the projection dataset including measured data and truncated data, generating an initial estimate of a boundary between the measured data and the truncated data, using the measured data to revise the initial estimate of the boundary, estimating the truncated data using the revised estimate of the boundary, and using the measured data and the estimated truncated data to generate an image of the patient.Type: ApplicationFiled: November 2, 2012Publication date: May 8, 2014Inventors: Scott Hsieh, Norbert J. Pelc, Brian Edward Nett