Abstract: Disclosed are novel methods and apparatus for efficiently providing dynamic solder attach, in part, to decrease the affects of thermal variations. In an embodiment, a spacer provides a gap between a semiconductor package and a device, an attachment material is disposed between the device and the semiconductor package, and an environmental control device provides an appropriate environment to activate the attachment material. In another embodiment, while the attachment material is substantially activated, the spacer increases the gap between the semiconductor package and the device to elongate the attachment material in a plane substantially perpendicular to the device and the semiconductor package. In yet a different embodiment, the elongated attachment material assumes a substantially hourglass shape.

Abstract: A semiconductor device package is presented for housing an integrated circuit which includes bonding fingers located within a conductive ring structure and routed to device terminals on an underside surface of the semiconductor device package. The semiconductor device package includes a die area defined upon a planar upper surface, a conductive ring surrounding the die area, and a first set of bonding fingers arranged within the conductive ring. The die area is dimensioned to receive the integrated circuit. The conductive ring may be a power ring or a ground ring. The conductive ring and the first set of bonding fingers are located within a first signal layer adjacent to the upper surface. A set of bonding pads which serve as device terminals reside within a second signal layer adjacent to a planar underside surface.

Abstract: Disclosed is a pair of conductive rings and method for making the conductive rings for introducing an integral network of capacitive structures around a semiconductor die of a semiconductor package. The pair of conductive rings include a ground rail ring that is defined around a semiconductor die pad that is configured to receive a semiconductor die. The ground rail ring has a first plurality of extension spokes that extend away from the ground rail ring. The pair of conductive rings further includes a power rail ring that is defined around the semiconductor die pad. The power rail ring has a second plurality of extension spokes that extend away from the power rail ring and toward the ground rail ring.